IP Library › Assignment 035507/0116
Patent Assignment
Reel/Frame 035507/0116

Patent Security Agreement

Recorded: 2015-04-27 Pages: 40
Assignors
TERADYNE, INC.
Executed: 2015-04-27
LITEPOINT CORPORATION
Executed: 2015-04-27
Assignee
BARCLAYS BANK PLC
745 SEVENTH AVENUE, 27TH FLOOR, NEW YORK, NEW YORK, 10019
Covered Properties (588)
Method for Testing Wireless Devices Using Predefined Test Segments Initiated by Over-the-Air Signal Characteristics
Determining Propagation Delay
Programmable Test Instrument
Test Instrument Having a Configurable Interface
Programmable Test Instrument
System and Method of Maintaining Correction of Dc Offsets in Frequency Down-Converted Data Signals
Method for Measuring Sensitivity of Data Packet Signal Receiver
Method for Efficient Parallel Testing of Time Division Duplex (Tdd) Communications Systems
System and Method for Testing Radio Frequency Device Under Test Capable of Communicating Using Multiple Radio Access Technologies
Test System Having Liquid Containment Chambers Over Connectors
Interface for a Test System
Method of Testing Multiple Data Packet Signal Transceivers Concurrently
System and Method for Parallel Testing of Multiple Data Packet Signal Transceivers
Debugging in a Semiconductor Device Test Environment
Method of Facilitating Testing of Multiple Time-Division-Duplex (Tdd) Data Packet Signal Tranceivers
System and Method for Testing Multiple Data Packet Signal Transceivers Concurrently
System and Method for Confirming Radio Frequency (Rf) Signal Connection Integrity with Multiple Devices Under Test (Duts) to Be Tested Concurrently
System and Method for Confirming Radio Frequency (Rf) Signal Connectivity with Device Under Test (Dut)
Embedded Tester
Method and Apparatus for Device Testing Using Multiple Processing Paths
Matrix Testing Targets
Rotatable Camera Module Testing System
System and Method for Testing a Data Packet Signal Transceiver
System and Method for Testing a Data Packet Signal Transceiver
Air Circulation in a System
Electronic Assembly Test System
Parallel Operation of System Components
System and Method for Testing Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals
System and Method for Testing Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals
Method and Apparatus for Low Latency Communication in an Automatic Testing System
Smooth Vi Mode Crossover Method at Compliance Limit Threshold
System and Method for Testing a Radio Frequency Multiple-Input Multiple-Output Data Packet Transceiver While Forcing Fewer Data Streams
Vector Network Power Meter
System and Method for Testing Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals
System and Method for Testing Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals
System and Method for Testing Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals
Calibration Device
Method for Measuring Sensitivity of Data Packet Signal Transceiver
Method for Testing Data Packet Signal Transceiver Using Coordinated Transmitted Data Packet Signal Power
System and Method for Testing Multiple Data Packet Signal Transceivers
System and Method for Testing Wide Band Data Packet Signal Transceivers Using Narrow Band Testers
Method for Testing Data Packet Signal Transceiver Using Interleaved Device Setup and Testing
Method for Testing Data Packet Signal Transceivers with Multiple Radio Access Technologies Using Interleaved Device Setup and Testing
Interconnect for Transmitting Signals Between a Device and a Tester
System and Method for Data Packet Transceiver Testing After Signal Calibration and Power Settling to Minimize Test Time
System and Method for Enabling Testing a Data Link of a Data Packet Signal Transceiver
System and Method for Dynamic Signal Interference Detection During Testing of a Data Packet Signal Transceiver
Automated Test System with Edge Steering
System and Method for Testing Data Packet Transceivers Having Varied Performance Characteristics and Requirements Using Standard Test Equipment
System and Method for Concurrently Testing Multiple Packet Data Signal Transceivers Capable of Communicating via Multiple Radio Access Technologies
Method for Testing Multiple Wireless Data Packet Signal Transceivers Using Shared Testing Resources
System and Method for Enabling Automated Testing of Wireless Data Packet Signal Transceivers
Radio Frequency Signal Path with Substantially Constant Phase Shift Over Wide Frequency Band
Method for Testing Multiple Data Packet Signal Transceivers with a Shared Tester to Maximize Tester Use and Minimize Test Time
Current Regulation for Accurate and Low-Cost Voltage Measurements at the Wafer Level
Equi-Resistant Probe Distribution for High-Accuracy Voltage Measurements at the Wafer Level
Memory Architecture for Automatic Test Equipment Using Vector Module Table
Patent: 6,286,120 →
Application: 08/299,753 →
With Positioning Modules Incorporating Kinematic Surfaces
Patent: 5,982,182 →
Application: 08/414,456 →
Manipulator for Automatic Test Equipment Test Head
Patent: 5,606,262 →
Application: 08/481,564 →
System for Detecting Faults in Connections Between Integrated Circuits and Circuit Board Traces
Patent: 5,736,862 →
Application: 08/493,399 →
Low Cost Cmos Tester
Patent: 6,469,493 →
Application: 08/510,079 →
Method of Making Memory Chips Using Memory Tester Providing Fast Repair
Patent: 5,795,797 →
Application: 08/516,709 →
Test System for Determining the Orientation of Components on a Circuit Board
Patent: 5,811,980 →
Application: 08/517,573 →
Configurable Probe Card for Automatic Test Equipment
Patent: 5,736,850 →
Application: 08/526,302 →
Integrated Circuit Test Power Supply
Patent: 5,773,990 →
Application: 08/536,206 →
Integrated Prober, Handler and Tester for Semiconductor Components
Patent: 6,024,526 →
Application: 08/546,236 →
Integrated Circuit Test Method and Structure
Patent: 5,917,331 →
Application: 08/546,751 →
System and Method of Programming a Multistation Testing System
Patent: 5,615,219 →
Application: 08/552,141 →
Time Linearity Measurement Using a Frequency Locked, Dual Sequencer Automatic Test System
Patent: 5,604,751 →
Application: 08/555,438 →
Method and Apparatus for Performing Serial and Parallel Scan Testing on an Integrated Circuit
Patent: 5,606,568 →
Application: 08/565,337 →
Automatic Test Equipment with Pipelined Sequencer
Patent: 5,657,486 →
Application: 08/569,020 →
Hybrid Scanner for Use in an Improved Mda Tester
Patent: 5,861,743 →
Application: 08/576,008 →
Apparatus and Method for Performing Digital Signal Processing in an Electronic Circuit Tester
Patent: 5,673,272 →
Application: 08/600,837 →
Apparatus and Method for Providing a Programmable Delay with Low Fixed Delay
Patent: 5,727,021 →
Application: 08/627,858 →
High Speed Serial Data Pin for Automatic Test Equipment
Patent: 5,689,515 →
Application: 08/638,026 →
Integrated Circuit Tray with Flexural Bearings
Patent: 5,758,776 →
Application: 08/653,588 →
Fast Vector Loading for Automatic Test Equipment
Patent: 5,737,512 →
Application: 08/653,949 →
Semiconductor Memory Tester with Hardware Accelerators
Patent: 5,754,556 →
Application: 08/683,397 →
Expanding Gripper with Elastically Variable Pitch Screw
Patent: 5,839,769 →
Application: 08/726,069 →
Memory Tester with Data Compression
Patent: 6,360,340 →
Application: 08/752,414 →
Apparatus and Method for Performing Amplitude Calibration in an Electr Onic Circuit Tester
Patent: 5,929,628 →
Application: 08/760,537 →
Fast Undersampling
Patent: 5,768,155 →
Application: 08/760,887 →
Board Test Apparatus and Method for Fast Capacitance Measurement
Patent: 5,844,412 →
Application: 08/769,556 →
Semiconductor Tester for Testing Devices with Embedded Memory
Patent: 5,923,675 →
Application: 08/803,111 →
Flexible Shielded Laminated Beam for Electrical Contacts and the Like and Method of Contact Operation
Patent: 5,921,786 →
Application: 08/832,303 →
Low Cost, Easy to Use Automatic Test System Software
Patent: 5,910,895 →
Application: 08/874,615 →
Heat-Transfer Enhancing Features for Semiconductor Carriers and Devices
Patent: 6,036,023 →
Application: 08/890,917 →
Low Cost Cmos Tester with High Channel Density
Patent: 6,073,259 →
Application: 08/906,532 →
Tester with Fast Refire Recovery Time
Patent: 5,854,797 →
Application: 08/906,533 →
Semiconductor Chip Tray with Rolling Contact Retention Mechanism
Patent: 5,971,156 →
Application: 08/924,354 →
Low Cost, Highly Parallel Memory Tester
Patent: 5,794,175 →
Application: 08/926,117 →
Test System for Integrated Circuits Using a Single Memory for Both the Parallel and Scan Modes of Testing
Patent: 6,049,901 →
Application: 08/931,164 →
System for Storing and Searching Named Device Parameter Data in a Test System for Testing an Integrated Circuit
Patent: 6,047,293 →
Application: 08/931,784 →
Production Interface for Integrated Circuit Test System
Patent: 5,828,674 →
Application: 08/931,793 →
Method for Capturing Digital Data in an Automatic Test System
Patent: 5,938,780 →
Application: 08/933,391 →
Interface Apparatus for Automatic Test Equipment
Patent: 6,104,202 →
Application: 08/947,680 →
Method for Generating Test Patterns
Patent: 6,052,809 →
Application: 08/951,782 →
Automated Microwave Test System with Improved Accuracy
Patent: 6,249,128 →
Application: 08/955,782 →
System to Simultaneously Test Trays of Integrated Circuit Packages
Patent: 6,097,201 →
Application: 08/962,605 →
Manipulator for Automatic Test Equipment with Active Compliance
Patent: 5,949,002 →
Application: 08/968,316 →
Method of Manufacturing Ball Grid Arrays for Improved Testability
Patent: 5,924,003 →
Application: 08/970,184 →
Small Contactor for Test Probes, Chip Packaging and the Like
Patent: 5,973,394 →
Application: 09/012,838 →
Method and Apparatus Fpr Temperature Control of a Semiconductor Electrical-Test Contractor Assembly
Patent: 6,091,062 →
Application: 09/014,214 →
Flexible Test Environment for Automatic Test Equitment
Patent: 6,128,759 →
Application: 09/045,436 →
High Performance Probe Interface for Automatic Test Eqipment
Patent: 6,037,787 →
Application: 09/047,089 →
Compensating for the Effects of Round-Trip Delay in Automatic Test Equipment
Patent: 6,133,725 →
Application: 09/048,727 →
High Speed, Real-Time, State Interconnect for Automatic Test Equipment
Patent: 6,107,818 →
Application: 09/060,987 →
Relayless Voltage Measurement in Automatic Test Equipment
Patent: 6,194,910 →
Application: 09/104,099 →
Analog Clock Module
Patent: 6,188,253 →
Application: 09/167,883 →
Production Interface for an Integrated Circuit Test System
Patent: 5,938,781 →
Application: 09/170,490 →
Integrated Multi-Channel Analog Test Instrument Architecture Providing Flexible Triggering
Patent: 6,363,507 →
Application: 09/174,866 →
High Density Printed Circuit Board
Patent: 6,215,320 →
Application: 09/178,247 →
Remote Test Module for Automatic Test Equipment
Patent: 6,275,962 →
Application: 09/178,257 →
Low Cost Memory Tester with High Throughput
Patent: 6,204,679 →
Application: 09/186,012 →
Adjustable Tooling Pin
Patent: 6,163,160 →
Application: 09/204,977 →
Pattern Generator for a Packet-Based Memory Tester
Patent: 6,389,525 →
Application: 09/227,690 →
Direct-Measurement Provision of Safe Backdrive Levels
Patent: 6,114,848 →
Application: 09/231,001 →
Circuit-Board Tester with Backdrive-Based Burst Timing
Patent: 6,175,230 →
Application: 09/231,049 →
Automatic Test Equipment Using Sigma Delta Modulation to Create Reference Levels
Patent: 6,282,682 →
Application: 09/245,223 →
Low-Cost Configuration for Monitoring and Controlling Parametric Measurement Units in Automatic Test Equipment
Patent: 6,374,379 →
Application: 09/245,519 →
Serial Switch Driver Architecture for Automatic Test Equipment
Patent: 6,137,310 →
Application: 09/253,175 →
Fail Array Memory Control Circuit with Selective Input Disable
Patent: 6,405,333 →
Application: 09/282,224 →
Failure Capture Apparatus and Method for Automatic Test Equipment
Patent: 6,442,724 →
Application: 09/285,857 →
Driver with Transmission Path Loss Compensation
Patent: 6,360,180 →
Application: 09/309,134 →
Power Sensor Module for Microwave Test Systems
Patent: 6,397,160 →
Application: 09/325,834 →
Noise Source Module for Microwave Test Systems
Patent: 6,268,735 →
Application: 09/326,449 →
Semiconductor Parallel Tester
Patent: 6,476,628 →
Application: 09/340,832 →
Extending Synchronous Busses by Arbitrary Lengths Using Native Bus Protocol
Patent: 6,507,920 →
Application: 09/354,137 →
Integrated Test Cell Cooling System
Patent: 6,208,510 →
Application: 09/360,180 →
Low Cost Timing System for Highly Accurate Multi-Modal Semiconductor Testing
Patent: 6,553,529 →
Application: 09/360,215 →
Pre-Conditioner for Measuring High-Speed Time Intervals Over a Low-Bandwidth Path
Patent: 6,550,036 →
Application: 09/409,618 →
Integrated Test Cell
Patent: 6,310,486 →
Application: 09/410,857 →
Low Jitter Phase-Locked Loop with Duty-Cycle Control
Patent: 6,356,129 →
Application: 09/416,578 →
Easy to Program Automatic Test Equipment
Patent: 6,681,351 →
Application: 09/417,034 →
Circuit and Method for Improved Test and Calibration in Automated Test Equipment
Patent: 6,331,783 →
Application: 09/420,497 →
High-Speed Failure Capture Apparatus and Method for Automatic Test Equipment
Patent: 6,536,005 →
Application: 09/426,486 →
Shunt Capacitance Compensation Structure and Method for a Signal Channel
Patent: 6,463,395 →
Application: 09/457,883 →
Dynamic pin driver combining high voltage mode and high speed mode
Patent: 6,292,010 →
Application: 09/496,690 →
Common-Mode Detection Circuit with Cross-Coupled Compensation
Patent: 6,392,448 →
Application: 09/497,775 →
Differential comparator with dispersion reduction circuitry
Patent: 6,300,804 →
Application: 09/501,471 →
Network Fault Analysis Tool
Patent: 6,823,479 →
Application: 09/503,352 →
Automatic Test Equipment Methods and Apparatus for Interfacing with an External Device
Patent: 6,622,272 →
Application: 09/523,431 →
Detector with common mode comparator for automatic test equipment
Patent: 6,281,699 →
Application: 09/525,557 →
Pc Configuration Fault Analysis
Patent: 7,127,506 →
Application: 09/552,105 →
Low Compliance Tester Interface
Patent: 6,734,688 →
Application: 09/571,563 →
Redundancy Analysis Method and Apparatus for Ate
Patent: 6,499,118 →
Application: 09/574,689 →
Method and Apparatus for Testing Integrated Circuit Chips That Output Clocks for Timing
Patent: 6,486,693 →
Application: 09/577,255 →
Ate Timing Measurement Unit and Method
Patent: 6,609,077 →
Application: 09/584,636 →
Semiconductor Handler for Rapid Testing
Patent: 6,717,115 →
Application: 09/585,453 →
Single Carriage Robotic Monorail Material Transfer System
Patent: 6,446,560 →
Application: 09/605,941 →
Testing Frequency Hopping Devices
Patent: 6,564,350 →
Application: 09/608,040 →
Flexible Test Environment for Automatic Test Equipment
Patent: 6,449,744 →
Application: 09/612,745 →
Automatic Test Manipulator with Support Internal to Test Head
Patent: 6,837,125 →
Application: 09/615,292 →
Automatic test equipment with narrow output pulses
Patent: 6,291,981 →
Application: 09/625,827 →
Capturing and Evaluating High Speed Data Streams
Patent: 6,694,462 →
Application: 09/635,334 →
Test System for Smart Card and Identification Devices and the Like
Patent: 6,466,007 →
Application: 09/638,829 →
Noise-Shaped Digital Frequency Synthesis
Patent: 6,396,313 →
Application: 09/645,367 →
High-Speed Peaking Circuit Fro Characteristic Impedance Control
Patent: 6,642,707 →
Application: 09/661,073 →
Modular Semiconductor Tester Interface Assembly for High Performance Coaxial Connections
Patent: 6,515,499 →
Application: 09/676,041 →
Digital to Analog Converter Employing Sigma-Delta Loop and Feedback Dac Model
Patent: 6,404,369 →
Application: 09/676,064 →
Methods and Apparatus for Generating a Test Signal for Xdsl Devices
Patent: 6,798,830 →
Application: 09/677,028 →
Test Head Actuation System with Positioning and Compliant Modes
Patent: 6,838,868 →
Application: 09/707,764 →
Dut Power Supply Having Improved Switching Dc-Dc Converter
Patent: 6,542,385 →
Application: 09/718,780 →
High Speed and High Accuracy Dut Power Supply with Active Boost Circuitry
Patent: 6,556,034 →
Application: 09/718,808 →
Off-Center Tomosynthesis
Patent: 6,748,046 →
Application: 09/731,335 →
Publication: US 2003/0058983
Calibrating Single Ended Channels for Differential Performance
Patent: 6,675,117 →
Application: 09/735,261 →
Publication: US 2002/0072870
Enhanced Loopback Testing of Serial Devices
Patent: 7,017,087 →
Application: 09/751,633 →
Publication: US 2002/0087924
Low Profile Pneumatically Actuated Docking Module with Power Fault Release
Patent: 6,551,122 →
Application: 09/778,694 →
Publication: US 2002/0106927
High Current and High Accuracy Linear Amplifier
Patent: 6,448,748 →
Application: 09/797,511 →
Publication: US 2002/0121885
Curcuit for Improved Test and Calibration in Automated Test Equipment
Patent: 6,566,890 →
Application: 09/798,515 →
Publication: US 2002/0121904
Apparatus and Method for Managing Automatic Transitions Between Multiple Feedback Paths
Patent: 6,452,436 →
Application: 09/833,985 →
Driver for Integrated Circuit Chip Tester
Patent: 6,772,382 →
Application: 09/847,263 →
Publication: US 2003/0028832
Dynamic Testing of Electronic Assemblies
Patent: 6,725,115 →
Application: 09/850,241 →
Publication: US 2002/0072822
Differential Receiver Architecture
Patent: 6,857,089 →
Application: 09/852,359 →
Publication: US 2002/0170006
Semiconductor Test System Having Double Data Rate Pin Scrambling
Patent: 6,754,868 →
Application: 09/895,439 →
Publication: US 2003/0005381
Facilitating Comparisons Between Simulated and Actual Behavior of Electronic Devices
Patent: 6,684,169 →
Application: 09/896,327 →
Publication: US 2003/0004663
Low Leakage Technique for Determining Power Spectra of Non-Coherently Sampled Data
Patent: 6,687,630 →
Application: 09/896,788 →
Publication: US 2003/0014203
Hybrid Conductor-Board for Multi-Conductor Routing
Patent: 6,784,656 →
Application: 09/943,267 →
Publication: US 2003/0042912
Method and Apparatus for Calibration and Validation of High Performance Dut Power Supplies
Patent: 6,504,395 →
Application: 09/943,275 →
Mechanism for Clamping Device Interface Board to Peripheral
Patent: 6,617,867 →
Application: 09/966,874 →
Publication: US 2002/0063566
Low Distortion Frequency Tracking Technique
Patent: 6,775,628 →
Application: 09/995,355 →
Publication: US 2003/0101010
Control Loop Compensation Circuit and Method
Patent: 6,906,578 →
Application: 10/000,440 →
Publication: US 2003/0080771
Scan Diagnosis System and Method
Patent: 7,146,584 →
Application: 10/003,982 →
Publication: US 2003/0084413
Modular Ate Power Supply Architecture
Patent: 6,756,807 →
Application: 10/006,523 →
Publication: US 2003/0102870
Clock Architecture for a Frequency-Based Tester
Patent: 6,976,183 →
Application: 10/008,967 →
Publication: US 2004/0205432
High-Speed Digital Multiplexer
Patent: 7,222,041 →
Application: 10/010,547 →
Publication: US 2003/0086376
Compact Ate with Time Stamp System
Patent: 6,868,047 →
Application: 10/015,865 →
Publication: US 2003/0107951
High Precision, High-Speed Signal Capture
Patent: 6,683,550 →
Application: 10/016,983 →
Publication: US 2003/0112165
High Precision, High-Speed Signal Source
Patent: 6,603,418 →
Application: 10/017,690 →
Publication: US 2003/0112166
Low-Cost Tester Interface Module
Patent: 6,686,732 →
Application: 10/026,861 →
Publication: US 2003/0117129
Discrete Fourier Transform (Dft) Leakage Removal
Patent: 6,882,947 →
Application: 10/036,000 →
Publication: US 2004/0122608
Apparatus Having Pattern Scrambler for Testing a Semiconductor Device and Method for Operating Same
Patent: 7,003,697 →
Application: 10/039,738 →
Publication: US 2003/0005359
Communications Interface for Assembly-Line Monitoring and Control
Patent: 6,618,629 →
Application: 10/047,342 →
Publication: US 2003/0135296
Methods and Apparatus for Testing Electronic Devices
Patent: 6,697,753 →
Application: 10/047,506 →
Publication: US 2003/0135343
Printed Circuit Board Assembly for Automatic Test Equipment
Patent: 6,882,156 →
Application: 10/076,757 →
Publication: US 2003/0151883
Technique for Programming Clocks in Automatic Test System
Patent: 7,080,304 →
Application: 10/083,009 →
Publication: US 2003/0163775
Algorithm for Configuring Clocking System
Patent: 7,343,387 →
Application: 10/083,325 →
Publication: US 2003/0163497
Hybrid Tester Architecture
Patent: 6,885,961 →
Application: 10/090,585 →
Publication: US 2003/0163273
High-Speed Fully Balanced Differential Flip-Flop with Reset
Patent: 6,686,787 →
Application: 10/090,593 →
Publication: US 2003/0160644
Driver Circuit Employing High-Speed Tri-State for Automatic Test Equipment
Patent: 6,563,352 →
Application: 10/113,179 →
Wafer-Level Contactor
Patent: 6,768,331 →
Application: 10/125,449 →
Publication: US 2003/0193342
Interface Adapter for Automatic Test Systems
Patent: 6,759,842 →
Application: 10/125,725 →
Publication: US 2003/0197521
Circuit for Looping Serial Bit Streams from Parallel Memory
Patent: 6,766,411 →
Application: 10/170,122 →
Publication: US 2003/0233517
System for Testing Dut and Tester for Use Therewith
Patent: 7,385,385 →
Application: 10/170,916 →
Publication: US 2003/0062888
Semiconductor Test System with Easily Changed Interface Unit
Patent: 6,756,800 →
Application: 10/173,357 →
Publication: US 2003/0194821
Single Axis Manipulator with Controlled Compliance
Patent: 6,717,432 →
Application: 10/173,360 →
Publication: US 2003/0193327
Manipulator Apparatus with Low-Cost Compliance
Patent: 6,722,215 →
Application: 10/176,261 →
Publication: US 2003/0230155
Automatic Test Equipment for Design-for-Test (Dft) and Built-in-Self-Test Circuitry
Patent: 7,222,261 →
Application: 10/176,281 →
Publication: US 2003/0237025
Ring Calibration Apparatus and Method for Automatic Test Equipment
Patent: 6,831,473 →
Application: 10/183,576 →
Publication: US 2003/0234645
Rear-Mounted Gimbal for Supporting Test Head
Patent: 6,828,774 →
Application: 10/184,488 →
Publication: US 2003/0160604
Measuring Skew Between Digitizer Channels Using Fourier Transform
Patent: 6,784,819 →
Application: 10/185,956 →
Publication: US 2004/0001017
Instrument Initiated Communication for Automatic Test Equipment
Patent: 6,966,019 →
Application: 10/186,195 →
Publication: US 2004/0003328
Method for Manufacturing Smart Card and Identification Devices and the Like
Patent: 6,756,777 →
Application: 10/210,596 →
Publication: US 2002/0186004
High Speed Tester with Narrow Output Pulses
Patent: 6,771,061 →
Application: 10/245,534 →
Publication: US 2004/0051518
Deskewed Differential Detector Employing Analog-to-Digital Converter
Patent: 6,981,192 →
Application: 10/256,586 →
Publication: US 2004/0064765
Differential Coaxial Contact Array for High-Density, High-Speed Signals
Patent: 6,784,679 →
Application: 10/260,819 →
Publication: US 2004/0061513
Semiconductor Handler Interface Auto Alignment
Patent: 7,049,577 →
Application: 10/261,005 →
Publication: US 2004/0062104
Rim Slot Filler Module and Method of Manufacturing the Same
Patent: 7,459,642 →
Application: 10/261,006 →
Publication: US 2005/0231920
High Power Interface
Patent: 6,916,990 →
Application: 10/261,738 →
Publication: US 2004/0060725
High Fidelity Electrical Probe
Patent: 6,940,298 →
Application: 10/262,370 →
Publication: US 2004/0063229
Circuit Board Cover with Exhaust Apertures for Cooling Electronic Components
Patent: 6,765,796 →
Application: 10/301,774 →
Publication: US 2004/0100773
Flexible Interface for Universal Bus Test Instrument
Patent: 6,894,505 →
Application: 10/317,310 →
Publication: US 2004/0056666
High Speed Capture and Averaging of Serial Data by Asynchronous Periodic Sampling
Patent: 7,143,323 →
Application: 10/319,116 →
Publication: US 2004/0117692
Pin Driver for Ac and Dc Semiconductor Device Testing
Patent: 6,836,136 →
Application: 10/323,441 →
Publication: US 2004/0119488
Coaxial Cable for Overvoltage Protection
Patent: 6,939,175 →
Application: 10/324,607 →
Publication: US 2003/0122538
Distributed Failure Analysis Memory for Automatic Test Equipment
Patent: 7,117,410 →
Application: 10/324,707 →
Publication: US 2004/0153901
Universal Approach for Simulating, Emulating, and Testing a Variety of Serial Bus Types
Patent: 7,343,279 →
Application: 10/325,070 →
Publication: US 2004/0128121
Pre-Compensation for Digital Bit Streams
Patent: 7,224,746 →
Application: 10/335,379 →
Publication: US 2004/0125887
Method of Providing Direct Impingement Temperature Control of a Device
Patent: 7,004,235 →
Application: 10/345,846 →
Low-Jitter Delay Cell
Patent: 6,894,552 →
Application: 10/376,664 →
Publication: US 2004/0169540
Hybrid Cooling System for Automatic Test Equipment
Patent: 6,864,698 →
Application: 10/396,589 →
Publication: US 2004/0189280
Hybrid Ac/Dc-Coupled Channel for Automatic Test Equipment
Patent: 6,879,175 →
Application: 10/404,900 →
Publication: US 2004/0189339
Measurement Circuit with Improved Accuracy
Patent: 6,914,425 →
Application: 10/425,329 →
Publication: US 2004/0217809
Semiconductor Test System Having Multitasking Algorithmic Pattern Generator
Patent: 7,472,326 →
Application: 10/431,043 →
Publication: US 2004/0153920
Automatic Test System with Easily Modified Software
Patent: 7,171,587 →
Application: 10/460,104 →
Publication: US 2004/0215361
Clock Distribution System for Automatic Test Equipment
Patent: 6,822,498 →
Application: 10/461,568 →
Direct Jitter Analysis of Binary Sampled Data
Patent: 7,636,642 →
Application: 10/465,010 →
Publication: US 2004/0260492
High-Speed Duty Cycle Control Circuit
Patent: 6,819,155 →
Application: 10/601,688 →
Method for Testing Non-Deterministic Device Data
Patent: 7,216,273 →
Application: 10/606,848 →
Publication: US 2004/0268199
Apparatus and Method for Testing Non-Deterministic Device Data
Patent: 6,990,423 →
Application: 10/606,971 →
Publication: US 2004/0267487
Flexible Approach for Representing Different Bus Protocols
Patent: 7,428,218 →
Application: 10/608,588 →
Publication: US 2004/0057391
Parallel Converter Topology for Reducing Non-Linearity Errors
Patent: 6,919,833 →
Application: 10/655,377 →
Publication: US 2005/0052301
Current Mirror Compensation Using Channel Length Modulation
Patent: 7,123,075 →
Application: 10/671,754 →
Publication: US 2005/0068072
Current Mirror Compensation Circuit and Method
Patent: 7,061,307 →
Application: 10/671,755 →
Publication: US 2005/0068076
Efficient Switching Architecture with Reduced Stub Lengths
Patent: 6,958,598 →
Application: 10/675,083 →
Publication: US 2005/0068898
High Resolution Synthesizer with Improved Signal Purity
Patent: 7,327,816 →
Application: 10/744,037 →
Publication: US 2005/0135524
Dds Circuit with Arbitrary Frequency Control Clock
Patent: 7,336,748 →
Application: 10/744,039 →
Publication: US 2005/0135525
Techniques for Controlling Movement of a Circuit Board Module Along Card Cage Slot
Patent: 6,975,130 →
Application: 10/748,318 →
Publication: US 2005/0146347
Multi-Stage Numeric Counter Oscillator
Patent: 7,064,616 →
Application: 10/748,488 →
Publication: US 2005/0146360
Telematics-Based Vehicle Data Acquisition Architecture
Patent: 7,584,029 →
Application: 10/749,264 →
Publication: US 2005/0182534
Silicon-On-Insulator Channel Architecture for Automatic Test Equipment
Patent: 6,853,181 →
Application: 10/749,266 →
Parallel Source/Capture Architecture
Patent: 7,230,553 →
Application: 10/749,704 →
Publication: US 2005/0149807
Method and Apparatus for Generating Reference Transmission Signal for Use in Testing Communications Receivers
Patent: 7,457,995 →
Application: 10/769,971 →
Radio Frequency (Rf) Transceiver with Substantially Coincident Communication of Rf and Related Control Signals
Patent: 7,167,682 →
Application: 10/770,030 →
Distributed Test Equipment System for Testing Analog Communications Systems
Patent: 7,457,712 →
Application: 10/770,298 →
Test System with Differential Signal Measurement
Patent: 7,174,279 →
Application: 10/813,712 →
Publication: US 2005/0222821
Method of Measuring Duty Cycle
Patent: 7,151,367 →
Application: 10/815,024 →
Publication: US 2005/0225314
Digital Phase Detector
Patent: 7,061,276 →
Application: 10/817,780 →
Publication: US 2005/0218997
Concentric Spacer for Reducing Capacitive Coupling in Multilayer Substrate Assemblies
Patent: 7,388,158 →
Application: 10/817,785 →
Publication: US 2006/0060376
Synchronization Between Low Frequency and High Frequency Digital Signals
Patent: 7,061,286 →
Application: 10/875,865 →
Publication: US 2005/0285640
Comparator Feedback Peak Detector
Patent: 7,161,392 →
Application: 10/876,161 →
Publication: US 2005/0285633
Precise Time Measurement Apparatus and Method
Patent: 7,379,395 →
Application: 10/881,373 →
Publication: US 2006/0002239
Heat Exchange Apparatus with Parallel Flow
Patent: 7,187,549 →
Application: 10/882,433 →
Publication: US 2006/0002086
Automated Test Equipment with Dib Mounted Three Dimensional Tester Electronics Bricks
Patent: 7,375,542 →
Application: 10/882,467 →
Publication: US 2006/0001435
Apparatus for Planarizing a Probe Card and Method Using Same
Patent: 7,098,650 →
Application: 10/902,188 →
Publication: US 2005/0062464
Method for Measuring Sensitivity of Data Packet Signal Receiver
Patent: 8,189,483 →
Application: 10/908,946 →
Publication: US 2006/0274657
Time Measurement Method Using Quadrature Sine Waves
Patent: 7,085,668 →
Application: 10/923,488 →
Publication: US 2006/0052982
Method and Apparatus for Measuring Jitter
Patent: 7,590,170 →
Application: 10/954,032 →
Publication: US 2006/0067390
Interface Apparatus for Semiconductor Device Tester
Patent: 7,046,027 →
Application: 10/966,480 →
Publication: US 2006/0082358
Pin Driver for Ac and Dc Semiconductor Device Testing
Patent: 7,019,547 →
Application: 10/988,765 →
Publication: US 2005/0088197
Method for Digital Bus Testing
Patent: 7,420,375 →
Application: 10/997,032 →
Publication: US 2005/0193275
Apparatus and Method for Operating Automated Test Equipment (Ate)
Patent: 7,363,188 →
Application: 11/004,723 →
Rear-Mounted Gimbal for Supporting Test Head
Patent: 7,135,854 →
Application: 11/006,490 →
Publication: US 2005/0127897
Silicon-On-Insulator Channel Architecture for Automatic Test Equipment
Patent: 7,088,092 →
Application: 11/009,928 →
Publication: US 2005/0158890
Using Parametric Measurement Units as a Source of Power for a Device Under Test
Patent: 7,403,030 →
Application: 11/016,352 →
Publication: US 2006/0132163
Method and System for Testing Semiconductor Devices
Patent: 7,256,600 →
Application: 11/018,540 →
Publication: US 2006/0132165
Method and System for Producing Signals to Test Semiconductor Devices
Patent: 7,135,881 →
Application: 11/018,626 →
Publication: US 2006/0132166
Pin Electronics with High Voltage Functionality
Patent: 7,102,375 →
Application: 11/023,023 →
Publication: US 2006/0139048
Over-Voltage Test for Automatic Test Equipment
Patent: 7,395,479 →
Application: 11/036,850 →
Publication: US 2006/0161827
Method for Testing and Programming Memory Devices and System for Same
Patent: 7,861,059 →
Application: 11/051,325 →
Publication: US 2005/0193233
Hybrid Ac/Dc-Coupled Channel for Testing
Patent: 7,208,937 →
Application: 11/060,239 →
Publication: US 2005/0140388
Instrument with Interface for Synchronization in Automatic Test Equipment
Patent: 7,319,936 →
Application: 11/063,078 →
Publication: US 2006/0123296
Automatic Test System with Synchronized Instruments
Patent: 7,454,681 →
Application: 11/063,289 →
Publication: US 2006/0123297
Calibrating Automatic Test Equipment Containing Interleaved Analog-to-Digital Converters
Patent: 7,183,953 →
Application: 11/094,896 →
Publication: US 2006/0227026
Wireless Communication System
Patent: 7,881,397 →
Application: 11/094,900 →
Publication: US 2006/0222102
Calibrating Automatic Test Equipment to Account for Magnitude and Phase Offsets
Patent: 7,643,545 →
Application: 11/094,934 →
Publication: US 2006/0222062
Configurable Automatic-Test-Equipment System
Patent: 7,343,558 →
Application: 11/094,970 →
Publication: US 2006/0242504
Calibrating Automatic Test Equipment
Patent: 7,957,461 →
Application: 11/095,755 →
Publication: US 2006/0236157
Using a Parametric Measurement Unit for Converter Testing
Patent: 7,023,366 →
Application: 11/137,240 →
Measurement Circuit with Improved Accuracy
Patent: 7,064,535 →
Application: 11/153,104 →
Publication: US 2005/0231189
Method for Efficient Calibration of Evm Using Compression Characteristics
Patent: 7,519,383 →
Application: 11/160,673 →
Publication: US 2007/0009021
Method for Measuring Multiple Parameters of a Signal Transmitted by a Signal Generator
Patent: 7,564,896 →
Application: 11/161,692 →
Publication: US 2007/0036208
Device and Method to Reduce Simultaneous Switching Noise
Patent: 7,523,238 →
Application: 11/170,857 →
Publication: US 2007/0005282
Jitter Compensation and Generation in Testing Communication Devices
Patent: 7,295,642 →
Application: 11/172,306 →
Publication: US 2007/0002964
Floating Interface Linkage
Patent: 7,507,099 →
Application: 11/175,809 →
Publication: US 2006/0073723
Pin Electronics Driver
Patent: 7,323,898 →
Application: 11/183,382 →
Publication: US 2007/0018681
Ternary Search Process
Patent: 7,809,999 →
Application: 11/184,482 →
Publication: US 2007/0019719
Delayed Processing of Site-Aware Objects
Patent: 7,487,422 →
Application: 11/184,579 →
Publication: US 2006/0248425
Efficient Switching Architecture with Reduced Stub Lengths
Patent: 7,863,888 →
Application: 11/191,198 →
Publication: US 2007/0025257
Portable Manipulator for Stackable Semiconductor Test System
Patent: 7,312,604 →
Application: 11/192,631 →
Publication: US 2007/0024296
Site-Aware Objects
Patent: 7,253,607 →
Application: 11/192,927 →
Publication: US 2006/0244474
Site Loops
Patent: 7,254,508 →
Application: 11/231,722 →
Publication: US 2006/0247879
Strobe Technique for Test of Digital Signal Timing
Patent: 7,856,578 →
Application: 11/234,542 →
Publication: US 2007/0091991
Strobe Technique for Recovering a Clock in a Digital Signal
Patent: 7,573,957 →
Application: 11/234,599 →
Publication: US 2007/0126487
Strobe Technique for Time Stamping a Digital Signal
Patent: 7,574,632 →
Application: 11/234,814 →
Publication: US 2007/0071080
Tester Interface Module
Patent: 7,180,321 →
Application: 11/235,951 →
Publication: US 2006/0071680
Data Capture in Automatic Test Equipment
Patent: 7,389,461 →
Application: 11/237,383 →
Publication: US 2007/0168817
Pin Electronics Driver
Patent: 7,560,947 →
Application: 11/237,384 →
Publication: US 2007/0069755
Low-Spur Low-Distortion Digital-to-Analog Converter
Patent: 7,126,519 →
Application: 11/241,572 →
Apparatus and Method for Testing Non-Deterministic Device Data
Patent: 7,509,226 →
Application: 11/257,773 →
Publication: US 2006/0116840
Dual Sine-Wave Time Stamp Method and Apparatus
Patent: 7,378,854 →
Application: 11/261,897 →
Publication: US 2007/0100570
Modularized Device Interface with Grounding Insert Between Two Strips
Patent: 7,541,819 →
Application: 11/261,962 →
Publication: US 2007/0096755
Automatic Testing Equipment Instrument Card and Probe Cabling System and Apparatus
Patent: 7,504,822 →
Application: 11/262,001 →
Publication: US 2007/0096756
Method and Apparatus for Adjustment of Synchronous Clock Signals
Patent: 7,593,497 →
Application: 11/263,397 →
Publication: US 2007/0098127
Compensating for Loss in a Transmission Path
Patent: 7,408,337 →
Application: 11/265,525 →
Publication: US 2006/0273781
Impedance Controlled via Structure
Patent: 7,492,146 →
Application: 11/266,892 →
Publication: US 2006/0258187
Jitter Measurement Algorithm Using Locally in-Order Strobes
Patent: 7,668,235 →
Application: 11/271,507 →
Publication: US 2007/0118315
Determining Frequency Components of Jitter
Patent: 7,349,818 →
Application: 11/272,027 →
Publication: US 2007/0118316
Method for Testing Embedded Wireless Transceiver with Minimal Interaction Between Wireless Transceiver and Host Processor During Testing
Patent: 7,689,213 →
Application: 11/279,778 →
Publication: US 2007/0243825
Obtaining Test Data for a Device
Patent: 7,519,878 →
Application: 11/287,506 →
Publication: US 2007/0043994
Analog-To-Digital Converter with Non-Linearity Compensation
Patent: 7,352,306 →
Application: 11/291,660 →
Publication: US 2007/0120720
Calibration Circuitry
Patent: 7,221,298 →
Application: 11/297,726 →
Publication: US 2007/0132619
Method and Apparatus for 0/180 Degree Phase Detector
Patent: 7,885,361 →
Application: 11/311,821 →
Publication: US 2007/0140379
Enhanced Loopback Testing of Serial Devices
Patent: 7,337,377 →
Application: 11/315,974 →
Publication: US 2006/0123304
Digitizer with Enhanced Accuracy
Patent: 7,239,259 →
Application: 11/318,252 →
Publication: US 2007/0146188
Method and System for Monitoring Test Signals for Semiconductor Devices
Patent: 7,508,228 →
Application: 11/321,288 →
Publication: US 2006/0279310
Alignment Receptacle of a Sensor Adapted to Interact with a Pin to Generate Position Data Along at Least Two Transverse Axes for Docking a Test Head
Patent: 7,598,725 →
Application: 11/323,557 →
Publication: US 2007/0152695
Multi-Stream Interface for Parallel Test Processing
Patent: 7,673,199 →
Application: 11/346,801 →
Publication: US 2007/0208985
Phase Locking on Aliased Frequencies
Patent: 7,345,549 →
Application: 11/364,534 →
Publication: US 2007/0205836
Method for Inspecting a Region of Interest
Patent: 7,327,870 →
Application: 11/375,402 →
Publication: US 2006/0188141
Method for Capturing Multiple Data Packets in a Data Signal for Analysis
Patent: 7,484,146 →
Application: 11/422,475 →
Publication: US 2007/0294378
Apparatus for Capturing Multiple Data Packets in a Data Signal for Analysis
Patent: 7,567,521 →
Application: 11/422,489 →
Publication: US 2007/0280196
High Performance Signal Generation
Patent: 7,432,751 →
Application: 11/430,663 →
Publication: US 2006/0202733
System for Testing Smart Cards and Method for Same
Patent: 7,765,080 →
Application: 11/437,343 →
Publication: US 2006/0276989
Connector-To-Pad Printed Circuit Board Translator and Method of Fabrication
Patent: 7,649,375 →
Application: 11/474,921 →
Publication: US 2007/0007034
Calibrating a Testing Device
Patent: 7,480,581 →
Application: 11/475,581 →
Publication: US 2007/0299621
Compliant Electro-Mechanical Device
Patent: 7,946,853 →
Application: 11/479,205 →
Publication: US 2007/0004238
Method for Using Probe Card
Patent: 8,120,375 →
Application: 11/506,653 →
Publication: US 2006/0279302
Sine Wave Generator with Dual Port Look-Up Table
Patent: 7,890,562 →
Application: 11/529,837 →
Publication: US 2008/0109503
Apparatus and Method for Simultaneous Testing of Multiple Orthogonal Frequency Division Multiplexed Transmitters with Single Vector Signal Analyzer
Patent: 7,822,130 →
Application: 11/533,971 →
Publication: US 2007/0070691
Apparatus and Method for Simultaneous Testing of Multiple Orthogonal Frequency Division Multiplexed Transmitters with Single Vector Signal Analyzer
Patent: 7,706,250 →
Application: 11/533,987 →
Publication: US 2007/0070881
Liquid Immersion Cooled Multichip Module
Patent: 7,285,851 →
Application: 11/540,391 →
Signal Analysis Using Dual Converters and Cross Spectrum
Patent: 7,429,939 →
Application: 11/540,773 →
Publication: US 2008/0079623
Low Cost, High Purity Sign Wave Generator
Patent: 7,933,942 →
Application: 11/540,810 →
Publication: US 2008/0109504
Networked Test System
Patent: 7,908,531 →
Application: 11/540,812 →
Publication: US 2008/0098272
Comparator Feedback Peak Detector
Patent: 7,535,263 →
Application: 11/543,672 →
Publication: US 2007/0085572
Test Solution Development Method
Patent: 7,590,954 →
Application: 11/554,815 →
Publication: US 2008/0127008
Quantized Data-Dependent Jitter Injection Using Discrete Samples
Patent: 7,536,621 →
Application: 11/608,460 →
Publication: US 2008/0141090
Conductive Shielding Device
Patent: 8,063,727 →
Application: 11/608,465 →
Publication: US 2008/0136576
Error Reduction for Parallel, Time-Interleaved Analog-to-Digital Converter
Patent: 7,541,958 →
Application: 11/618,792 →
Publication: US 2008/0169949
V/I Source and Test System Incorporating the Same
Patent: 7,489,146 →
Application: 11/645,430 →
Publication: US 2007/0210810
Rotational Positioner and Methods for Semiconductor Wafer Test Systems
Patent: 7,701,232 →
Application: 11/656,825 →
Publication: US 2008/0174330
Distributing Data Among Test Boards to Determine Test Parameters
Patent: 7,528,623 →
Application: 11/670,750 →
Publication: US 2008/0189060
High-Speed Digital Multiplexer
Patent: 7,509,227 →
Application: 11/671,105 →
Publication: US 2007/0146183
Design-For-Test Micro Probe
Patent: 7,589,548 →
Application: 11/677,616 →
Publication: US 2008/0205172
Electrically Stimulated Fingerprint Sensor Test Method
Patent: 7,584,068 →
Application: 11/677,690 →
Publication: US 2008/0208495
Calibrating a Tester Using Esd Protection Circuitry
Patent: 7,489,125 →
Application: 11/695,234 →
Publication: US 2008/0243740
System and Method for Testing Multiple Packet Data Transmitters
Patent: 7,962,823 →
Application: 11/696,921 →
Publication: US 2008/0172588
Direct Facility Water Test Head Cooling Architecture
Patent: 7,554,323 →
Application: 11/715,650 →
Publication: US 2008/0041568
Tester Input/Output Sharing
Patent: 7,890,822 →
Application: 11/731,392 →
Publication: US 2008/0086664
Adaptive Background Propagation Method and Device Therefor
Patent: 7,925,074 →
Application: 11/731,715 →
Publication: US 2008/0089606
Cost Effective Low Noise Single Loop Synthesizer
Patent: 7,545,224 →
Application: 11/734,637 →
Publication: US 2008/0252384
Calibrating Jitter
Patent: 7,991,046 →
Application: 11/750,651 →
Publication: US 2008/0285636
System and Method for Testing Wireless Devices
Patent: 8,312,330 →
Application: 11/766,282 →
Publication: US 2008/0320345
Calibration Device
Patent: 7,523,007 →
Application: 11/771,389 →
Publication: US 2008/0125998
Integrated High-Efficiency Microwave Sourcing Control Process
Patent: 8,131,387 →
Application: 11/836,331 →
Publication: US 2009/0043526
Apparatus, System and Method for Calibrating and Verifying a Wireless Communication Device
Patent: 8,676,188 →
Application: 11/839,788 →
Publication: US 2008/0285467
System for Testing an Embedded Wireless Transceiver
Patent: 8,131,223 →
Application: 11/839,814 →
Publication: US 2008/0293363
System for Testing an Embedded Wireless Transceiver
Patent: 7,865,147 →
Application: 11/839,828 →
Publication: US 2008/0287117
Apparatus and Method for Testing a Wireless Transceiver
Patent: 8,509,090 →
Application: 11/867,467 →
Publication: US 2009/0092053
Emulating Behavior of a Legacy Test System
Patent: 8,310,270 →
Application: 11/867,672 →
Publication: US 2009/0091347
Laser Targeting Mechanism
Patent: 7,847,570 →
Application: 11/875,561 →
Publication: US 2009/0102498
Automated Test Equipment Interface
Patent: 7,733,081 →
Application: 11/875,627 →
Publication: US 2009/0102457
Method and Apparatus for Cooling Non-Native Instrument in Automatic Test Equipment
Patent: 7,642,802 →
Application: 11/906,158 →
Publication: US 2008/0136439
Apparatus and Method for Operating Automated Test Equipment (Ate)
Patent: 9,160,554 →
Application: 11/931,566 →
Testing of Analog to Digital Converters
Patent: 7,561,083 →
Application: 11/933,038 →
Publication: US 2009/0109072
Calibrating Automatic Test Equipment
Patent: 7,888,947 →
Application: 11/943,948 →
Publication: US 2009/0128162
Manipulator Constant Force Spring Counterbalance
Patent: 7,685,885 →
Application: 11/953,744 →
Publication: US 2009/0145241
Disk Drive Testing
Patent: 7,996,174 →
Application: 11/958,788 →
Publication: US 2009/0153992
Disk Drive Transport, Clamping and Testing
Patent: 8,549,912 →
Application: 11/959,133 →
Publication: US 2009/0153994
Residual Fourier-Padding Interpolation for Instrumentation and Measurement
Patent: 8,046,396 →
Application: 11/962,262 →
Publication: US 2008/0243983
Shielded Cable Interface Module and Method of Fabrication
Patent: 7,977,583 →
Application: 11/963,704 →
Publication: US 2009/0151993
Interpolation Digital-to-Analog Converter
Patent: 7,595,746 →
Application: 11/964,254 →
Publication: US 2009/0167583
Identifying Periodic Jitter in a Signal
Patent: 8,452,560 →
Application: 11/966,248 →
Publication: US 2008/0162060
Efficient, Selective Error Reduction for Parallel, Time-Interleaved Analog-to-Digital Converter
Patent: 7,538,708 →
Application: 11/967,290 →
Publication: US 2008/0158029
Instrument with Interface for Synchronization in Automatic Test Equipment
Patent: 7,769,559 →
Application: 11/986,113 →
Publication: US 2008/0077350
Adjustable Test Pattern Results Latency
Patent: 7,788,564 →
Application: 11/986,508 →
Publication: US 2009/0100303
Jitter Frequency Determining System
Patent: 7,606,675 →
Application: 12/020,020 →
Publication: US 2008/0125991
Determining Frequency Components of Jitter
Patent: 7,519,490 →
Application: 12/020,027 →
Publication: US 2008/0117960
Time Measurement of Periodic Signals
Patent: 7,786,718 →
Application: 12/055,785 →
Publication: US 2009/0167381
Test System with High Frequency Interposer
Patent: 7,816,932 →
Application: 12/070,864 →
Publication: US 2009/0212802
Automated Test Equipment with Dib Mounted Three Dimensional Tester Electronics Bricks
Patent: 7,663,389 →
Application: 12/101,732 →
Publication: US 2009/0079453
Transferring Disk Drives Within Disk Drive Testing Systems
Patent: 8,095,234 →
Application: 12/104,536 →
Publication: US 2009/0262444
Disk Drive Emulator and Method of Use Thereof
Patent: 7,945,424 →
Application: 12/104,594 →
Publication: US 2009/0265136
Bulk Feeding Disk Drives to Disk Drive Testing Systems
Patent: 8,041,449 →
Application: 12/104,869 →
Publication: US 2009/0262445
Enclosed Operating Area for Disk Drive Testing Systems
Patent: 8,238,099 →
Application: 12/105,041 →
Publication: US 2009/0261047
Temperature Control Within Disk Drive Testing Systems
Patent: 7,848,106 →
Application: 12/105,061 →
Publication: US 2009/0262454
Dependent Temperature Control Within Disk Drive Testing Systems
Patent: 8,117,480 →
Application: 12/105,069 →
Publication: US 2009/0265043
Vibration Isolation Within Disk Drive Testing Systems
Patent: 8,305,751 →
Application: 12/105,105 →
Publication: US 2009/0261229
Thermal Control System for Test Slot of Test Rack for Disk Drive Testing System with Thermoelectric Device and a Cooling Conduit
Patent: 8,102,173 →
Application: 12/105,107 →
Publication: US 2009/0261228
Fast, Low Power Formatter for Automatic Test System
Patent: 7,987,063 →
Application: 12/107,548 →
Publication: US 2009/0261872
Current Meter with Reduced Range Switching and Load Transients
Patent: 7,538,539 →
Application: 12/117,034 →
Apparatus and Method for Testing a Communication Circuit
Patent: 8,166,340 →
Application: 12/144,919 →
Publication: US 2009/0319826
Tracker Circuit and Method for Automated Test Equipment Systems
Patent: 8,094,766 →
Application: 12/167,073 →
Publication: US 2010/0002819
Method for Testing Data Packet Transceiver Using Loop Back Packet Generation
Patent: 7,773,531 →
Application: 12/170,665 →
Publication: US 2010/0008237
X-Ray Inspection of Solder Reflow in High-Density Printed Circuit Board Applications
Patent: 8,031,929 →
Application: 12/190,035 →
Publication: US 2009/0080764
Method of and System for Obtaining Linear Data for Object Scanned Using Non-Collimated, Poly-Energetic X-Rays
Patent: 7,626,175 →
Application: 12/193,235 →
Publication: US 2009/0218498
Method of and System for Calibration of Inspection Systems Producing X-Ray Images
Patent: 7,819,581 →
Application: 12/193,321 →
Publication: US 2009/0218480
System and Method for Mounting Shielded Cables to Printed Circuit Board Assemblies
Patent: 8,115,107 →
Application: 12/195,928 →
Publication: US 2009/0225526
Disk Drive Emulator and Method of Use Thereof
Patent: 8,499,611 →
Application: 12/246,060 →
Publication: US 2010/0083732
Method for Measuring Multiple Parameters of a Signal Transmitted by a Signal Generator
Patent: 8,155,175 →
Application: 12/267,165 →
Publication: US 2009/0061782
Method and Apparatus for Computing Interpolation Factors in Sample Rate Conversion Systems
Patent: 7,719,446 →
Application: 12/271,436 →
Publication: US 2009/0128379
Coaxial Cable to Printed Circuit Board Interface Module
Patent: 7,815,466 →
Application: 12/328,752 →
Publication: US 2009/0176406
Radio Frequency (Rf) Signal Generator and Method for Providing Test Signals for Testing Multiple Rf Signal Receivers
Patent: 8,036,617 →
Application: 12/335,241 →
Publication: US 2010/0148827
Timing Signal Generator Providing Synchronized Timing Signals at Non-Integer Clock Multiples Adjustable by More Than One Period
Patent: 7,804,349 →
Application: 12/337,999 →
Publication: US 2009/0167401
Apparatus and Method for Controlling Memory Overrun
Patent: 8,745,337 →
Application: 12/340,198 →
Publication: US 2009/0172310
Digital Communications Test System for Multiple Input, Multiple Output (Mimo) Systems
Patent: 7,948,254 →
Application: 12/348,992 →
Publication: US 2010/0123471
Pin Electronics Liquid Cooled Multi-Module for High Performance, Low Cost Automated Test Equipment
Patent: 8,289,039 →
Application: 12/402,380 →
Publication: US 2010/0231250
General Purpose Protocol Engine
Patent: 8,195,419 →
Application: 12/404,158 →
Publication: US 2010/0235135
Method and Apparatus for Testing Multiple Data Signal Transceivers Substantially Simultaneously with Common Transceiver Tester
Patent: 8,170,490 →
Application: 12/420,294 →
Publication: US 2010/0261431
Transferring Storage Devices Within Storage Device Testing Systems
Patent: 8,160,739 →
Application: 12/424,980 →
Publication: US 2009/0265032
Method and System for Testing Data Signal Amplifier Having Output Signal Power Dependent Upon Multiple Power Control Parameters
Patent: 7,772,922 →
Application: 12/425,058 →
Processing Storage Devices
Patent: 8,086,343 →
Application: 12/474,388 →
Publication: US 2009/0297328
Test Slot Cooling System for a Storage Device Testing System
Patent: 7,920,380 →
Application: 12/503,567 →
Publication: US 2011/0013362
Heating Storage Devices in a Testing System
Patent: 8,466,699 →
Application: 12/503,593 →
Publication: US 2011/0012631
Storage Device Temperature Sensing
Patent: 7,995,349 →
Application: 12/503,687 →
Publication: US 2011/0013665
Methods and Apparatus for Connecting Printed Circuit Boards Using Zero-Insertion Wiping Force Connectors
Patent: 8,128,417 →
Application: 12/563,319 →
Publication: US 2011/0070748
Method and System for Testing Multiple Data Packet Transceivers Together During a Predetermined Time Interval
Patent: 8,085,685 →
Application: 12/563,325 →
Publication: US 2011/0069624
Device Interface Board with Cavity Back for Very High Frequency Applications
Patent: 8,461,855 →
Application: 12/572,955 →
Publication: US 2011/0080187
Using Pattern Generators to Control Flow of Data to and from a Semiconductor Device Under Test
Patent: 8,269,520 →
Application: 12/575,800 →
Publication: US 2011/0087942
Capacitive Opens Testing in Low Signal Environments
Patent: 8,310,256 →
Application: 12/645,418 →
Publication: US 2011/0148446
Low Capacitance Probe for Testing Circuit Assembly
Patent: 8,760,185 →
Application: 12/645,424 →
Publication: US 2011/0148450
System and Method for Testing Multiple Digital Signal Transceivers in Parallel
Patent: 8,116,208 →
Application: 12/691,387 →
Publication: US 2011/0090799
Storage Device Testing System Cooling
Patent: 8,687,356 →
Application: 12/698,575 →
Publication: US 2011/0189934
Test Slot Carriers
Patent: 8,631,698 →
Application: 12/698,605 →
Publication: US 2011/0185811
Test Access Component for Automatic Testing of Circuit Assemblies
Patent: 8,604,820 →
Application: 12/707,930 →
Publication: US 2010/0207651
Automated Test Equipment Employing Test Signal Transmission Channel with Embedded Series Isolation Resistors
Patent: 8,373,432 →
Application: 12/724,727 →
Publication: US 2010/0259277
Bulk Feeding Disk Drives to Disk Drive Testing Systems
Patent: 8,140,182 →
Application: 12/726,856 →
Publication: US 2010/0172722
Transferring Disk Drives Within Disk Drive Testing Systems
Patent: 7,987,018 →
Application: 12/727,150 →
Publication: US 2010/0165501
Dependent Temperature Control Within Disk Drive Testing Systems
Patent: 7,904,211 →
Application: 12/727,207 →
Publication: US 2010/0165498
Processing Storage Devices
Patent: 7,908,029 →
Application: 12/727,619 →
Publication: US 2010/0174404
Test Slot Cooling System for a Storage Device Testing System
Patent: 7,778,031 →
Application: 12/727,700 →
Method for Testing in a Reconfigurable Tester
Patent: 8,725,489 →
Application: 12/740,886 →
Publication: US 2010/0313071
Protocol Aware Digital Channel Apparatus
Patent: 8,805,636 →
Application: 12/740,927 →
Publication: US 2010/0312516
Individually Heating Storage Devices in a Testing System
Patent: 7,932,734 →
Application: 12/760,164 →
Publication: US 2011/0011844
Storage Device Temperature Sensing
Patent: 7,940,529 →
Application: 12/760,305 →
Publication: US 2011/0013666
Disk Drive Transport, Clamping and Testing
Patent: 8,467,180 →
Application: 12/766,680 →
Publication: US 2010/0195236
Disk Drive Transport, Clamping and Testing
Patent: 8,405,971 →
Application: 12/767,113 →
Publication: US 2010/0194253
Vibration Isolation Within Disk Drive Testing Systems
Patent: 7,911,778 →
Application: 12/767,142 →
Publication: US 2010/0193661
Connecting Digital Storage Oscilloscopes
Patent: 8,542,005 →
Application: 12/769,065 →
Publication: US 2011/0267036
Multi-Level Triggering Circuit
Patent: 8,502,522 →
Application: 12/769,075 →
Publication: US 2011/0267037
Driving an Electronic Instrument
Patent: 8,531,176 →
Application: 12/769,082 →
Publication: US 2011/0267030
Attenuator Circuit
Patent: 8,098,181 →
Application: 12/769,114 →
Publication: US 2011/0267214
Storage Device Testing System Cooling
Patent: 7,929,303 →
Application: 12/775,560 →
System and Method for Using Multiple Network Addresses to Establish Synchronization of a Device Under Test and Test Equipment Controlling the Test
Patent: 8,391,160 →
Application: 12/791,594 →
Publication: US 2011/0292809
Management Of Air-Borne Vibration
Application: 12/815,085 →
Publication: US 2011/0305132
Storage Device Testing System Cooling
Patent: 8,116,079 →
Application: 12/815,140 →
Publication: US 2011/0064546
Damping Vibrations Within Storage Device Testing Systems
Patent: 9,779,780 →
Application: 12/817,614 →
Publication: US 2011/0310724
System and Method of Providing Driver Software to Test Controller to Facilitate Testing by Wireless Transceiver Tester of a Device Under Test
Patent: 8,402,321 →
Application: 12/819,383 →
Publication: US 2011/0314333
A Storage Device Testing System with a Conductive Heating Assembly
Patent: 8,547,123 →
Application: 12/836,915 →
Publication: US 2011/0012632
Storage Device Temperature Sensing
Patent: 8,628,239 →
Application: 12/836,940 →
Publication: US 2011/0013667
Bulk Transfer of Storage Devices Using Manual Loading
Patent: 8,687,349 →
Application: 12/840,399 →
Publication: US 2012/0023370
Temperature Control Within Disk Drive Testing Systems
Patent: 8,482,915 →
Application: 12/856,056 →
Publication: US 2010/0302678
Engaging Test Slots
Patent: 9,001,456 →
Application: 12/872,401 →
Publication: US 2012/0050903
Method for Testing Wireless Devices Using Predefined Test Segments Initiated by Over-the-Air Signal Characteristics
Patent: 8,811,194 →
Application: 12/873,399 →
Publication: US 2012/0051224
High Throughput Semiconductor Device Testing
Patent: 8,527,231 →
Application: 12/882,695 →
Publication: US 2012/0065906
Electro-Optical Communications Link
Patent: 8,805,196 →
Application: 12/894,804 →
Publication: US 2012/0082463
Laser Targeting Mechanism
Patent: 8,471,587 →
Application: 12/911,141 →
Publication: US 2011/0037982
Enclosed Operating Area for Storage Device Testing Systems
Patent: 8,655,482 →
Application: 12/937,904 →
Publication: US 2011/0172807
Temperature Control Within Storage Device Testing Systems
Patent: 8,451,608 →
Application: 12/937,918 →
Publication: US 2011/0083825
Achieving Greater Test Efficiencies Using ACK Signal Suppression
Patent: 8,774,024 →
Application: 12/943,237 →
Publication: US 2012/0113829
Digital Communications Test System for Multiple Input, Multiple Output (Mimo) Systems
Patent: 8,228,087 →
Application: 12/985,848 →
Publication: US 2011/0096821
Transferring Storage Devices Within Storage Device Testing Systems
Patent: 8,712,580 →
Application: 12/988,257 →
Publication: US 2011/0106298
Identifying Fuel Cell Defects
Patent: 8,618,810 →
Application: 13/040,600 →
Publication: US 2012/0225366
Test Slot Cooling System for a Storage Device Testing System
Patent: 8,279,603 →
Application: 13/045,783 →
Publication: US 2011/0157825
Compensating for Harmonic Distortion in an Instrument Channel
Patent: 8,400,338 →
Application: 13/049,286 →
Publication: US 2011/0227767
Bulk Transfer of Storage Devices Using Manual Loading
Application: 13/053,651 →
Publication: US 2011/0236163
Probe-Card Interposer Constructed Using Hexagonal Modules
Patent: 8,622,752 →
Application: 13/085,885 →
Publication: US 2012/0264320
System and Method for Simultaneous Mimo Signal Testing with Single Vector Signal Analyzer
Patent: 8,576,947 →
Application: 13/089,945 →
Publication: US 2012/0269288
System for Concurrent Test of Semiconductor Devices
Patent: 8,762,095 →
Application: 13/100,889 →
Publication: US 2011/0275170
Liquid Cooling During Testing
Patent: 8,736,288 →
Application: 13/108,090 →
Publication: US 2012/0291999
Method and Apparatus for Testing Electrical Connections on a Printed Circuit Board
Patent: 9,638,742 →
Application: 13/122,347 →
Publication: US 2011/0204910
Fast Open Circuit Detection for Open Power and Ground Pins
Patent: 8,760,183 →
Application: 13/122,423 →
Publication: US 2011/0210759
Test Equipment Calibration
Patent: 8,692,538 →
Application: 13/156,651 →
Publication: US 2012/0313618
System and Method for Using a Single Vector Signal Generator to Verify Device Under Test
Patent: 8,312,329 →
Application: 13/158,870 →
Ate to Detect Signal Characteristics of a Dut
Patent: 9,442,148 →
Application: 13/183,672 →
Publication: US 2013/0018613
System and Method for Deterministic Testing of Packet Error Rate in Electronic Devices
Patent: 8,693,351 →
Application: 13/191,154 →
Publication: US 2013/0028100
Test System Supporting Simplified Configuration for Controlling Test Block Concurrency
Application: 13/281,148 →
Publication: US 2013/0102091
Test Instrument Having a Configurable Interface
Patent: 9,470,759 →
Application: 13/284,378 →
Publication: US 2013/0110446
Programmable Test Instrument
Patent: 9,759,772 →
Application: 13/284,483 →
Publication: US 2013/0110445
Programmable Test Instrument
Application: 13/284,491 →
Publication: US 2013/0111505
Determining Propagation Delay
Patent: 8,988,081 →
Application: 13/286,694 →
Publication: US 2013/0106399
Fast Single-Ended to Differential Converter
Patent: 9,240,774 →
Application: 13/298,019 →
Publication: US 2013/0124134
System and Method of Maintaining Correction of Dc Offsets in Frequency Down-Converted Data Signals
Patent: 8,537,942 →
Application: 13/357,370 →
Publication: US 2013/0188678
Digital Communications Test System for Multiple Input, Multiple Output (Mimo) Systems
Patent: 9,100,182 →
Application: 13/358,222 →
Publication: US 2012/0121000
Digital Communications Test System for Multiple Input, Multiple Output (Mimo) Systems
Patent: 9,035,672 →
Application: 13/358,282 →
Publication: US 2012/0121001
High Reliability, High Voltage Switch
Patent: 9,165,735 →
Application: 13/412,125 →
Publication: US 2013/0229068
Method for Identifying Self-Generated Spurious Signals
Patent: 8,912,804 →
Application: 13/416,517 →
Publication: US 2013/0234728
Method for Enabling a Device Under Test (Dut) to Retry a Portion of a Pre-Defined Test Sequence
Patent: 8,693,529 →
Application: 13/437,652 →
Publication: US 2013/0259097
Edge Triggered Calibration
Patent: 9,147,620 →
Application: 13/450,123 →
Publication: US 2013/0260485
Method for Measuring Sensitivity of Data Packet Signal Receiver
Patent: 8,913,517 →
Application: 13/452,169 →
Publication: US 2012/0213112
System and Method for Synchronized Triggering of Test Equipment for Testing Mimo Transceivers
Patent: 8,774,729 →
Application: 13/462,141 →
Publication: US 2013/0295858
Method for Efficient Parallel Testing of Time Division Duplex (Tdd) Communications Systems
Patent: 8,867,372 →
Application: 13/462,255 →
Publication: US 2013/0294255
System and Method for Initiating Testing of Multiple Communication Devices
Patent: 8,913,504 →
Application: 13/462,459 →
Publication: US 2013/0294252
General Purpose Protocol Engine
Patent: 8,521,465 →
Application: 13/464,650 →
Publication: US 2012/0221285
System and Method for Testing a Radio Frequency (Rf) Multiple-Input-Multiple-Output (Mimo) Device Under Test (Dut)
Patent: 9,002,290 →
Application: 13/467,518 →
Publication: US 2013/0301694
Method for Transferring and Confirming Transfer of Predefined Data to a Device Under Test (Dut) During a Test Sequence
Application: 13/486,471 →
Publication: US 2013/0326274
System and Method for Execution of User-Defined Instrument Command Sequences Using Multiple Hardware and Analysis Modules
Patent: 8,656,229 →
Application: 13/488,742 →
Publication: US 2013/0326290
Managing Interrupts
Patent: 8,914,566 →
Application: 13/527,048 →
Publication: US 2013/0339803
Implementing Remote Procedure Calls
Patent: 8,701,130 →
Application: 13/532,944 →
Publication: US 2013/0347010
System and Method for Facilitating Comparison of Radio Frequency (Rf) Data Signals Transmitted by a Device Under Test (Dut) and Received by a Test System
Patent: 9,325,435 →
Application: 13/554,035 →
Publication: US 2014/0024315
Bulk Transfer of Storage Devices Using Manual Loading
Patent: 8,964,361 →
Application: 13/593,007 →
Publication: US 2012/0321435
System and Method for Testing Radio Frequency Device Under Test Capable of Communicating Using Multiple Radio Access Technologies
Patent: 8,788,892 →
Application: 13/595,556 →
Publication: US 2014/0059397
Storage Device Testing Systems
Application: 13/623,282 →
Publication: US 2013/0071224
Controlling the Temperature of an Object
Patent: 9,002,186 →
Application: 13/633,741 →
Publication: US 2013/0108253
Debugging in a Semiconductor Device Test Environment
Patent: 9,959,186 →
Application: 13/680,407 →
Publication: US 2014/0143600
System and Method for Parallel Testing of Multiple Data Packet Signal Transceivers
Patent: 8,842,549 →
Application: 13/716,369 →
Publication: US 2014/0169182
Method of Facilitating Testing of Multiple Time-Division-Duplex (Tdd) Data Packet Signal Transceivers
Patent: 8,842,552 →
Application: 13/716,573 →
Publication: US 2014/0169181
Method of Testing Multiple Data Packet Signal Transceivers Concurrently
Patent: 9,158,642 →
Application: 13/721,210 →
Publication: US 2014/0181601
Interface for a Test System
Patent: 9,063,170 →
Application: 13/728,045 →
Publication: US 2014/0184257
Test System Having Liquid Containment Chambers Over Connectors
Patent: 9,261,311 →
Application: 13/728,083 →
Publication: US 2014/0182813
Embedded Tester
Patent: 9,116,785 →
Application: 13/746,764 →
Publication: US 2014/0207402
System and Method for Testing Multiple Data Packet Signal Transceivers Concurrently
Patent: 9,088,521 →
Application: 13/772,422 →
Publication: US 2014/0233405
Rotatable Camera Module Testing System
Patent: 8,947,537 →
Application: 13/775,919 →
Publication: US 2014/0240518
Matrix Testing Targets
Patent: 9,225,977 →
Application: 13/776,076 →
Publication: US 2014/0240519
Managing Energy Transmission
Application: 13/786,937 →
Publication: US 2013/0256967
System and Method for Confirming Radio Frequency (Rf) Signal Connection Integrity with Multiple Devices Under Test (Duts) to Be Tested Concurrently
Patent: 9,167,459 →
Application: 13/791,098 →
Publication: US 2014/0256268
System and Method for Confirming Radio Frequency (Rf) Signal Connectivity with Device Under Test (Dut)
Patent: 8,934,849 →
Application: 13/791,127 →
Publication: US 2014/0256269
Smooth Vi Mode Crossover Method at Compliance Limit Threshold
Patent: 9,207,282 →
Application: 13/804,579 →
Publication: US 2014/0266270
Method and Apparatus for Device Testing Using Multiple Processing Paths
Patent: 9,134,377 →
Application: 13/826,038 →
Publication: US 2014/0281776
Parallel Operation of System Components
Application: 13/834,803 →
Publication: US 2014/0271064
Air Circulation in a System
Application: 13/834,880 →
Publication: US 2014/0262149
Method and Apparatus for Low Latency Communication in an Automatic Testing System
Patent: 9,791,511 →
Application: 13/836,567 →
Publication: US 2014/0278177
System and Method for Testing Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals
Patent: 9,671,445 →
Application: 13/839,162 →
Publication: US 2014/0266929
System and Method for Testing Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals
Patent: 9,678,126 →
Application: 13/839,583 →
Publication: US 2014/0266930
System and Method for Testing a Data Packet Signal Transceiver
Patent: 8,885,483 →
Application: 13/840,276 →
Publication: US 2014/0269365
System and Method for Testing a Data Packet Signal Transceiver
Patent: 8,780,966 →
Application: 13/841,019 →
Electronic Assembly Test System
Patent: 9,459,312 →
Application: 13/860,423 →
Publication: US 2014/0306728
System and Method for Testing a Radio Frequency Multiple-Input Multiple-Output Data Packet Transceiver While Forcing Fewer Data Streams
Patent: 9,077,535 →
Application: 13/894,817 →
Publication: US 2014/0269870
System and Method for Testing Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals
Patent: 8,811,461 →
Application: 13/912,410 →
System and Method for Testing Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals
Patent: 8,917,761 →
Application: 13/912,416 →
Publication: US 2014/0269871
System and Method for Testing Radio Frequency Wireless Signal Transceivers Using Wireless Test Signals
Patent: 9,774,406 →
Application: 13/912,423 →
Publication: US 2014/0273873
Calibration Device
Patent: 9,164,158 →
Application: 13/912,630 →
Publication: US 2014/0361798
System and Method for Execution of User-Defined Instrument Command Sequences Using Multiple Hardware and Analysis Modules
Patent: 8,839,055 →
Application: 13/923,638 →
Publication: US 2013/0326291
Method for Testing Sensitivity of a Data Packet Signal Transceiver
Patent: 9,485,040 →
Application: 13/959,354 →
Publication: US 2015/0036729
Method for Testing Data Packet Signal Transceiver Using Coordinated Transmitted Data Packet Signal Power
Patent: 9,003,253 →
Application: 13/972,280 →
Publication: US 2015/0058691
Synchronizing Data from Different Clock Domains by Bridges One of the Clock Signals to Appear to Run an Integer of Cycles More Than the Other Clock Signal
Patent: 9,195,261 →
Application: 14/016,819 →
Publication: US 2015/0067382
System and Method for Testing Multiple Data Packet Signal Transceivers
Patent: 8,879,659 →
Application: 14/017,012 →
Method for Testing Data Packet Signal Transceivers Using Interleaved Device Setup and Testing
Patent: 9,544,787 →
Application: 14/017,041 →
Publication: US 2015/0063133
Method for Testing Data Packet Signal Transceivers with Multiple Radio Access Technologies Using Interleaved Device Setup and Testing
Patent: 9,015,538 →
Application: 14/017,077 →
Publication: US 2015/0067417
System and Method for Testing Wide Band Data Packet Signal Transceivers Using Narrow Band Testers
Patent: 9,232,419 →
Application: 14/029,905 →
Publication: US 2015/0078196
Automated Test System with Event Detection Capability
Patent: 9,244,126 →
Application: 14/073,739 →
Publication: US 2015/0128003
System and Method for Data Packet Transceiver Testing After Signal Calibration and Power Settling to Minimize Test Time
Patent: 9,319,298 →
Application: 14/082,378 →
Publication: US 2015/0139023
Automated Test System with Edge Steering
Patent: 9,279,857 →
Application: 14/083,985 →
Publication: US 2015/0137838
Interconnect for Transmitting Signals Between a Device and a Tester
Patent: 9,435,855 →
Application: 14/084,414 →
Publication: US 2015/0137848
System and Method for Enabling Testing a Data Link of a Data Packet Signal Transceiver
Patent: 9,160,647 →
Application: 14/084,762 →
Publication: US 2015/0138998
System and Method for Dynamic Signal Interference Detection During Testing of a Data Packet Signal Transceiver
Patent: 9,083,647 →
Application: 14/087,584 →
Publication: US 2015/0149839
System and Method for Concurrently Testing Multiple Packet Data Signal Transceivers Capable of Communicating via Multiple Radio Access Technologies
Patent: 9,319,912 →
Application: 14/146,257 →
Publication: US 2015/0189524
System and Method for Testing Data Packet Transceivers Having Varied Performance Characteristics and Requirements Using Standard Test Equipment
Patent: 9,618,577 →
Application: 14/147,159 →
Publication: US 2015/0192639
Method for Testing Multiple Wireless Data Packet Signal Transceivers Using Shared Testing Resources
Application: 14/187,926 →
Publication: US 2015/0244477
System and Method for Testing a Radio Frequency Transceiver by Controlling Test Flow via an Induced Interrupt
Application: 14/202,104 →
Publication: US 2015/0256274
Equi-Resistant Probe Distribution for High-Accuracy Voltage Measurements at the Wafer Level
Application: 14/225,918 →
Publication: US 2015/0276803
Current Regulation for Accurate and Low-Cost Voltage Measurements at the Wafer Level
Application: 14/225,951 →
Publication: US 2015/0276799
Rf Phase Shift Apparatus Having an Electrically Coupled Path Separated from an Electromagnetically Coupled Path to Provide a Substantially Constant Phase Difference Therebetween
Patent: 9,306,257 →
Application: 14/243,166 →
Publication: US 2015/0288042
Circuitry to Protect a Test Instrument
Patent: 9,448,274 →
Application: 14/254,363 →
Publication: US 2015/0301104
Method for Testing Multiple Data Packet Signal Transceivers with a Shared Tester to Maximize Tester Use and Minimize Test Time
Patent: 9,319,154 →
Application: 14/256,095 →
Publication: US 2015/0304864
Vector Network Power Meter
Patent: 9,720,023 →
Application: 14/270,672 →
Publication: US 2014/0327429
Method and System for Testing a Radio Frequency Data Packet Signal Transceiver at a Low Network Media Layer
Application: 14/300,358 →
Publication: US 2015/0358839
Structure for Transmitting Signals in an Application Space Between a Device Under Test and Test Electronics
Patent: 9,594,114 →
Application: 14/316,164 →
Publication: US 2015/0377946
Edge Generator-Based Phase Locked Loop Reference Clock Generator for Automated Test System
Patent: 9,397,670 →
Application: 14/322,375 →
Publication: US 2016/0006441
Controlling Signal Path Inductance in Automatic Test Equipment
Patent: 9,989,584 →
Application: 14/329,617 →
Publication: US 2016/0011256
Coaxial Structure for Transmission of Signals in Test Equipment
Application: 14/332,757 →
Publication: US 2016/0018442
Isolation, Extraction and Evaluation of Transient Distortions from a Composite Signal
Patent: 9,668,074 →
Application: 14/450,071 →
Publication: US 2016/0037275
Method for Testing Implicit Beamforming Performance of a Multiple-Input Multiple-Output Radio Frequency Data Packet Signal Transceiver
Application: 14/461,573 →
Probe Alignment Connection Device
Patent: 9,880,199 →
Application: 14/464,852 →
Publication: US 2016/0054356
Capacitive Opens Testing of Low Profile Components
Patent: 9,778,314 →
Application: 14/468,094 →
Publication: US 2016/0054385
One-Shot Circuit
Application: 14/470,574 →
Publication: US 2016/0065183
Multi-Stage Equalization
Patent: 9,772,378 →
Application: 14/471,726 →
Publication: US 2016/0061926
System and Method for Capturing and Enabling Analysis of Test Data Packets from a Radio Frequency Data Packet Signal Transceiver
Patent: 9,497,101 →
Application: 14/476,855 →
Publication: US 2016/0072686
Thermal Control
Patent: 9,766,287 →
Application: 14/520,571 →
Publication: US 2016/0116528
Assembling Devices for Probe Card Testing
Application: 14/536,928 →
Publication: US 2016/0131702
SYSTEM AND METHOD FOR CONFIRMING RADIO FREQUENCY (RF) SIGNAL CONNECTION INTEGRITY WITH MULTIPLE DEVICES UNDER TEST (DUTs) TO BE TESTED CONCURRENTLY
Patent: 9,078,165 →
Application: 14/565,634 →
Publication: US 2015/0093998
Controlling a Per-Pin Measurement Unit
Application: 14/577,687 →
Publication: US 2016/0178667
Braking System
Application: 14/582,648 →
Publication: US 2016/0186804
System and Method for Testing a Radio Frequency (Rf) Multiple-Input-Multiple-Output (Mimo) Device Under Test (Dut)
Patent: 9,246,606 →
Application: 14/609,821 →
Publication: US 2015/0180591
High Speed Data Transfer Using Calibrated, Single-Clock Source Synchronous Serializer-Deserializer Protocol
Patent: 9,577,818 →
Application: 14/614,326 →
Publication: US 2016/0227004
Virtual Distance Test Techniques for Radar Applications
Application: 14/626,252 →
Publication: US 2016/0245900
Gripper For Automation
Application: 62/056,092 →
Related Assignments (3)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 6, 2014
From: HUTNER, MARC REUBEN; ROWE, JOHN F.
To: TERADYNE, INC.
Reel/Frame 031895/0107 →
Assignment of Assignor's Interest May 7, 2014
From: FAEHNRICH, RICHARD JOHN
To: TERADYNE, INC.
Reel/Frame 032839/0477 →
Release of Security Interest in Intellectual Property Jun 28, 2019
From: BARCLAYS BANK PLC, AS COLLATERAL AGENT
To: TERADYNE, INC.; EAGLE TEST SYSTEMS, INC.; LITEPOINT CORPORATION; NEXTEST SYSTEMS CORPORATION
Reel/Frame 049632/0940 →