Emulating behavior of a legacy test system

1. An apparatus for use in testing a device, the apparatus comprising:

a communication channel having a set of programmable parameters associated therewith, the programmable parameters resulting in a bias condition on the communication channel, the communication channel being an inactive communication channel when signals are not actively driven on the communication channel; and

a bias control circuit to adjust the bias condition that results from the programmable parameters in order to emulate a desired bias condition, the desired bias condition corresponding to a bias condition of another inactive communication channel on a different apparatus for using in testing the device.

2. The apparatus of claim 1 , further comprising:

a detector to detect signals on the communication channel; and

an active load to subject the communication channel to a loading condition;

wherein the programmable parameters comprise a parameter associated with at least one of the detector and with the active load.

3. The apparatus of claim 2 , wherein the programmable parameters comprise at least one of a threshold voltage associated with the detector and a voltage associated with the active load.

4. The apparatus of claim 2 , wherein the programmable parameters comprise a bias control current on the communication channel.

5. The apparatus of claim 1 , wherein the different apparatus is for executing a test program that depends on the bias conditions.

6. The apparatus of claim 1 , wherein the bias control circuit comprises

a current source that is controllable to provide first bias current on the communication channel, the first bias current combining with a second current on the communication channel that is present when the communication channel is inactive.

7. The apparatus of claim 6 , wherein a combination of the first and second bias currents corresponds to a bias current that would be produced by test equipment if the test equipment were electrically connected to the communication channel.

8. The apparatus of claim 1 , further comprising:

a detector to detect test signals on the communication channel;

a processing device to execute a test program using the test signals;

wherein the test program is configured to expect a voltage from the communication channel when the communication channel is inactive; and

wherein the bias control circuit is configured to affect the voltage.

9. The apparatus of claim 1 , wherein the bias control circuit comprises:

a circuit element electrically connected between a voltage source and the communication channel, the circuit element to pass current relative to the voltage source and the communication channel to produce the bias condition.

10. The apparatus of claim 1 , wherein bias control circuit comprises a parametric measurement unit (PMU).

11. Automatic test equipment (ATE) for testing a device, the ATE comprising:

communication channels between the ATE and the device;

a processing device to execute a test program to test the device on active communication channels, the test program being configured to expect a first bias condition on an inactive communication channel, the active communication channels having signals actively driven thereon and the inactive communication channel not having signals actively driven thereon; and

a bias controller to produce a second bias condition on the inactive communication channel in order to emulate the first bias condition, the second bias condition on the inactive communication channel being a result of programmable parameters associated with the inactive communication channel.

12. The ATE of claim 11 , further comprising:

a detector to detect signals on a communication channel;

wherein the programmable parameters comprise parameters associated with the detector.

13. The ATE of claim 12 , further comprising:

an active load to subject the communication channel to a loading condition;

wherein the programmable parameters comprise parameters associated with the active load.

14. The ATE of claim 13 , wherein the programmable parameters comprise threshold voltages associated with a detector.

15. The ATE of claim 12 , wherein the programmable parameters correspond to a bias control current on the communication channel.

16. The ATE of claim 11 , wherein the bias controller comprises:

a programmable current generator to generate a bias current for output to an inactive communication channel, the bias current combining with an existing current on the inactive communication channel to affect the second bias condition.

17. The ATE of claim 11 , wherein the bias controller comprises:

a circuit element for use in generating the second bias condition using current on the inactive communication channel.

18. The ATE of claim 11 , wherein the bias controller comprises:

a programmable current generator to generate a bias current for output to the inactive communication channel, the bias current combining with an existing current on the inactive communication channel; and

a circuit element for use in adjusting the second bias condition using the bias current and the existing current.

19. The ATE of claim 18 , wherein the circuit element has a resistance, wherein a combination of the existing current and the bias current passes through the resistance to produce a first voltage, the second bias condition being based on the first voltage.

20. The ATE of claim 19 , further comprising:

a voltage source for providing a second voltage, wherein the second bias condition is based on the first voltage and the second voltage.

21. The ATE of claim 11 , wherein the bias controller comprises a parametric measurement unit (PMU).