V/I source and test system incorporating the same

1. A voltage/current (V/I) source comprising:

circuitry comprising first, second, third and fourth nodes;

a first current source electrically connected to the first node;

a second current source electrically connected to the second node, the third and fourth nodes being between the first and second nodes;

an operational amplifier (op-amp) having an output, an inverting input, and a non-inverting input, the output being electrically connected to the third node, and the non-inverting input being electrically connected to a voltage source;

a feedback line between the fourth node and the inverting input;

a first circuit element between the first and fourth nodes;

a second circuit element between the second and fourth nodes;

a third circuit element between the first and third nodes; and

a fourth circuit element between the second and third nodes;

wherein the first, second, third and fourth circuit elements are configurable to permit or restrict current flow.

2. The V/I source of claim 1 , wherein the feedback line comprises a first feedback line, and wherein the V/I source further comprises:

a second feedback line between the output of the op-amp and the inverting input; and

switching devices configured to electrically connect the first feedback line or the second feedback line to the inverting input of the op-amp.

3. The V/I source of claim 1 , wherein at least one of the first and second current sources is programmable.

4. The V/I source of claim 3 , wherein the first and second current sources are configured to be programmed independently.

5. The V/I source of claim 1 , wherein the first, second, third, and fourth circuit elements comprise diodes.

6. A test system configured to test one or more electronic devices, comprising:

the V/I source of claim 1 ;

wherein the fourth node of the circuitry is connectable to a device under test (DUT), and wherein the circuitry comprises a diode-quad circuit.

7. The test system of claim 6 , further comprising:

a voltage measurement device electrically connected to the fourth node of the diode-quad circuit.

8. The test system of claim 6 , further comprising:

a resistive device electrically connected to the fourth node.

9. The test system of claim 8 , further comprising:

a switch that is electrically parallel to the resistive device.

10. The test system of claim 8 , further comprising:

a current measurement device electrically connected to different ends of the resistive device.

11. The test system of claim 6 , further comprising:

at least one comparator configured to be electrically connected to the fourth node of the diode-quad circuit.

12. The test system of claim 11 , wherein the at least one comparator comprises a pair of comparators.

13. The test system of 11 , further comprising:

a switch between the at least one comparator and the fourth node of the diode-quad circuit, the switch being operable to effect, or to prevent, electrical connection of the at least one comparator to the fourth node.

14. The test system of claim 11 , further comprising:

a voltage divider that is electrically connected to the at least one comparator, at least part of the voltage divider being between the at least one comparator and the fourth node of the diode-quad circuit.

15. The test system of claim 7 , further comprising:

a switch for selectively electrically connecting the voltage measurement device to the fourth node of the diode-quad circuit or to an output of a current measurement device.

16. The test system as set forth in claim 7 , further comprising:

a voltage divider, at least part of which is electrically connected between the voltage measurement device and the fourth node of the diode-quad circuit.

17. A method of forming a voltage/current (V/I) source, comprising:

providing an electrical circuit comprising a diode bridge rectifier, the electrical circuit comprising first, second, third and fourth nodes;

connecting a first current source to the first node of the electrical circuit;

connecting a second current source to the second node of the electrical circuit;

providing an output of an operational amplifier (op-amp) to the third node of the electrical circuit; and

providing a feedback line between the fourth node of the electrical circuit and an inverting input of the op-amp.

18. The method of claim 17 , wherein the electrical circuit comprises a diode-quad circuit.

19. The method of claim 17 , wherein the feedback line comprises a first feedback line, and wherein the method further comprises:

providing a second feedback line between the output of the op-amp and an inverting input of the op-amp; and

connecting the first feedback line or the second feedback line to the inverting input of the op-amp.

20. The method of claim 17 , wherein at least one of the first and second current sources is programmable to provide an amount of current.

21. The method of claim 20 , wherein the first and second current sources are independently programmable.

22. A method for testing an electronic device, comprising:

connecting the fourth node of the V/I source of claim 1 to a device under test (DUT); and

monitoring behavior of the V/I source based on an output of the DUT.

23. The method of claim 22 , wherein the feedback line comprises a first feedback line, and wherein the V/I source further comprises a second feedback line between the output of the op-amp and the inverting input; and

wherein the first feedback line or the second feedback line is electrically connected to the inverting input of the op-amp, wherein which feedback line is connected is dependent on a device to be tested and/or a test to be performed.

24. The method of claim 22 , wherein monitoring comprises measuring a voltage drop across a first resistor electrically connected to the fourth node.

25. The method of claim 22 , wherein monitoring comprises measuring a voltage at the fourth node.

26. The method of claim 25 , wherein the voltage at the fourth node is measured using comparators.