Controlling a per-pin measurement unit

1. Automatic test equipment (ATE) comprising:

digital circuitry to output digital test signals on a test channel to a device under test (DUT) and to receive digital response signals from the DUT;

a per-pin measurement unit (PPMU) to output analog test signals on the test channel to the DUT and to receive analog response signals from the DUT, the PPMU and the digital circuitry being separately connected to the test channel;

logic configured to execute a state machine to control the PPMU;

memory that is part of, or separate from, the logic; and

a control system to output a command to the state machine to pass to the state machine control over obtaining data from, and outputting data to, the DUT;

wherein the state machine is configured to obtain first data that is based on the analog response signals and to store the first data in the memory; and

wherein the digital circuitry is configured to output control data, the control data being received by the logic and being usable to control the state machine to obtain the first data in synchronism with output of the digital test signals to the DUT.

2. The ATE of claim 1 , wherein the ATE is configured to test the DUT, the DUT having multiple pins; and

wherein the first data is based on values at a single pin of the DUT.

3. The ATE of claim 1 , wherein the ATE is configured to test the DUT, the DUT having multiple pins; and

wherein the first data is based on values at multiple pins of the DUT.

4. The ATE of claim 1 , further comprising:

an analog-to-digital converter (ADC) between the logic and the PPMU, the ADC for servicing one or multiple PPMUs including the PPMU;

wherein the state machine is configured to obtain the first data by retrieving the first data from the ADC.

5. The ATE of claim 1 , wherein the ATE is configured to test the DUT, the DUT having multiple pins;

wherein the first data is based on values at a single pin of the DUT;

wherein the logic is configured to provide the first data to the control system; and

wherein the control system is configured to reconstruct a waveform based on the first data.

6. The ATE of claim 1 , wherein the ATE is configured to test the DUT, the DUT having multiple pins;

wherein the first data is based on values at a single pin of the DUT; and

wherein the first data is usable to perform one or more operations comprising measuring signal noise or extracting signal peak amplitude.

7. The ATE of claim 1 , wherein the ATE is configured to control when the state machine obtains the first data or outputs second data to the PPMU from the memory.

8. The ATE of claim 7 , wherein the ATE is configured to control the state machine to obtain the first data at a time that is based on the control data.

9. The ATE of claim 1 , further comprising:

a processing device that is responsive to the control system to control operation of the logic.

10. The ATE of claim 9 , wherein the logic comprises a field programmable gate array (FPGA);

wherein the ATE comprises multiple FPGAs, each of the multiple FPGAs being configured to execute a state machine to control one or more PPMUs; and

wherein the processing device is configured to control the multiple FPGAs.

11. The ATE of claim 1 , wherein the PPMU comprises a digital-to-analog converter; and

wherein the analog test signals comprise an AC waveform that is based on second data stored in memory.

12. The ATE of claim 1 , wherein the PPMU is configurable to measure or to source a current waveform, or to measure or source a voltage waveform.

13. A method of operating automatic test equipment (ATE), the method comprising:

outputting digital test signals and control data from digital circuitry in the ATE, the digital test signals being output on a test channel to a device under test (DUT);

outputting a command to a state machine executed by logic in the ATE, the command to pass control to the state machine over obtaining data from and outputting data to the DUT;

receiving the control data at the logic; and

in synchronism with output of the digital test signals to the DUT and based on the control data, executing the state machine to: (i) obtain first data that is based on analog response signals received from the DUT by a per-pin measurement unit (PPMU) in response to analog test signals sent to the DUT by the PPMU on the test channel, the PPMU and the digital circuitry being separately connected to the test channel, and (ii) store the first data in memory that is part of, or separate from, the logic.

14. One or more non-transitory machine-readable storage media storing instructions that are executable during operation of automatic test equipment (ATE) to control operations comprising:

outputting digital test signals and control data from digital circuitry in the ATE, the digital test signals being output on a test channel to a device under test (DUT);

outputting a command to a state machine executed in the ATE, the command to pass control to the state machine over obtaining data from and outputting data to the DUT; and

in synchronism with output of the digital test signals to the DUT and based on the control data, executing the state machine to: (i) obtain first data that is based on analog response signals received from the DUT by a per-pin measurement unit (PPMU) in response to analog test signals sent to the DUT by the PPMU on the test channel, the PPMU and the digital circuitry being separately connected to the test channel, and (ii) store the first data in memory.

15. The one or more non-transitory machine-readable storage media of claim 14 , wherein the ATE is configured to test the DUT, the DUT having multiple pins; and

wherein the first data is based on values at a single pin of the DUT.

16. The one or more non-transitory machine-readable storage media of claim 14 , wherein the ATE is configured to test the DUT, the DUT having multiple pins; and

wherein the first data is based on values at multiple pins of the DUT.

17. The one or more non-transitory machine-readable storage media of claim 14 , wherein the ATE is configured to test the DUT, the DUT having multiple pins;

wherein the first data is based on values at a single pin of the DUT; and

wherein the first data is usable to perform one or more operations comprising measuring signal noise or extracting signal peak amplitude.