Efficient method for modeling and simulation of the impact of local and global variation on integrated circuits
View Patent ↗A computer implemented method for statistical modeling and simulation of the impact of global variation and local mismatch on the performance of integrated circuits, comprises the steps of: estimating a representation of component mismatch from device performance measurements in a form suitable for circuit simulation; reducing the complexity of statistical simulation by performing a first level principal component or principal factor decomposition of global variation, including screening; further reducing the complexity of statistical simulation by performing a second level principal component decomposition including screening for each factor retained in the first level principal component decomposition step to represent local mismatch; and performing statistical simulation with the joint representation of global variation and local mismatch obtained in the second level principal component decomposition step.
1. A computer implemented method for statistical modeling and simulation of the impact of global variation and local mismatch on the performance of integrated circuits, comprising the steps of:
(a) estimating a representation of component mismatch from device performance measurements in a form suitable for circuit simulation;
(b) reducing the complexity of statistical simulation by performing a first level principal component or principal factor decomposition of global variation, including screening;
(c) further reducing the complexity of statistical simulation by performing a second level principal component decomposition including screening for each factor retained in step (b) to represent local mismatch; and
(d) performing statistical simulation with the joint representation of global variation and local mismatch obtained in step (c).
2. The method of claim 1 where the first principal component or principal factor decomposition is performed using eigenvalue eigenvector decomposition.
3. The method of claim 1 where the second principal component or principal factor decomposition is performed using eigenvalue eigenvector decomposition.
4. A computer implemented method for statistical modeling and simulation of the impact of global variation and local mismatch on the performance of integrated circuits, wherein said method is integrated in a statistical design and optimization computer aided design tool to perform statistical simulation of joint and separate impact of global variation and local mismatch on performance of integrated circuits and said method comprises the steps of:
(a) estimating a representation of component mismatch from device performance measurements in a form suitable for circuit simulation;
(b) reducing the complexity of statistical simulation by performing a first level principal component or principal factor decomposition of global variation, including screening;
(c) further reducing the complexity of statistical simulation by performing a second level principal component decomposition including screening for each factor retained in step (b) to represent local mismatch; and
(d) performing statistical simulation with the joint representation of global variation and local mismatch obtained in step (c).
5. The method of claim 4 where the first principal component or principal factor decomposition is performed using eigenvalue eigenvector decomposition.
6. The method of claim 4 where the second principal component or principal factor decomposition is performed using eigenvalue eigenvector decomposition.