Patent Assignment
Reel/Frame 064827/0919
Assignment of Assignor's Interest
Recorded: 2023-09-07
Pages: 8
Assignors
KWAK, INHO
Executed: 2023-08-08
KIM, JINSUN
Executed: 2023-08-10
LEE, MOOSONG
Executed: 2023-08-10
LEE, SEUNGYOON
Executed: 2023-08-17
LEE, JEONGJIN
Executed: 2023-08-19
HWANG, CHAN
Executed: 2023-08-19
PARK, DOHYEON
Executed: 2023-08-11
HAN, YEEUN
Executed: 2023-08-11
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Overlay Measuring Method and System, and Method of Manufacturing a Semiconductor Device Using the Same
Application:
18/460,929 →
Publication:
US 2024/0133683