High speed data transfer using calibrated, single-clock source synchronous serializer-deserializer protocol
View Patent ↗An electronic system, comprising a first semiconductor device, a second semiconductor device, a clock circuit, and a plurality of independently adjustable calibration circuits connected in each of the plurality of serial data paths. The first semiconductor device may comprise a plurality of Serializer-Deserializer interfaces. The second semiconductor device may comprise a plurality of serial data interfaces coupled to the plurality of Serializer-Deserializer interfaces to provide a plurality of serial data paths between the first semiconductor device and the second semiconductor device. The plurality of Serializer-Deserializer interfaces and the plurality of serial data interfaces may be clocked from a clock signal derived from the clock circuit. The plurality of independently adjustable calibration circuits may be configured to compensate for timing differences across the plurality of serial data paths.
1. An electronic system, comprising:
a first semiconductor device comprising:
a plurality of Serializer-Deserializer interfaces;
a second semiconductor device comprising:
a plurality of serial data interfaces, coupled to the plurality of Serializer-Deserialize interfaces, to provide a plurality of serial data paths between the first semiconductor device and the second semiconductor device;
a clock circuit; and
a plurality of independently adjustable calibration circuits connected in each of the plurality of serial data paths,
wherein:
the plurality of Serializer-Deserializer interfaces and the plurality of serial data interfaces are docked from a dock signal derived from the clock circuit,
the plurality of independently adjustable calibration circuits are configured to compensate for timing differences across the plurality of serial data paths,
the dock circuit is configured to output a dock with a frequency of 2 gigahertz, and
the first semiconductor device is separated from the second semiconductor device by a distance of less than 6 inches.
2. The electronic system of claim 1 , wherein:
the first semiconductor device comprises a field-programmable gate array.
3. The electronic system of claim 1 , wherein:
the clock circuit comprises a quad phase locked loop.
4. The electronic system of claim 1 , wherein:
the plurality of calibration circuits comprise a plurality of phase interpolators.
5. The electronic system of claim 1 , wherein:
the second semiconductor device comprises a silicon-germanium device.
6. The electronic system of claim 1 , wherein:
the electronic system comprises an automated test system.
7. The electronic system of claim 6 , wherein:
the second semiconductor device comprises a pin electronics chip.
8. An electronic system, comprising:
a first semiconductor device comprising:
a plurality of Serializer-Deserializer interfaces;
a second semiconductor device comprising:
a plurality of serial data interfaces, coupled to the plurality of Serializer-Deserialize interfaces, to provide a plurality of serial data paths between the first semiconductor device and the second semiconductor device;
a clock circuit; and
a plurality of independently adjustable calibration circuits connected in each of the plurality of serial data paths,
wherein:
the plurality of Serializer-Deserializer interfaces and the plurality of serial data interfaces are docked from a dock signal derived from the clock circuit,
the plurality of independently adjustable calibration circuits are configured to compensate for timing differences across the plurality of serial data paths,
a first portion of the plurality of serial data paths are configured for transmission of data from the first semiconductor device to the second semiconductor device, and
a second portion of the plurality of serial data paths are configured for transmission of a reference clock from the clock circuit.
9. The electronic system of claim 8 , wherein:
a third portion of the plurality of serial data paths are configured for transmission of data from the second semiconductor device to the first semiconductor device, and
the plurality of serial data interfaces are coupled to the third portion of the plurality of serial data paths.
10. The electronic system of claim 9 , wherein:
the second semiconductor device further comprises:
at least one driver and drive circuitry configured to control the at least one driver, in each of a plurality of cycles, based on data received concurrently over the first portion of the plurality of serial data paths; and
at least one comparator and compare circuitry configured to obtain compare data from the at least one comparator, in each of a plurality of cycles, and control transmission of the compare data concurrently over the third portion of the plurality of serial data paths.
11. An electronic system, comprising:
a first semiconductor device comprising:
a plurality of Serializer-Deserializer interfaces;
a second semiconductor device comprising:
a plurality of serial data interfaces, coupled to the plurality of Serializer-Deserialize interfaces, to provide a plurality of serial data paths between the first semiconductor device and the second semiconductor device;
a clock circuit; and
a plurality of independently adjustable calibration circuits connected in each of the plurality of serial data paths,
wherein:
the plurality of Serializer-Deserializer interfaces and the plurality of serial data interfaces are docked from a dock signal derived from the clock circuit,
the plurality of independently adjustable calibration circuits are configured to compensate for timing differences across the plurality of serial data paths, and
data dependent jitter of the plurality of serial data paths is less than or equal to 15 percent of a data eye of the plurality of serial data paths.