Granted Patent
Utility
US 6,756,800
· Confirmation No. 5320
SEMICONDUCTOR TEST SYSTEM WITH EASILY CHANGED INTERFACE UNIT
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-05-19 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-03-15 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 4 | View | |
| 2004-03-15 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-03-15 | FWCLM |
Index of Claims | 1 | View | |
| 2004-03-15 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-01-29 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 4 | View | |
| 2003-11-28 | ANE.I |
Amendment After Final or under 37CFR 1.312, initialed by the examiner. | 1 | View | |
| 2003-11-10 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2003-11-10 | REM |
Applicant Arguments/Remarks Made in an Amendment | 2 | View | |
| 2003-06-18 | CTNF |
Non-Final Rejection | 7 | View | |
| 2003-06-18 | 892 |
List of references cited by examiner | 1 | View | |
| 2002-06-17 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-06-17 | SPEC |
Specification | 11 | View | |
| 2002-06-17 | CLM |
Claims | 4 | View | |
| 2002-06-17 | ABST |
Abstract | 1 | View | |
| 2002-06-17 | DRW |
Drawings-only black and white line drawings | 5 | View | |
| 2002-06-17 | OATH |
Oath or Declaration filed | 2 | View | |
| 2002-06-17 | LET. |
Miscellaneous Incoming Letter | 1 | View | |
| 2002-06-17 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2002-06-17 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2002-06-17 | FWCLM |
Index of Claims | 1 | View | |
| 2002-06-17 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-06-17 | DRW |
Drawings-only black and white line drawings | 5 | View | |
| 2002-06-17 | SPEC |
Specification | 11 | View | |
| 2002-06-17 | CLM |
Claims | 4 | View | |
| 2002-06-17 | ABST |
Abstract | 1 | View | |
| 2002-06-17 | OATH |
Oath or Declaration filed | 2 | View | |
| 2002-06-17 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-06-17 | WFEE |
Fee Worksheet (SB06) | 1 | View |
Inventors
Attorneys & Agents of Record
Classification
USPC
324/754
G01R31/2889
G01R31/01
G01R31/2834
G01R31/2851
G01R31/31905
Prosecution
- Examiner
- NGUYEN, JIMMY
- Art Unit
- 2829
- Docket No.
- 1695-US
- Confirmation No.
- 5320
Publication
- Pub. No.
- US20030194821A1
- Pub. Date
- 2003-10-16
Patent Term Adjustment
-133days
TERADYNE, INC.,
EAGLE TEST SYSTEMS, INC.,
LITEPOINT CORPORATION,
NEXTEST SYSTEMS CORPORATION,
GENRAD, LLC,
ENERGID TECHNOLOGIES CORPORATION
RELEASE OF SECURITY INTEREST IN INTELLECTUAL PROPERTY
Recorded 2019-06-28
PATENT SECURITY AGREEMENT
Recorded 2015-04-27
from
TERADYNE, INC.
NOTICE OF GRANT OF SECURITY INTEREST IN PATENTS
Recorded 2008-12-03
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Quick Facts
- Patent No.
- US 6,756,800
- App. No.
- 10/173,357
- Filed
- 2002-06-17
- Granted
- 2004-06-29
- Pub. No.
- US20030194821A1
- Examiner
- NGUYEN, JIMMY
- Art Unit
- 2829
- PTA
- -133 days
External Links