Patent Assignment
Reel/Frame 052595/0632
Security Interest
Recorded: 2020-05-07
Pages: 53
Assignor
TERADYNE, INC.
Executed: 2020-05-01
Assignee
TRUIST BANK
303 PEACHTREE STREET, 25TH FLOOR, MAIL CODE 7662 - ATTENTION: AGENCY SERVICES, ATLANTA, GEORGIA, 30308
Covered Properties
(458)
Memory Architecture for Automatic Test Equipment Using Vector Module Table
Patent:
6,286,120 →
Application:
08/299,753 →
With Positioning Modules Incorporating Kinematic Surfaces
Patent:
5,982,182 →
Application:
08/414,456 →
Manipulator for Automatic Test Equipment Test Head
Patent:
5,606,262 →
Application:
08/481,564 →
System for Detecting Faults in Connections Between Integrated Circuits and Circuit Board Traces
Patent:
5,736,862 →
Application:
08/493,399 →
Low Cost Cmos Tester
Patent:
6,469,493 →
Application:
08/510,079 →
Method of Making Memory Chips Using Memory Tester Providing Fast Repair
Patent:
5,795,797 →
Application:
08/516,709 →
Test System for Determining the Orientation of Components on a Circuit Board
Patent:
5,811,980 →
Application:
08/517,573 →
Configurable Probe Card for Automatic Test Equipment
Patent:
5,736,850 →
Application:
08/526,302 →
Integrated Circuit Test Power Supply
Patent:
5,773,990 →
Application:
08/536,206 →
Integrated Prober, Handler and Tester for Semiconductor Components
Patent:
6,024,526 →
Application:
08/546,236 →
Integrated Circuit Test Method and Structure
Patent:
5,917,331 →
Application:
08/546,751 →
System and Method of Programming a Multistation Testing System
Patent:
5,615,219 →
Application:
08/552,141 →
Time Linearity Measurement Using a Frequency Locked, Dual Sequencer Automatic Test System
Patent:
5,604,751 →
Application:
08/555,438 →
Method and Apparatus for Performing Serial and Parallel Scan Testing on an Integrated Circuit
Patent:
5,606,568 →
Application:
08/565,337 →
Automatic Test Equipment with Pipelined Sequencer
Patent:
5,657,486 →
Application:
08/569,020 →
Hybrid Scanner for Use in an Improved Mda Tester
Patent:
5,861,743 →
Application:
08/576,008 →
Apparatus and Method for Performing Digital Signal Processing in an Electronic Circuit Tester
Patent:
5,673,272 →
Application:
08/600,837 →
Apparatus and Method for Providing a Programmable Delay with Low Fixed Delay
Patent:
5,727,021 →
Application:
08/627,858 →
High Speed Serial Data Pin for Automatic Test Equipment
Patent:
5,689,515 →
Application:
08/638,026 →
Integrated Circuit Tray with Flexural Bearings
Patent:
5,758,776 →
Application:
08/653,588 →
Fast Vector Loading for Automatic Test Equipment
Patent:
5,737,512 →
Application:
08/653,949 →
Semiconductor Memory Tester with Hardware Accelerators
Patent:
5,754,556 →
Application:
08/683,397 →
Method and Apparatus for the Automatic Generation of Boundary Scan Description Language Files
Patent:
5,682,392 →
Application:
08/699,219 →
Expanding Gripper with Elastically Variable Pitch Screw
Patent:
5,839,769 →
Application:
08/726,069 →
Memory Tester with Data Compression
Patent:
6,360,340 →
Application:
08/752,414 →
Apparatus and Method for Performing Amplitude Calibration in an Electr Onic Circuit Tester
Patent:
5,929,628 →
Application:
08/760,537 →
Fast Undersampling
Patent:
5,768,155 →
Application:
08/760,887 →
Board Test Apparatus and Method for Fast Capacitance Measurement
Patent:
5,844,412 →
Application:
08/769,556 →
Semiconductor Tester for Testing Devices with Embedded Memory
Patent:
5,923,675 →
Application:
08/803,111 →
Manipulator for Automatic Test Equipment Test Head
Patent:
5,931,048 →
Application:
08/808,131 →
Flexible Shielded Laminated Beam for Electrical Contacts and the Like and Method of Contact Operation
Patent:
5,921,786 →
Application:
08/832,303 →
Low Cost, Easy to Use Automatic Test System Software
Patent:
5,910,895 →
Application:
08/874,615 →
Heat-Transfer Enhancing Features for Semiconductor Carriers and Devices
Patent:
6,036,023 →
Application:
08/890,917 →
Low Cost Cmos Tester with High Channel Density
Patent:
6,073,259 →
Application:
08/906,532 →
Tester with Fast Refire Recovery Time
Patent:
5,854,797 →
Application:
08/906,533 →
Semiconductor Chip Tray with Rolling Contact Retention Mechanism
Patent:
5,971,156 →
Application:
08/924,354 →
Low Cost, Highly Parallel Memory Tester
Patent:
5,794,175 →
Application:
08/926,117 →
Test System for Integrated Circuits Using a Single Memory for Both the Parallel and Scan Modes of Testing
Patent:
6,049,901 →
Application:
08/931,164 →
System for Storing and Searching Named Device Parameter Data in a Test System for Testing an Integrated Circuit
Patent:
6,047,293 →
Application:
08/931,784 →
Production Interface for Integrated Circuit Test System
Patent:
5,828,674 →
Application:
08/931,793 →
Method for Capturing Digital Data in an Automatic Test System
Patent:
5,938,780 →
Application:
08/933,391 →
Interface Apparatus for Automatic Test Equipment
Patent:
6,104,202 →
Application:
08/947,680 →
Interface Apparatus for Automatic Test Equipment
Patent:
5,821,764 →
Application:
08/947,682 →
Method for Generating Test Patterns
Patent:
6,052,809 →
Application:
08/951,782 →
Automated Microwave Test System with Improved Accuracy
Patent:
6,249,128 →
Application:
08/955,782 →
System to Simultaneously Test Trays of Integrated Circuit Packages
Patent:
6,097,201 →
Application:
08/962,605 →
Manipulator for Automatic Test Equipment with Active Compliance
Patent:
5,949,002 →
Application:
08/968,316 →
Method of Manufacturing Ball Grid Arrays for Improved Testability
Patent:
5,924,003 →
Application:
08/970,184 →
Timing Generator with Multiple Coherent Synchronized Clocks
Patent:
5,905,967 →
Application:
08/971,625 →
Small Contactor for Test Probes, Chip Packaging and the Like
Patent:
5,973,394 →
Application:
09/012,838 →
Method and Apparatus Fpr Temperature Control of a Semiconductor Electrical-Test Contractor Assembly
Patent:
6,091,062 →
Application:
09/014,214 →
Flexible Test Environment for Automatic Test Equitment
Patent:
6,128,759 →
Application:
09/045,436 →
High Performance Probe Interface for Automatic Test Eqipment
Patent:
6,037,787 →
Application:
09/047,089 →
Compensating for the Effects of Round-Trip Delay in Automatic Test Equipment
Patent:
6,133,725 →
Application:
09/048,727 →
High Speed, Real-Time, State Interconnect for Automatic Test Equipment
Patent:
6,107,818 →
Application:
09/060,987 →
Relayless Voltage Measurement in Automatic Test Equipment
Patent:
6,194,910 →
Application:
09/104,099 →
Measuring and Compensating for Warp in the Inspection of Printed Circuit Board Assemblies
Patent:
6,222,630 →
Application:
09/140,367 →
Analog Clock Module
Patent:
6,188,253 →
Application:
09/167,883 →
Production Interface for an Integrated Circuit Test System
Patent:
5,938,781 →
Application:
09/170,490 →
Integrated Multi-Channel Analog Test Instrument Architecture Providing Flexible Triggering
Patent:
6,363,507 →
Application:
09/174,866 →
High Density Printed Circuit Board
Patent:
6,215,320 →
Application:
09/178,247 →
Remote Test Module for Automatic Test Equipment
Patent:
6,275,962 →
Application:
09/178,257 →
Low Cost Memory Tester with High Throughput
Patent:
6,204,679 →
Application:
09/186,012 →
Adjustable Tooling Pin
Patent:
6,163,160 →
Application:
09/204,977 →
Pattern Generator for a Packet-Based Memory Tester
Patent:
6,389,525 →
Application:
09/227,690 →
Direct-Measurement Provision of Safe Backdrive Levels
Patent:
6,114,848 →
Application:
09/231,001 →
Circuit-Board Tester with Backdrive-Based Burst Timing
Patent:
6,175,230 →
Application:
09/231,049 →
Automatic Test Equipment Using Sigma Delta Modulation to Create Reference Levels
Patent:
6,282,682 →
Application:
09/245,223 →
Low-Cost Configuration for Monitoring and Controlling Parametric Measurement Units in Automatic Test Equipment
Patent:
6,374,379 →
Application:
09/245,519 →
Serial Switch Driver Architecture for Automatic Test Equipment
Patent:
6,137,310 →
Application:
09/253,175 →
Fail Array Memory Control Circuit with Selective Input Disable
Patent:
6,405,333 →
Application:
09/282,224 →
Failure Capture Apparatus and Method for Automatic Test Equipment
Patent:
6,442,724 →
Application:
09/285,857 →
Driver with Transmission Path Loss Compensation
Patent:
6,360,180 →
Application:
09/309,134 →
Power Sensor Module for Microwave Test Systems
Patent:
6,397,160 →
Application:
09/325,834 →
Noise Source Module for Microwave Test Systems
Patent:
6,268,735 →
Application:
09/326,449 →
Semiconductor Parallel Tester
Patent:
6,476,628 →
Application:
09/340,832 →
Extending Synchronous Busses by Arbitrary Lengths Using Native Bus Protocol
Patent:
6,507,920 →
Application:
09/354,137 →
Integrated Test Cell Cooling System
Patent:
6,208,510 →
Application:
09/360,180 →
Low Cost Timing System for Highly Accurate Multi-Modal Semiconductor Testing
Patent:
6,553,529 →
Application:
09/360,215 →
Pre-Conditioner for Measuring High-Speed Time Intervals Over a Low-Bandwidth Path
Patent:
6,550,036 →
Application:
09/409,618 →
Integrated Test Cell
Patent:
6,310,486 →
Application:
09/410,857 →
Low Jitter Phase-Locked Loop with Duty-Cycle Control
Patent:
6,356,129 →
Application:
09/416,578 →
Easy to Program Automatic Test Equipment
Patent:
6,681,351 →
Application:
09/417,034 →
Circuit and Method for Improved Test and Calibration in Automated Test Equipment
Patent:
6,331,783 →
Application:
09/420,497 →
High-Speed Failure Capture Apparatus and Method for Automatic Test Equipment
Patent:
6,536,005 →
Application:
09/426,486 →
Shunt Capacitance Compensation Structure and Method for a Signal Channel
Patent:
6,463,395 →
Application:
09/457,883 →
Dynamic pin driver combining high voltage mode and high speed mode
Patent:
6,292,010 →
Application:
09/496,690 →
Common-Mode Detection Circuit with Cross-Coupled Compensation
Patent:
6,392,448 →
Application:
09/497,775 →
Differential comparator with dispersion reduction circuitry
Patent:
6,300,804 →
Application:
09/501,471 →
Automatic Test Equipment Methods and Apparatus for Interfacing with an External Device
Patent:
6,622,272 →
Application:
09/523,431 →
Detector with common mode comparator for automatic test equipment
Patent:
6,281,699 →
Application:
09/525,557 →
Low Compliance Tester Interface
Patent:
6,734,688 →
Application:
09/571,563 →
Redundancy Analysis Method and Apparatus for Ate
Patent:
6,499,118 →
Application:
09/574,689 →
Method and Apparatus for Testing Integrated Circuit Chips That Output Clocks for Timing
Patent:
6,486,693 →
Application:
09/577,255 →
Ate Timing Measurement Unit and Method
Patent:
6,609,077 →
Application:
09/584,636 →
Semiconductor Handler for Rapid Testing
Patent:
6,717,115 →
Application:
09/585,453 →
Single Carriage Robotic Monorail Material Transfer System
Patent:
6,446,560 →
Application:
09/605,941 →
Testing Frequency Hopping Devices
Patent:
6,564,350 →
Application:
09/608,040 →
Flexible Test Environment for Automatic Test Equipment
Patent:
6,449,744 →
Application:
09/612,745 →
Automatic Test Manipulator with Support Internal to Test Head
Patent:
6,837,125 →
Application:
09/615,292 →
Automatic test equipment with narrow output pulses
Patent:
6,291,981 →
Application:
09/625,827 →
Capturing and Evaluating High Speed Data Streams
Patent:
6,694,462 →
Application:
09/635,334 →
Test System for Smart Card and Identification Devices and the Like
Patent:
6,466,007 →
Application:
09/638,829 →
Noise-Shaped Digital Frequency Synthesis
Patent:
6,396,313 →
Application:
09/645,367 →
High-Speed Peaking Circuit Fro Characteristic Impedance Control
Patent:
6,642,707 →
Application:
09/661,073 →
Modular Semiconductor Tester Interface Assembly for High Performance Coaxial Connections
Patent:
6,515,499 →
Application:
09/676,041 →
Digital to Analog Converter Employing Sigma-Delta Loop and Feedback Dac Model
Patent:
6,404,369 →
Application:
09/676,064 →
Methods and Apparatus for Generating a Test Signal for Xdsl Devices
Patent:
6,798,830 →
Application:
09/677,028 →
Method for Inspecting a Bga Joint
Patent:
7,013,038 →
Application:
09/707,648 →
Dut Power Supply Having Improved Switching Dc-Dc Converter
Patent:
6,542,385 →
Application:
09/718,780 →
High Speed and High Accuracy Dut Power Supply with Active Boost Circuitry
Patent:
6,556,034 →
Application:
09/718,808 →
Calibrating Single Ended Channels for Differential Performance
Low Profile Pneumatically Actuated Docking Module with Power Fault Release
High Current and High Accuracy Linear Amplifier
Curcuit for Improved Test and Calibration in Automated Test Equipment
Apparatus and Method for Managing Automatic Transitions Between Multiple Feedback Paths
Patent:
6,452,436 →
Application:
09/833,985 →
Driver for Integrated Circuit Chip Tester
Dynamic Testing of Electronic Assemblies
Differential Receiver Architecture
Semiconductor Test System Having Double Data Rate Pin Scrambling
Facilitating Comparisons Between Simulated and Actual Behavior of Electronic Devices
Hybrid Conductor-Board for Multi-Conductor Routing
Method and Apparatus for Calibration and Validation of High Performance Dut Power Supplies
Patent:
6,504,395 →
Application:
09/943,275 →
Mechanism for Clamping Device Interface Board to Peripheral
Low Distortion Frequency Tracking Technique
Control Loop Compensation Circuit and Method
Scan Diagnosis System and Method
Modular Ate Power Supply Architecture
Clock Architecture for a Frequency-Based Tester
Compact Ate with Time Stamp System
High Precision, High-Speed Signal Source
Low-Cost Tester Interface Module
Communications Interface for Assembly-Line Monitoring and Control
Methods and Apparatus for Testing Electronic Devices
Technique for Programming Clocks in Automatic Test System
Algorithm for Configuring Clocking System
Driver Circuit Employing High-Speed Tri-State for Automatic Test Equipment
Patent:
6,563,352 →
Application:
10/113,179 →
Wafer-Level Contactor
Interface Adapter for Automatic Test Systems
Circuit for Looping Serial Bit Streams from Parallel Memory
Semiconductor Test System with Easily Changed Interface Unit
Automatic Test Equipment for Design-for-Test (Dft) and Built-in-Self-Test Circuitry
Measuring Skew Between Digitizer Channels Using Fourier Transform
Instrument Initiated Communication for Automatic Test Equipment
Method for Manufacturing Smart Card and Identification Devices and the Like
High Speed Tester with Narrow Output Pulses
Differential Coaxial Contact Array for High-Density, High-Speed Signals
Semiconductor Handler Interface Auto Alignment
Rim Slot Filler Module and Method of Manufacturing the Same
High Power Interface
Circuit Board Cover with Exhaust Apertures for Cooling Electronic Components
Flexible Interface for Universal Bus Test Instrument
High Speed Capture and Averaging of Serial Data by Asynchronous Periodic Sampling
Pin Driver for Ac and Dc Semiconductor Device Testing
Coaxial Cable for Overvoltage Protection
Distributed Failure Analysis Memory for Automatic Test Equipment
Universal Approach for Simulating, Emulating, and Testing a Variety of Serial Bus Types
Pre-Compensation for Digital Bit Streams
Method of Providing Direct Impingement Temperature Control of a Device
Patent:
7,004,235 →
Application:
10/345,846 →
Low-Jitter Delay Cell
Hybrid Cooling System for Automatic Test Equipment
Hybrid Ac/Dc-Coupled Channel for Automatic Test Equipment
Measurement Circuit with Improved Accuracy
Semiconductor Test System Having Multitasking Algorithmic Pattern Generator
Automatic Test System with Easily Modified Software
Clock Distribution System for Automatic Test Equipment
Patent:
6,822,498 →
Application:
10/461,568 →
Direct Jitter Analysis of Binary Sampled Data
Method for Testing Non-Deterministic Device Data
Apparatus and Method for Testing Non-Deterministic Device Data
Flexible Approach for Representing Different Bus Protocols
Parallel Converter Topology for Reducing Non-Linearity Errors
Current Mirror Compensation Using Channel Length Modulation
Current Mirror Compensation Circuit and Method
High Resolution Synthesizer with Improved Signal Purity
Dds Circuit with Arbitrary Frequency Control Clock
Multi-Stage Numeric Counter Oscillator
Telematics-Based Vehicle Data Acquisition Architecture
Silicon-On-Insulator Channel Architecture for Automatic Test Equipment
Patent:
6,853,181 →
Application:
10/749,266 →
Parallel Source/Capture Architecture
Test System with Differential Signal Measurement
Method of Measuring Duty Cycle
Digital Phase Detector
Concentric Spacer for Reducing Capacitive Coupling in Multilayer Substrate Assemblies
Synchronization Between Low Frequency and High Frequency Digital Signals
Comparator Feedback Peak Detector
Precise Time Measurement Apparatus and Method
Heat Exchange Apparatus with Parallel Flow
Automated Test Equipment with Dib Mounted Three Dimensional Tester Electronics Bricks
Apparatus for Planarizing a Probe Card and Method Using Same
Time Measurement Method Using Quadrature Sine Waves
Method and Apparatus for Measuring Jitter
Interface Apparatus for Semiconductor Device Tester
Pin Driver for Ac and Dc Semiconductor Device Testing
Method for Digital Bus Testing
Silicon-On-Insulator Channel Architecture for Automatic Test Equipment
Using Parametric Measurement Units as a Source of Power for a Device Under Test
Method and System for Testing Semiconductor Devices
Method and System for Producing Signals to Test Semiconductor Devices
Pin Electronics with High Voltage Functionality
Over-Voltage Test for Automatic Test Equipment
Method for Testing and Programming Memory Devices and System for Same
Hybrid Ac/Dc-Coupled Channel for Testing
Instrument with Interface for Synchronization in Automatic Test Equipment
Automatic Test System with Synchronized Instruments
Calibrating Automatic Test Equipment Containing Interleaved Analog-to-Digital Converters
Wireless Communication System
Calibrating Automatic Test Equipment to Account for Magnitude and Phase Offsets
Configurable Automatic-Test-Equipment System
Calibrating Automatic Test Equipment
Using a Parametric Measurement Unit for Converter Testing
Patent:
7,023,366 →
Application:
11/137,240 →
Measurement Circuit with Improved Accuracy
Device and Method to Reduce Simultaneous Switching Noise
Jitter Compensation and Generation in Testing Communication Devices
Floating Interface Linkage
Pin Electronics Driver
Ternary Search Process
Delayed Processing of Site-Aware Objects
Efficient Switching Architecture with Reduced Stub Lengths
Site-Aware Objects
Site Loops
Strobe Technique for Test of Digital Signal Timing
Strobe Technique for Recovering a Clock in a Digital Signal
Strobe Technique for Time Stamping a Digital Signal
Tester Interface Module
Data Capture in Automatic Test Equipment
Pin Electronics Driver
Low-Spur Low-Distortion Digital-to-Analog Converter
Patent:
7,126,519 →
Application:
11/241,572 →
Apparatus and Method for Testing Non-Deterministic Device Data
Dual Sine-Wave Time Stamp Method and Apparatus
Modularized Device Interface with Grounding Insert Between Two Strips
Automatic Testing Equipment Instrument Card and Probe Cabling System and Apparatus
Method and Apparatus for Adjustment of Synchronous Clock Signals
Compensating for Loss in a Transmission Path
Impedance Controlled via Structure
Jitter Measurement Algorithm Using Locally in-Order Strobes
Determining Frequency Components of Jitter
Obtaining Test Data for a Device
Analog-To-Digital Converter with Non-Linearity Compensation
Method and Apparatus for 0/180 Degree Phase Detector
Enhanced Loopback Testing of Serial Devices
Digitizer with Enhanced Accuracy
Method and System for Monitoring Test Signals for Semiconductor Devices
Alignment Receptacle of a Sensor Adapted to Interact with a Pin to Generate Position Data Along at Least Two Transverse Axes for Docking a Test Head
Multi-Stream Interface for Parallel Test Processing
Phase Locking on Aliased Frequencies
High Performance Signal Generation
System for Testing Smart Cards and Method for Same
Connector-To-Pad Printed Circuit Board Translator and Method of Fabrication
Calibrating a Testing Device
Compliant Electro-Mechanical Device
Method for Using Probe Card
Sine Wave Generator with Dual Port Look-Up Table
Liquid Immersion Cooled Multichip Module
Patent:
7,285,851 →
Application:
11/540,391 →
Signal Analysis Using Dual Converters and Cross Spectrum
Low Cost, High Purity Sign Wave Generator
Networked Test System
Comparator Feedback Peak Detector
Quantized Data-Dependent Jitter Injection Using Discrete Samples
Conductive Shielding Device
Error Reduction for Parallel, Time-Interleaved Analog-to-Digital Converter
V/I Source and Test System Incorporating the Same
Rotational Positioner and Methods for Semiconductor Wafer Test Systems
Distributing Data Among Test Boards to Determine Test Parameters
High-Speed Digital Multiplexer
Design-For-Test Micro Probe
Electrically Stimulated Fingerprint Sensor Test Method
Calibrating a Tester Using Esd Protection Circuitry
Direct Facility Water Test Head Cooling Architecture
Tester Input/Output Sharing
Adaptive Background Propagation Method and Device Therefor
Cost Effective Low Noise Single Loop Synthesizer
Calibrating Jitter
Calibration Device
Integrated High-Efficiency Microwave Sourcing Control Process
Emulating Behavior of a Legacy Test System
Laser Targeting Mechanism
Automated Test Equipment Interface
Method and Apparatus for Cooling Non-Native Instrument in Automatic Test Equipment
Testing of Analog to Digital Converters
Calibrating Automatic Test Equipment
Manipulator Constant Force Spring Counterbalance
Disk Drive Testing
Disk Drive Transport, Clamping and Testing
Residual Fourier-Padding Interpolation for Instrumentation and Measurement
Shielded Cable Interface Module and Method of Fabrication
Interpolation Digital-to-Analog Converter
Identifying Periodic Jitter in a Signal
Efficient, Selective Error Reduction for Parallel, Time-Interleaved Analog-to-Digital Converter
Instrument with Interface for Synchronization in Automatic Test Equipment
Adjustable Test Pattern Results Latency
Jitter Frequency Determining System
Determining Frequency Components of Jitter
Time Measurement of Periodic Signals
Test System with High Frequency Interposer
Automated Test Equipment with Dib Mounted Three Dimensional Tester Electronics Bricks
Transferring Disk Drives Within Disk Drive Testing Systems
Disk Drive Emulator and Method of Use Thereof
Bulk Feeding Disk Drives to Disk Drive Testing Systems
Enclosed Operating Area for Disk Drive Testing Systems
Temperature Control Within Disk Drive Testing Systems
Vibration Isolation Within Disk Drive Testing Systems
Thermal Control System for Test Slot of Test Rack for Disk Drive Testing System with Thermoelectric Device and a Cooling Conduit
Fast, Low Power Formatter for Automatic Test System
Current Meter with Reduced Range Switching and Load Transients
Patent:
7,538,539 →
Application:
12/117,034 →
Tracker Circuit and Method for Automated Test Equipment Systems
X-Ray Inspection of Solder Reflow in High-Density Printed Circuit Board Applications
Method of and System for Obtaining Linear Data for Object Scanned Using Non-Collimated, Poly-Energetic X-Rays
Method of and System for Calibration of Inspection Systems Producing X-Ray Images
System and Method for Mounting Shielded Cables to Printed Circuit Board Assemblies
Disk Drive Emulator and Method of Use Thereof
Method and Apparatus for Computing Interpolation Factors in Sample Rate Conversion Systems
Coaxial Cable to Printed Circuit Board Interface Module
Timing Signal Generator Providing Synchronized Timing Signals at Non-Integer Clock Multiples Adjustable by More Than One Period
Apparatus and Method for Controlling Memory Overrun
Pin Electronics Liquid Cooled Multi-Module for High Performance, Low Cost Automated Test Equipment
General Purpose Protocol Engine
Transferring Storage Devices Within Storage Device Testing Systems
Processing Storage Devices
Test Slot Cooling System for a Storage Device Testing System
Heating Storage Devices in a Testing System
Storage Device Temperature Sensing
Methods and Apparatus for Connecting Printed Circuit Boards Using Zero-Insertion Wiping Force Connectors
Device Interface Board with Cavity Back for Very High Frequency Applications
Using Pattern Generators to Control Flow of Data to and from a Semiconductor Device Under Test
Capacitive Opens Testing in Low Signal Environments
Low Capacitance Probe for Testing Circuit Assembly
Storage Device Testing System Cooling
Test Slot Carriers
Test Access Component for Automatic Testing of Circuit Assemblies
Automated Test Equipment Employing Test Signal Transmission Channel with Embedded Series Isolation Resistors
Bulk Feeding Disk Drives to Disk Drive Testing Systems
Transferring Disk Drives Within Disk Drive Testing Systems
Dependent Temperature Control Within Disk Drive Testing Systems
Processing Storage Devices
Test Slot Cooling System for a Storage Device Testing System
Patent:
7,778,031 →
Application:
12/727,700 →
Method for Testing in a Reconfigurable Tester
Protocol Aware Digital Channel Apparatus
Individually Heating Storage Devices in a Testing System
Storage Device Temperature Sensing
Disk Drive Transport, Clamping and Testing
Disk Drive Transport, Clamping and Testing
Vibration Isolation Within Disk Drive Testing Systems
Connecting Digital Storage Oscilloscopes
Multi-Level Triggering Circuit
Driving an Electronic Instrument
Attenuator Circuit
Storage Device Testing System Cooling
Patent:
7,929,303 →
Application:
12/775,560 →
Storage Device Testing System Cooling
Damping Vibrations Within Storage Device Testing Systems
High Speed, High Density Electrical Connector
A Storage Device Testing System with a Conductive Heating Assembly
Storage Device Temperature Sensing
Bulk Transfer of Storage Devices Using Manual Loading
Temperature Control Within Disk Drive Testing Systems
Engaging Test Slots
High Throughput Semiconductor Device Testing
Electro-Optical Communications Link
Laser Targeting Mechanism
Enclosed Operating Area for Storage Device Testing Systems
Temperature Control Within Storage Device Testing Systems
Transferring Storage Devices Within Storage Device Testing Systems
Identifying Fuel Cell Defects
Test Slot Cooling System for a Storage Device Testing System
Compensating for Harmonic Distortion in an Instrument Channel
Probe-Card Interposer Constructed Using Hexagonal Modules
System for Concurrent Test of Semiconductor Devices
Liquid Cooling During Testing
Method and Apparatus for Testing Electrical Connections on a Printed Circuit Board
Fast Open Circuit Detection for Open Power and Ground Pins
Test Equipment Calibration
Ate to Detect Signal Characteristics of a Dut
Test System Supporting Simplified Configuration for Controlling Test Block Concurrency
Test Instrument Having a Configurable Interface
Programmable Test Instrument
Programmable Test Instrument
Determining Propagation Delay
Fast Single-Ended to Differential Converter
High Reliability, High Voltage Switch
Edge Triggered Calibration
General Purpose Protocol Engine
Managing Interrupts
Implementing Remote Procedure Calls
Bulk Transfer of Storage Devices Using Manual Loading
Controlling the Temperature of an Object
Debugging in a Semiconductor Device Test Environment
Interface for a Test System
Test System Having Liquid Containment Chambers Over Connectors
Embedded Tester
Rotatable Camera Module Testing System
Matrix Testing Targets
Smooth Vi Mode Crossover Method at Compliance Limit Threshold
Method and Apparatus for Device Testing Using Multiple Processing Paths
Method and Apparatus for Low Latency Communication in an Automatic Testing System
Electronic Assembly Test System
Calibration Device
Synchronizing Data from Different Clock Domains by Bridges One of the Clock Signals to Appear to Run an Integer of Cycles More Than the Other Clock Signal
Executing Code on a Test Instrument in Response to an Event
Automated Test System with Event Detection Capability
Automated Test System with Edge Steering
Interconnect for Transmitting Signals Between a Device and a Tester
Equi-Resistant Probe Distribution for High-Accuracy Voltage Measurements at the Wafer Level
Current Regulation for Accurate and Low-Cost Voltage Measurements at the Wafer Level
Circuitry to Protect a Test Instrument
Structure for Transmitting Signals in an Application Space Between a Device Under Test and Test Electronics
Edge Generator-Based Phase Locked Loop Reference Clock Generator for Automated Test System
Controlling Signal Path Inductance in Automatic Test Equipment
Coaxial Structure for Transmission of Signals in Test Equipment
Probe Alignment Connection Device
Capacitive Opens Testing of Low Profile Components
One-Shot Circuit
Multi-Stage Equalization
Thermal Control
Controlling a Per-Pin Measurement Unit
Braking System
High Speed Data Transfer Using Calibrated, Single-Clock Source Synchronous Serializer-Deserializer Protocol
Virtual Distance Test Techniques for Radar Applications
Bus Interface System for Interfacing to Different Buses
Mem Relay Assembly for Calibrating Automated Test Equipment
Deskew of Rising and Falling Signal Edges
Patent:
9,503,065 →
Application:
14/840,498 →
Grasping Gripper
Manipulator in Automatic Test Equipment
Front End Module for Automatic Test Equipment
Calibration Device for Automatic Test Equipment
Determining Electrical Path Length
Pocketed Circuit Board
Automatic Test System with Focused Test Hardware
Time-Aligning a Signal
Thermal Control Using Phase-Change Material
Combining Current Sourced by Channels of Automatic Test Equipment
Test Fixture
Protection Circuit
Test Communication Protocol
Patent:
10,079,762 →
Application:
15/495,357 →
Optical Pin Electronics
Parametric Information Control
Switch Matrix System
Dc-Coupled Switching in an Ac-Coupled Environment
Time-Aligning Communication Channels
Adjusting Signal Timing
Automated Test Sytem Having Multiple Stages
Automated Test System Employing Robotics
Identifying Potentially-Defective Picture Elements in an Active-Matrix Display Panel
System for Testing Devices Inside of Carriers
Bus Synchronization System That Aggregates Status
Tool for Disconnecting a Connector
Test System Having Distributed Resources
System and Method for Real-Time Robotic Control
System and Method for Natural Tasking of One or More Robots
Method and Test System for Providing Accurate Analog Signals
System for Testing Devices Inside of Carriers
System and Method for Multi-Goal Path Planning
Robotic Coating Application System and Method
Method and Apparatus for Bond Wire Testing in an Integrated Circuit
Generating Timestamps on a Packet-Oriented Bus
Patent:
10,387,356 →
Application:
16/149,586 →
System and Method for Weld Path Generation
Automated Test Equipment with Relay Hot-Switch Detection
Method for Optimization of Robotic Transportation Systems
System and Method for Robotic Bin Picking
Gripper For Automation
Application:
62/056,092 →
Related Assignments
(2)
Other recorded transfers of the patents in this record — the chain of ownership.
Patent Security Agreement
Apr 27, 2015
From: TERADYNE, INC.; LITEPOINT CORPORATION
To: BARCLAYS BANK PLC
Reel/Frame 035507/0116 →
Release of Security Interest in Intellectual Property
Jun 28, 2019
From: BARCLAYS BANK PLC, AS COLLATERAL AGENT
To: TERADYNE, INC.; EAGLE TEST SYSTEMS, INC.; LITEPOINT CORPORATION; NEXTEST SYSTEMS CORPORATION
Reel/Frame 049632/0940 →