Test solution development method
View Patent ↗A test solution for one or more circuits implementing a communication standard is based on a design specification received from a development organization and a communication standard. The test solution is evaluated with one or more prototype circuits and is selectively modified based on the evaluation with the prototype circuits. The test solution is then evaluated with one or more manufactured circuits and is selectively modified based on the evaluation with the manufactured circuits.
1. A method of developing a test solution for one or more integrated circuits (ICs) implementing a communication standard, comprising:
receiving a design specification for at least a portion of said one or more ICs from a development organization;
receiving a communication standard for said one or more ICs;
designing a draft test solution for said one or more ICs in at least substantial conformance with said communication standard and design specification;
receiving at least one prototype of said one or more ICs from said development organization;
evaluating said draft test solution based on at least one interaction between said at least one prototype and said draft test solution;
selectively modifying said draft test solution based on said at least one Interaction to produce a proposed test solution;
receiving, from one or more entities including a manufacturing organization, at least one of each of said one or more ICs at least a portion of which is manufactured substantially in conformance with said design specification;
evaluating said proposed test solution based on at least another interaction between said manufactured one or more ICs and said proposed test solution; and
selectively modifying said proposed test solution based on said at least another interaction to produce a production test solution.
2. The method of claim 1 wherein said development organization and said manufacturing organization are in different geographical locations.