Laser targeting mechanism
View Patent ↗An automated test equipment system includes a peripheral including first mechanical alignment features; a test head including second mechanical alignment features arranged in a pattern corresponding to the first mechanical alignment features and configured to engage the first mechanical alignment features. The automated test equipment system also includes a laser assisted alignment system including laser devices mounted to the peripheral and operable to emit laser beams; target plates mounted to the test head and including target symbols visible on surfaces of the target plates. The target symbols are arranged in a pattern corresponding to the laser devices such that, when laser beams from the laser devices are substantially aligned with the target symbols, the first mechanical alignment features are substantially aligned with the second mechanical alignment features.
1. An automated test equipment system comprising:
a peripheral comprising first mechanical alignment features;
a test head comprising second mechanical alignment features arranged in a pattern corresponding to the first mechanical alignment features and configured to engage the first mechanical alignment features; and
a laser assisted alignment system comprising:
laser devices mounted to the peripheral and operable to emit laser beams;
target plates mounted to the test head and comprising target symbols visible on surfaces of the target plates, wherein the target symbols are arranged in a pattern corresponding to the laser devices such that, when laser beams from the laser devices are substantially aligned with the target symbols, the first mechanical alignment features are substantially aligned with the second mechanical alignment features,
wherein the test head comprises a first surface and a device interface board assembly (DIB) assembly mounted to the first surface, wherein the second mechanical alignment features are mounted to the DIB assembly, and
wherein the target plates are mounted to the first surface of the test head in positions spaced apart from the device interface board assembly.
2. The automated test equipment system of claim 1 , wherein the peripheral comprises:
a first surface; and
a docking plate mounted to the first surface, wherein the first mechanical alignment features are mounted to the docking plate.
3. The automated test equipment system of claim 2 , wherein the laser devices are mounted to the docking plate.
4. The automated test equipment system of claim 1 , wherein the target plates comprise spirit levels.
5. The automated test equipment system of claim 1 , wherein the laser alignment system provides for alignment of first mechanical alignment features with the second mechanical alignment features in five degrees-of-freedom.
6. The automated test equipment system of claim 1 , wherein the first mechanical alignment features comprise alignment pins, and wherein the second mechanical alignment features comprise bushings configured to engage the alignment pins.
7. The automated test equipment system of claim 1 , wherein the peripheral is selected from the group consisting of a handler and a prober.
8. An automated test equipment system comprising:
a peripheral comprising first mechanical alignment features;
a test head comprising second mechanical alignment features arranged in a pattern corresponding to the first mechanical alignment features and configured to engage the first mechanical alignment features; and
a laser assisted alignment system comprising:
laser devices mounted to the peripheral and operable to emit laser beams;
target plates mounted to the test head and comprising target symbols visible on surfaces of the target plates, wherein the target symbols are arranged in a pattern corresponding to the laser devices such that, when laser beams from the laser devices are substantially aligned with the target symbols, the first mechanical alignment features are substantially aligned with the second mechanical alignment features,
wherein the test head comprises:
first mechanical interlock features; and
wherein the peripheral comprises:
second mechanical interlock features configured to couple with the first mechanical interlock features when the test head is connected to the peripheral in a docked position,
a docked position sensor operable to detect the test head in the docked position, and
control electronics electrically connected to the docked position sensor and the laser devices and configured to inhibit operation of laser devices upon receiving signals from the docked position sensor indicating that test head is in the docked position.
9. The automated test equipment system of claim 8 , wherein the first mechanical interlock features comprise cam followers, and wherein the second mechanical interlock features comprise cam surfaces configured to interface with the cam followers.
10. The automated test equipment system of claim 9 , wherein test head comprises a first surface; and a device interface board (DIB) assembly mounted to the first surface, and wherein the first mechanical interlock features are mounted to the DIB assembly.
11. The automated test equipment system of claim 10 , wherein the peripheral comprises a first surface and a docking plate mounted to the first surface, and wherein the second mechanical interlock features are mounted to the docking plate.
12. The automated test equipment system of claim 8 , wherein the peripheral comprises:
a first surface; and
a docking plate mounted to the first surface, wherein the first mechanical alignment features are mounted to the docking plate.
13. The automated test equipment system of claim 12 , wherein the laser devices are mounted to the docking plate.
14. The automated test equipment system of claim 8 , wherein the target plates comprise spirit levels.
15. The automated test equipment system of claim 8 , wherein the laser alignment system provides for alignment of first mechanical alignment features with the second mechanical alignment features in five degrees-of-freedom.
16. The automated test equipment system of claim 8 , wherein the first mechanical alignment features comprise alignment pins, and wherein the second mechanical alignment features comprise bushings configured to engage the alignment pins.
17. The automated test equipment system of claim 8 , wherein the peripheral is selected from the group consisting of a handler and a prober.
18. The automated test equipment system of claim 1 , wherein the test head further comprises:
first mechanical interlock features; and
wherein the peripheral comprises:
second mechanical interlock features configured to couple with the first mechanical interlock features when the test head is connected to the peripheral in a docked position,
a docked position sensor operable to detect the test head in the docked position, and
control electronics electrically connected to the docked position sensor and the laser devices and configured to inhibit operation of laser devices upon receiving signals from the docked position sensor indicating that test head is in the docked position.
19. The automated test equipment system of claim 18 , wherein the first mechanical interlock features comprise cam followers, and wherein the second mechanical interlock features comprise cam surfaces configured to interface with the cam followers.
20. The automated test equipment system of claim 19 , wherein test head comprises a first surface; and a device interface board (DIB) assembly mounted to the first surface, and wherein the first mechanical interlock features are mounted to the DIB assembly.
21. The automated test equipment system of claim 20 , wherein the peripheral comprises a first surface and a docking plate mounted to the first surface, and wherein the second mechanical interlock features are mounted to the docking plate.
22. An automated test equipment system comprising
a peripheral comprising first mechanical alignment features;
a test head comprising second mechanical alignment features arranged in a pattern corresponding to the first mechanical alignment features and configured to engage the first mechanical alignment features; and
a laser assisted alignment system comprising:
laser devices mounted to the peripheral and operable to emit laser beams;
target plates mounted to the test head and comprising target symbols visible on surfaces of the target plates, wherein the target symbols are arranged in a pattern corresponding to the laser devices such that, when laser beams from the laser devices are substantially aligned with the target symbols, the first mechanical alignment features are substantially aligned with the second mechanical alignment features,
wherein the test head comprises a first surface and a device interface board assembly (DIB) assembly mounted to the first surface, and
wherein the target plates are mounted to the first surface of the test head in positions spaced apart from the device interface board assembly.