Patent Assignment
Reel/Frame 065854/0426
Assignment of Assignor's Interest
Recorded: 2023-12-13
Pages: 3
Assignor
MAEKAWA, TOMOYUKI
Executed: 2023-09-06
Assignees
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-0023, JAPAN
TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-0023, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit and Test Method for Semiconductor Integrated Circuit