IP Library › Assignment 071931/0816
Patent Assignment
Reel/Frame 071931/0816

Assignment of Assignor's Interest

Recorded: 2025-07-15 Pages: 5
Assignors
TAKAHARA, TOSHIYUKI
Executed: 2023-02-06
SATO, TSUNEO
Executed: 2023-02-06
MATSUBARA, SATOSHI
Executed: 2023-02-06
SEKI, YUTA
Executed: 2023-02-06
IWATA, KAZUYA
Executed: 2023-02-06
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
17-1 TORANOMON 1-CHOME, MINATO-KU, TOKYO, 105-6411, JAPAN
Covered Property (1)
X-Ray Inspection Apparatus and Method of Inspection with X-Rays
Application: 18/137,901 →
Publication: US 2023/0384246
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jul 14, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 071701/0397 →