Patent Assignment
Reel/Frame 064291/0562
Assignment of Assignor's Interest
Recorded: 2023-07-18
Pages: 4
Assignors
KAMEYAMA, TADASHI
Executed: 2023-03-19
KAWAKAMI, FUMIKI
Executed: 2023-03-16
KOYAMA, TETSUHIRO
Executed: 2023-03-16
MINAMI, MASATAKA
Executed: 2023-03-16
Assignee
RENESAS ELECTRONICS CORPORATION
2-24, TOYOSU 3-CHOME, KOTO-KU, TOKYO, 135-0061, JAPAN
Covered Property
(1)
Semiconductor Device and Temperature Characteristic Test Method Thereof