Patent Assignment
Reel/Frame 066121/0555
Assignment of Assignor's Interest
Recorded: 2024-01-15
Pages: 10
Assignors
YOON, JAYANG
Executed: 2023-06-26
KIM, SEONGJIN
Executed: 2023-06-26
KIM, CHIHYUN
Executed: 2023-07-12
PARK, JUNEHONG
Executed: 2023-06-26
CHOI, HYEONGDO
Executed: 2023-06-26
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Wordline Defect Detection Circuit, Wordline Defect Detection Method, and Memory Device Including the Same
Application:
18/403,091 →
Publication:
US 2024/0233850