Configurable automatic-test-equipment system
View Patent ↗A method and system for measuring a device under test includes connecting a first test instrument and a second test instrument to a programmable logic device. The programmable logic device is configured to comply with interface specifications of the first test instrument. The second test instrument has interface specifications that are different from the interface specifications of the first test instrument. The programmable logic device is configured to comply with the interface specifications of the second test instrument.
1. A method comprising:
connecting a first test instrument to a programmable logic device;
configuring the programmable logic device to comply with interface specifications of the first test instrument, the interface specifications of the first test instrument defining characteristics of an interface between the first test instrument and a host computer;
connecting a second test instrument to the programmable logic device, the second test instrument having interface specifications that are different from the interface specifications of the first test instrument, the interface specifications of the second test instrument defining characteristics of an interface between the second test instrument and the host computer; and
configuring the programmable logic device to comply with the interface specifications of the second test instrument.
2. The method of claim 1 further comprising transmitting information between the test instruments and the host computer interfaced to the programmable logic device, the information being relayed by the programmable logic device.
3. The method of claim 2 wherein transmitting information comprises:
sending control signals to the test instruments from device drivers within the host computer, the control signals controlling, at least in part, the operation of the test instruments; and
receiving at the host computer test data collected by the test instruments.
4. The method of claim 1 wherein configuring the programmable logic device comprises loading a hardware configuration file into the programmable logic device, the hardware configuration file determining the structure and functionality of the programmable logic device.
5. A system comprising:
first and second test instruments configured to measure one or more characteristics of a device under test;
a host computer configured to receive test data collected from the first and second test instruments and to control the operation of the first and second test instruments; and
a programmable logic device interfacing each of the first and second test instruments with the host computer using different interface specifications, the programmable logic device configured to transmit information between each of the first and second test instruments and the host computer.
6. The system of claim 5 wherein the programmable logic device comprises a field programmable array (FPGA).
7. The system of claim 5 wherein the host computer further comprises:
a device driver configured to control the test instrument; and
a configuration selector to select the device driver from a plurality of device drivers stored within the host computer.
8. The system of claim 5 wherein the programmable logic device comprises a port for receiving a hardware configuration file determining the structure and functionality of the programmable logic device, wherein the hardware configuration file comprises instructions that when executed by the programmable logic device cause hardware interconnects within the programmable logic device to be asserted.
9. The system of claim 8 wherein the configuration file is compiled from a VHDL script.
10. The system of claim 5 further comprising network connecting the host computer and the programmable logic device.
11. The system of claim 10 wherein the network in an Internet.
12. A system comprising:
a programmable logic device configured to acquire several different types of measurements from a device under test, the measurements being represented as test data; and
a host computer connected to the programmable logic device through an interface, the host computer configured to receive the test data acquired by the programmable logic device and to control the operation of the programmable logic device according to a measurement plan.
13. The system of claim 12 further comprising a test instrument configured to measure one or more characteristics of the device under test, the programmable logic device interfacing the test instrument to the host computer.
14. The system of claim 12 wherein the programmable logic device comprises a field programmable array (FPGA).
15. The system of claim 12 wherein the host computer further comprises;
a device driver configured to control a testing function performed by the programmable logic device;
a configuration selector to select the device driver from a plurality of device drivers stored within the host computer; and
a port for receiving a hardware configuration file determining the structure and functionality of the programmable logic device, the hardware configuration file comprising instructions to cause the programmable logic device to support interface specifications of the device under test and to perform testing functions according to a measurement plan.
16. The system of claim 15 wherein the configuration file is compiled from a VHDL script.
17. The system of claim 12 further comprising a network connecting the host computer and the programmable logic device.
18. The system of claim 17 wherein the network in an Internet.
19. A computer program product being embodied in an information carrier, the computer program product comprising instructions that cause a computer to:
connect a first test instrument to a programmable logic device;
configure the programmable logic device to comply with interface specifications of the first test instrument, the interface specifications of the first test instrument defining characteristics of an interface between the first test instrument and a host computer;
connect a second test instrument to the programmable logic device, the second test instrument having interface specifications that are different than the interface specifications of the first test instrument; and
configure the programmable logic device to comply with the interface specifications of the second test instrument, the interface specifications of the second test instrument defining characteristics of an interface between the second test instrument and the host computer.
20. The computer program product of claim 19 comprising further instructions that cause the computer to transmit information between the test instruments and the host computer interfaced to the programmable logic device, the information being relayed by the programmable logic device.