Patent Assignment
Reel/Frame 066150/0419
Assignment of Assignor's Interest
Recorded: 2024-01-17
Pages: 3
Assignors
CHANG, MING-HSUAN
Executed: 2024-01-12
LIN, YUAN-LI
Executed: 2024-01-04
YANG, SHENG-MING
Executed: 2024-01-14
LU, KUO-MING
Executed: 2024-01-15
Assignee
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
8, LI-HSIN RD. 6, HSINCHU SCIENCE PARK, HSINCHU, 300-78, TAIWAN
Covered Property
(1)
Semiconductor Testing Apparatus and Method for Testing Semiconductor Structure
Application:
18/413,188 →
Publication:
US 2025/0116698