Patent Assignment
Reel/Frame 066307/0675
Assignment of Assignor's Interest
Recorded: 2024-01-31
Pages: 6
Assignors
KIM, TAEWON
Executed: 2023-09-25
KANG, SANGHEE
Executed: 2023-09-25
HYUN, KIHO
Executed: 2023-09-25
KIM, TAEYUN
Executed: 2023-09-25
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Methods of Testing Repair Circuits of Memory Devices
Application:
18/515,681 →
Publication:
US 2024/0290414