Patent Assignment
Reel/Frame 067250/0185
Assignment of Assignor's Interest
Recorded: 2024-04-29
Pages: 3
Assignor
KIM, LOK WON
Executed: 2024-04-23
Assignee
DEEPX CO., LTD.
5F, 20 PANGYOYEOK-RO 241BEON-GIL, BUNDANG-GU, SEONGNAM-SI, GYEONGGI-DO, 13494, KOREA, REPUBLIC OF
Covered Property
(1)
Method for Performing Aging Test on Semiconductor Used for Neural Network
Application:
18/648,655 →
Publication:
US 2024/0274225