Patent Assignment
Reel/Frame 064442/0776
Assignment of Assignor's Interest
Recorded: 2023-07-31
Pages: 4
Assignors
WU, CHAO-I
Executed: 2021-02-16
YEONG, SAI-HOOI
Executed: 2021-02-16
LU, SHIH-LIEN LINUS
Executed: 2021-03-24
Assignee
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
8, LI-HSIN RD. 6, HSINCHU SCIENCE PARK, HSINCHU, 300-78, TAIWAN
Covered Property
(1)
Method of Testing a Memory Circuit and Memory Circuit