Patent Assignment
Reel/Frame 072350/0920
Assignment of Assignor's Interest
Recorded: 2025-09-23
Pages: 3
Assignor
ETAMAX CO., LTD
Executed: 2025-09-11
Assignee
HORIBA STEC KOREA., LTD
98 DIGITAL VALLEY-RO, SUJI-GU, YONGIN-SI, GYEONGGI-DO, 16878, KOREA, REPUBLIC OF
Covered Properties
(3)
Defect Investigation Device Simultaneously Detecting Photoluminescence and Scattered Light
Die Division Method and Inspection Apparatus for Avoiding Defects Locations on Silicon Carbide Wafers
Defect Classification Equipment for Silicon Carbide Substrate Using Single Incident Light-Based Photoluminescence and Defect Classification Method Using the Same
Related Assignments
(3)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
May 23, 2019
From: JUNG, HUYNDON; KIM, YOUNGBEOM
To: ETAMAX CO., LTD
Reel/Frame 049272/0903 →
Assignment of Assignor's Interest
Jan 13, 2021
From: YOON, JONGHO; PARK, MIN
To: ETAMAX CO., LTD
Reel/Frame 054908/0978 →
Assignment of Assignor's Interest
Apr 26, 2022
From: JUNG, HUYNDON; LEE, MIN-JUNG
To: ETAMAX CO., LTD
Reel/Frame 059735/0115 →