One-shot circuit
An example one-shot circuit includes: circuitry including a set-reset (SR) latch to produce an output pulse of controlled duration in response to an input signal rising edge, where the SR latch includes a first circuit input and a second circuit input; a circuit path to provide a signal to the first circuit input; and a delay element connected to the circuit path and to the second circuit input.
1. A one-shot circuit comprising:
circuitry to produce output pulses, the circuitry comprising a first input to receive a first signal and a second input to receive a second signal, the circuitry being responsive to every rising edge of the first signal and the second signal to produce the output pulses so that the output pulses each have a same duration, where the circuitry comprises a multiplexer and a set-reset (SR) latch;
a circuit path to provide the first signal to the first input; and
a delay element connected to the circuit path to provide the second signal to the second input, the first signal and the second signal having a same logical state for at least part of a time period to produce the output pulses;
wherein the multiplexer comprises a third input, a fourth input, a select input, and a circuit output to provide the output pulses, wherein a value of the select input determines whether the circuit output is a signal at the third input or the fourth input; and
wherein the SR latch comprises the first input, the second, and an intermediate output, wherein the first input and the third input are configured to receive the first signal, the second input is configured to receive the second signal, the fourth input is configured to receive an inverted version of the second signal, and the intermediate output is connected to the select input.
2. The one-shot circuit of claim 1 , wherein the first input is a set (S) input, the second input is a reset (R) input, and the one-shot circuit is configured to produce a positive output pulse.
3. The one-shot circuit of claim 1 , wherein the first input is a reset (R) input, the second input is a set (S) input, and the one-shot circuit is configured to produce a negative output pulse.
4. The one-shot circuit of claim 1 , wherein the delay element is adjustable to produce an adjustable delay.
5. The one-shot circuit of claim 1 , wherein the delay element comprises one or more non-inverting delay buffers in series.
6. The one-shot circuit of claim 1 , wherein the delay element comprises an even number of inverters in series.
7. The one-shot circuit of claim 1 wherein the delay element comprises a series combination of one or more non-inverting delay buffers and an even number of inverters.
8. The one-shot circuit of claim 1 , wherein the first input is a set (S) input Sn, the second input is a reset (R) input Rn, and the one-shot circuit is configured to produce a positive output pulse (Q) Qn, Qn being an output of the SR latch, Qn−1 being a last state of Qn, and Qb,n−1 being an inverse of the last state of Qn; and
wherein the SR latch operates according to the following truth table:
Sn
Rn
Qn
1
0
1
0
1
0
0
0
Qn−1
1
1
Qb, n−1.
9. The one-shot circuit of claim 8 , wherein the first input is a set (S) SR latch input and the second input is a reset (R) SR latch input.
10. The one-shot circuit of claim 1 , wherein the intermediate output is Yn, Yn−1 being a last state of Yn; and
wherein the latch providing the intermediate output operates according to the following truth table:
Sn
Rn
Yn
1
0
1
0
1
0
0
0
Yn−1
1
1
Yn−1.
11. A one-shot circuit comprising:
circuitry comprising a set-reset (SR) latch to produce output pulses, the SR latch comprising a first circuit input to receive a first signal and a second circuit input to receive a second signal, the SR latch being responsive to every rising edge of the first signal and the second signal to produce the output pulses so that the output pulses have the same duration;
a circuit path to provide the first signal to the first circuit input; and
a delay element connected to the circuit path to provide the second signal to the second circuit input, the first signal and the second signal having a same logical state for at least part of a time period to produce the output pulses;
wherein the circuitry comprises:
a first latch comprising a first input, a second input, and a first output;
a second latch comprising a third input, a fourth input; and second output, the fourth input being an inverted input; and
a third latch comprising a fifth input, a sixth input, a seventh input, an eighth input, and a third output;
wherein the first input, the third input, and the sixth input are connected together to receive the first signal;
wherein the second input, the fourth input, and the seventh input are connected together to receive the second signal;
wherein the first output is connected to the fifth input; and
wherein the second output is connected to the eighth input.
12. The one-shot circuit of claim 11 , wherein the first signal is Sn, an immediately prior version of the first signal is Sn−1, the second signal is Rn, an immediately prior version of the second signal is Rn−1, the third output is Qn, and an immediately prior version of the third output is Qn−1; and
wherein the SR latch operates according to the following truth table:
Sn−1
Rn−1
Sn
Rn
Qn
0
0
1
0
1
0
0
0
1
0
0
1
1
1
1
1
0
1
1
0
1
1
1
0
Qn−1
1
1
0
1
Qn−1
0
1
0
0
Qn−1
1
0
0
0
Qn−1.
13. Automatic test equipment (ATE) comprising:
a pattern generator for generating a test pattern to send to a device under test (DUT);
a timing generator to receive the test pattern and to generate timing for a signal to send to the DUT based on the test pattern; and
pin electronics to receive the signal and to send the signal to the DUT;
wherein the timing generator comprises a one-shot circuit, the one-shot circuit to produce output pulses each having a same duration, the one-shot circuit comprising:
circuitry to produce the output pulses, the circuitry comprising a first input to receive a first signal and a second input to receive a second signal, the circuitry being responsive to every rising edge of the first signal and the second signal to produce the output pulses so that the output pulses each have the same duration, where the circuitry comprises a multiplexer and a set-reset (SR) latch;
a circuit path to provide the first signal to the first input; and
a delay element connected to the circuit path to provide the second signal to the second input, the first signal and the second signal having a same logical state for at least part of a time period to produce the output pulses;
wherein the multiplexer comprises a third input, a fourth input, a select input, and a circuit output to provide the output pulses, wherein a value of the select input determines whether the circuit output is a signal at the third input or the fourth input; and
wherein the SR latch comprises the first input, the second, and an intermediate output, wherein the first input and the third input are configured to receive the first signal, the second input is configured to receive the second signal, the fourth input is configured to receive an inverted version of the second signal, and the intermediate output is connected to the select input.
14. The ATE of claim 13 , wherein the delay element is adjustable to produce an adjustable delay.
15. Automatic test equipment (ATE) comprising:
a pattern generator for generating a test pattern to send to a device under test (DUT);
a timing generator to receive the test pattern and to generate timing for a signal to send to the DUT based on the test pattern; and
pin electronics to receive the signal and to send the signal to the DUT;
wherein the timing generator comprises a one-shot circuit, the one-shot circuit to produce output pulses duration, the one-shot circuit comprising:
circuitry comprising a set-reset (SR) latch, the circuitry comprising a first circuit input to receive a first signal and a second circuit input to receive a second signal, the SR latch being responsive to every rising edge of the first signal and the second signal to produce the output pulses so that the output pulses have the same duration, where the circuitry comprises a multiplexer that is controlled based on the first signal and the second signal to output the pulses;
a circuit path to provide the first signal to the first circuit input; and
a delay element connected to the circuit path to provide the second signal to the second circuit input, the first signal and the second signal having a same logical state for at least part of a time period to produce the output pulses;
wherein the multiplexer comprises a first input, a second input, a select input, and a circuit output, wherein a value of the select input determines whether the circuit output is the first input or the second input;
wherein the SR latch comprises a latch comprising a third input, a fourth input, and an intermediate output, wherein the first input and the third input are configured to receive the first signal, the second input is configured to receive the second signal, the fourth input is configured to receive an inverted version of the second signal, and the intermediate output is connected to the select input; and
wherein the third input is the first circuit input and the fourth input is the second circuit input.
16. Automatic test equipment (ATE) comprising:
a pattern generator for generating a test pattern to send to a device under test (DUT);
a timing generator to receive the test pattern and to generate timing for a signal to send to the DUT based on the test pattern; and
pin electronics to receive the signal and to send the signal to the DUT;
wherein the timing generator comprises a one-shot circuit, the one-shot circuit to produce output pulses duration, the one-shot circuit comprising:
circuitry comprising a set-reset (SR) latch, the circuitry comprising a first circuit input to receive a first signal and a second circuit input to receive a second signal, the SR latch being responsive to every rising edge of the first signal and the second signal to produce the output pulses so that the output pulses have the same duration;
a circuit path to provide the first signal to the first circuit input; and
a delay element connected to the circuit path to provide the second signal to the second circuit input, the first signal and the second signal having a same logical state for at least part of a time period to produce the output pulses;
wherein the SR latch comprises:
a first latch comprising a first input, a second input, and a first output;
a second latch comprising a third input, a fourth input; and second output, the fourth input being an inverted input; and
a third latch comprising a fifth input, a sixth input, a seventh input, an eighth input, and a third output;
wherein the first input, third input, and the sixth input are connected together to receive the first signal;
wherein the second input, the fourth input, and the seventh input are connected together to receive the second signal;
wherein the first output is connected to the fifth input; and
wherein the second output is connected to the eighth input.