Determining frequency components of jitter

1. A method of determining frequency components of jitter in a waveform, the method comprising:

conducting a plurality of locally-in-order strobings of the waveform, wherein the locally-in-order strobings are based on undersampling strobing techniques that map strobes over a relatively large period of time to effective times within a test pattern;

changing an acquisition time associated with each locally-in-order strobing;

measuring jitter associated with each locally-in-order strobing; and

determining jitter as a function of frequency based on the measured jitter associated with each change of acquisition time.

2. The method of claim 1 , wherein changing the acquisition time of each locally-in-order strobing further comprises one of increasing a spacing between locally-in-order strobes and decreasing the spacing between locally-in-order strobes.

3. The method of claim 1 , further comprising:

expressing jitter magnitude as a function of acquisition time.

4. The method of claim 1 , further comprising:

determining the jitter frequencies within a particular frequency range.

5. The method of claim 1 , wherein measuring jitter further comprises:

identifying transition regions in each subset of locally-in-order strobe data; and

calculating the standard deviation of each transition region.

6. The method of claim 5 , further comprising:

calculating at least one of the average and root square average of all standard deviations.

7. The method of claim 1 , wherein conducting a plurality of locally-in-order strobes of a waveform further comprises:

asynchronously strobing the waveform for each locally-in-order strobing; and

mapping strobes into associated subsets to form subsets of locally-in-order strobes.

8. A jitter measurement system, the system comprising:

a means to take jitter measurements in a locally-in-order strobing scheme, wherein the locally-in-order strobing scheme includes locally-in-order strobings of a waveform based on undersampling strobing techniques that map strobes over a relatively large period of time to effective times within a test pattern;

a means for changing an acquisition time in each locally-in-order strobing; and

a means for expressing jitter as a function of frequency.

9. The jitter measurement system of claim 8 , further comprising:

a means to express jitter magnitude as a function of the acquisition time.

10. The jitter measurement system of claim 8 , further comprising:

a means to determine jitter frequencies within a particular frequency range.