IP Library › Assignment 067899/0096
Patent Assignment
Reel/Frame 067899/0096

Assignment of Assignor's Interest

Recorded: 2024-07-02 Pages: 3
Assignor
UNIVERSITEIT VAN AMSTERDAM
Executed: 2020-08-31
Assignee
ASML NETHERLANDS B.V.
P.O. BOX 324, VELDHOVEN, 5500 AH, NETHERLANDS
Covered Property (1)
Metrology System and Method for Determining a Characteristic of One or More Structures on a Substrate
Application: 18/650,790 →
Publication: US 2024/0319620
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 2, 2024
From: TINNEMANS, PATRICIUS ALOYSIUS JACOBUS; DEN BOEF, ARIE JEFFREY; KOOLEN, ARMAND EUGENE ALBERT; PANDEY, NITESH
To: ASML NETHERLANDS B.V.
Reel/Frame 067899/0051 →
Assignment of Assignor's Interest Jul 2, 2024
From: STICHTING NEDERLANDSE WETENSCHAPPELIJK ONDERZOEK INSTITUTEN
To: ASML NETHERLANDS B.V.
Reel/Frame 067899/0078 →
Assignment of Assignor's Interest Jul 2, 2024
From: STICHTING VU; TENNER, VASCO TOMAS
To: ASML NETHERLANDS B.V.
Reel/Frame 067899/0081 →