Enhanced loopback testing of serial devices
View Patent ↗A system and method for economically yet thoroughly testing serial ports of electronic devices includes a receiver and a transmitter. The receiver is coupled to a TX line of a device under test for receiving an input serial bit stream from the device under test. The transmitter is coupled to a RX line of the device under test for providing an output serial bit stream to the device under test. The receiver is coupled to the transmitter for establishing a loopback connection. A time distortion circuit is interposed between the receiver and the transmitter, for adding predetermined amounts of timing distortion to the output serial bit stream. In addition, a selector is interposed between the receiver and the transmitter, for selecting between the receiver and a direct input. The direct input provides an algorithmic test signal that differs from the input serial bit stream received by the receiver. The direct input thus allows a tester to exercise the device under test with a test signal that differs from the signal that the device under test generates. A time measurement circuit measures timing characteristics of the device under test, and a parametric measurement circuit measures steady-state characteristics of the device under test.
1. A circuit for testing serial ports in an automatic test system, comprising:
a receiver having an input and an output, for receiving a test signal from a transmit line of a serial port;
a time measurement circuit, coupled to the output of the receiver, for measuring timing characteristics of test signals received by the receiver;
a transmitter having an input and an output, for transmitting a test signal to a receive line of the serial port, wherein the input of the transmitter is coupled to the output of the receiver for establishing a loopback connection; and
a parametric measurement circuit, coupled to the input of the receiver, for evaluating steady-state characteristics of the transmit line of the serial port.
2. A circuit as recited in claim 1 , wherein the parametric measurement circuit is further coupled to the output of the transmitter, for evaluating steady-state characteristics of the receive line of the serial port.
3. A circuit as recited in claim 1 , further comprising a time distortion circuit, interposed between the output of the receiver and the input of the transmitter, for introducing predetermined timing distortions into the test signal provided to the receive line of the serial port.
4. A circuit as recited in claim 1 , further comprising a selector, interposed between the output of the receiver and the input of the transmitter, for selecting between the output of the receiver and a direct input, wherein the direct input provides a predetermined serial bit stream that is different from the test signal received by the receiver.
5. A circuit as recited in claim 1 , wherein the receiver comprises a differential comparator having first and second programmable thresholds.
6. A circuit as recited in claim 1 , wherein the transmitter comprises a differential driver having first and second programmable levels.
7. A circuit for testing serial ports in an automatic test system comprising:
a receiver having an input and an output, for receiving a test signal from a transmit line of a serial port;
a transmitter having an input and an output, for transmitting a test signal to a receive line of the serial port, wherein the input of the transmitter is coupled to the output of the receiver for establishing a loopback connection; and
a time distortion circuit, interposed between the output of the receiver and the input of the transmitter, for introducing predetermined timing distortions into the test signal provided to the receive line of the serial port.
8. A circuit as recited in claim 7 , further comprising a time measurement circuit, coupled to the output of the receiver, for measuring timing characteristics of test signals received by the receiver.