Pin driver for AC and DC semiconductor device testing
View Patent ↗A pin electronics circuit for use in automatic test equipment is disclosed. The pin electronics circuit includes a pin driver having an output adapted for coupling to a device-under-test pin, and a first input. AC input circuitry couples to a pattern generator to receive pattern test signals while DC input circuitry connects to a DC parametric controller. Selector circuitry selectively couples the AC and DC input circuitry to the pin driver first input.
1. A pin electronics circuit for use in automatic test equipment, the pin electronics circuit including:
a pin driver having an output adapted for coupling to a device-under-test pin, and a first input; and
selector circuitry configured to selectively couple AC input circuitry and DC input circuitry to the first input.
2. The pin electronics of claim 1 , further comprising a current measurement amplifier disposed at the output of the pin driver.
3. The pin electronics of claim 1 wherein the pin driver comprises a second input fed back to the pin driver output.
4. The pin electronics of claim 1 wherein the selector circuitry comprises:
a multiplexer having an output coupled to the first input, a control input, and a pair of signal level inputs, and
logic circuitry having a first input coupled to the AC input circuitry and a second input coupled to the DC input circuitry.
5. The pin electronics of claim 4 wherein the logic circuitry comprises an OR gate.
6. The pin electronics of claim 1 wherein the AC input circuitry comprises a pattern generator.
7. The pin electronics of claim 1 wherein the DC input circuitry comprises a register.
8. The pin electronic circuit of claim 1 wherein the AC input circuitry is adapted for coupling to a pattern generator to receive pattern test signals.
9. The pin electronic circuit of claim 1 wherein the DC input circuitry is adapted for coupling to a DC parametric controller.
10. A pin electronics circuit for use in automatic test equipment, the pin electronics circuit comprising:
means for driving test waveforms to a device-under-test pin, the means for driving having an output for coupling to the pin, and an input; and
means configured to selectively couple AC input circuitry and DC input circuitry to the input of the means for driving.
11. The pin electronics circuit of claim 10 wherein the DC input circuitry is adapted for coupling to a DC parametric controller.
12. The pin electronics circuit of claim 10 wherein the AC input circuitry is adapted for coupling to a pattern generator to receive pattern test signals.