Clock architecture for a frequency-based tester
View Patent ↗A clock system is disclosed for distributing and generating a digital clock signal for a plurality of electronic assemblies. The clock system includes a remote fixed-frequency clock for generating a first clock signal of a first frequency and a plurality of local clock modules. The local clock modules are respectively disposed on the plurality of electronic assemblies and each include synthesizer circuitry for creating a variable clock signal of a different frequency than the first frequency. Fanout circuitry is coupled between the remote fixed frequency clock and the plurality of local clock modules to distribute the first clock signal.
1. A clock system for distributing and generating a digital clock signal for a plurality of electronic assemblies, the clock system comprising:
a reference clock for generating a first clock signal of a first frequency;
control circuitry for generating a sync signal, the sync signal being associated with a reference edge of the first clock signal;
clock modules respectively disposed on the plurality of electronic assemblies, the clock modules including synthesizer circuitry for generating at least one second clock signal having one or more second frequencies, wherein at least one of the second frequencies is different from the first frequency; and
fanout circuitry coupled to the reference clock and the clock modules to distribute the first clock signal and the sync signal.
2. The clock system according to claim 1 , wherein the clock modules further comprise phase-locked-loop circuitry and wherein the synthesizer circuitry comprises a direct-digital-synthesizer having an input for receiving the first clock signal and an output coupled to the phase-locked-loop circuitry.
3. The clock system according to claim 2 , wherein the synthesizer and the phase-locked-loop circuitry cooperate to generate the at least one second clock signal and at least one of the second frequencies is greater than the first frequency.
4. The clock system according to claim 1 , wherein the plurality of electronic assemblies include respective pattern generators having clock inputs coupled to the outputs of the respective clock modules.
5. The clock system according to claim 1 , wherein at least two of the second frequencies are different from one another.
6. A clock system for distributing and generating a digital clock signal for a plurality of electronic assemblies, the clock system comprising:
a reference clock for generating a first clock signal of a first frequency;
clock modules respectively disposed on the plurality of electronic assemblies, the clock modules including synthesizer circuitry for generating at least one second clock signal having one or more second frequencies, wherein at least one of the second frequencies is different from the first frequency;
fanout circuitry coupled between the reference clock and the clock modules to distribute the first clock signal; and
control circuitry for generating a sync signal, the sync signal being associated with a reference edge from the first clock signal, the fanout circuitry including parallel connections for distributing the sync signal with the first clock signal, and the clock modules including synchronization circuitry for aligning and starting the clock modules synchronously based on the sync signal.
7. A clock system for distributing and generating a digital clock signal for a plurality of electronic assemblies, the clock system comprising:
a reference clock for generating a first clock signal of a first frequency;
clock modules respectively disposed on the plurality of electronic assemblies, the clock modules including synthesizer circuitry for generating second clock signal having second frequencies, wherein at least one of the second frequencies is different from the first frequency and at least two of the second frequencies are different from one another;
pattern generators respectively disposed on the plurality of electronic assemblies, the pattern generators having clock inputs coupled to the outputs of the respective clock modules;
fanout circuitry coupled between the reference clock and the clock modules to distribute the first clock signal; and
coincidence point detection circuitry for determining synchronous operation between the respective pattern generators.
8. A frequency-based semiconductor tester comprising:
a testhead comprising:
reference clock circuitry for generating a first clock signal of a first frequency,
control circuitry for generating a sync signal, the sync signal being associated with a reference edge of the first clock signal,
clock modules having synthesizer circuitry for generating at least one second clock signal having one or more second frequencies, wherein at least one of the second frequencies is different from the first frequency, and
fanout circuitry coupled to the synthesizer circuitry and the reference clock circuitry for distributing the first clock signal as a reference signal for the synthesizer circuitry and the sync signal.
9. The frequency-based semiconductor tester according to claim 8 , wherein the clock modules further comprise phase-locked-loop circuitry and wherein the synthesizer circuitry comprises a direct-digital-synthesizer having an input for receiving the first clock signal and an output coupled to the phase-locked-loop circuitry.
10. The frequency-based semiconductor tester according to claim 9 , wherein the synthesizer and the phase-locked-loop circuitry cooperate to generate the at least one second clock signal and at least one of the second frequencies is greater than the first frequency.
11. The frequency-based semiconductor tester according to claim 8 , wherein the testhead further comprises a plurality of pattern generators having clock inputs coupled to the outputs of the respective clock modules.
12. The frequency-based semiconductor tester according to claim 8 , wherein at least two of the second frequencies are different from one another.
13. A frequency-based semiconductor tester comprising:
a testhead comprising:
reference clock circuitry for generating a first clock signal of a first frequency,
clock modules having synthesizer circuitry for generating at least one second clock signal having one or more second frequencies, wherein at least one of the second frequencies is different from the first frequency,
fanout circuitry disposed between the synthesizer circuitry and the reference clock circuitry for distributing the first clock signal as a reference signal for the synthesizer circuitry, and
control circuitry for generating a sync signal, the sync signal being associated with a reference edge from the first clock signal, the fanout circuitry including parallel connections for distributing the sync signal with the first clock signal, and the clock modules including synchronization circuitry for aligning and starting the clock modules synchronously based on the sync signal.
14. A frequency-based semiconductor tester comprising:
a testhead comprising:
reference clock circuitry for generating a first clock signal of a first frequency,
clock modules having synthesizer circuitry for generating second clock signals having second frequencies, wherein at least one of the second frequencies is different from the first frequency and at least two of the second frequencies are different from one another,
fanout circuitry disposed between the synthesizer circuitry and the reference clock circuitry for distributing the first clock signal as a reference signal for the synthesizer circuitry,
pattern generators having clock inputs coupled to the outputs of the respective clock modules, and
coincidence point detection circuitry for determining synchronous operation between the respective pattern generators.
15. A method of clocking a plurality of electronic assemblies comprising:
generating a first clock signal of a first frequency;
generating a sync signal, the sync signal being associated with a reference edge of the first clock signal,
distributing the first clock signal and the sync signal to a plurality of clock modules disposed on the plurality of electronic assemblies; and
generating at least one second clock signal with the plurality of clock modules, the at least one second clock signal having one or more second frequencies wherein at least one of the second frequencies is different from the first frequency.
16. A method of starting a plurality of automated test equipment pattern generators synchronously, the pattern generators disposed on respective electronic assemblies, the method comprising:
generating a first clock signal of a first frequency;
generating a control sync signal, the sync signal associated with a reference edge of the first clock signal;
distributing the first clock signal and the sync signal to a plurality of clock modules disposed on the respective electronic assemblies, the clock modules including clock synthesizer circuitry and edge prediction circuitry;
generating at least one second clock signal on the clock modules with the respective synthesizer circuitry, the at least one second clock signal having one or more second frequencies wherein at least one of the second frequencies is different from the first frequency; and
passing the sync signal through the edge prediction circuitry to identify start times for the plurality of pattern generators.
17. The method according to claim 16 , wherein at least two of the pattern generators operate at frequencies different from one another and receive the second clock signals from the respective clock modules, the method further comprising:
detecting coincidence points between the second clock signals; and
utilizing the detected coincidence points to identify starting times for the plurality of pattern generators.
18. The method according to claim 16 , wherein the synthesizer circuitry includes a plurality of direct-digital-synthesizers, and the step of generating at least one second clock signal further comprises
aligning the direct-digital-synthesizers.