IP Library Granted Patent US 6,433,878
Granted Patent Utility
US 6,433,878 · Confirmation No. 8686

METHOD AND APPARATUS FOR THE DETERMINATION OF MASK RULES USING SCATTEROMETRY

⬇ PDF
Code Description Pages PDF
2001-01-29 TRNA Transmittal of New Application 4 View
2001-01-29 SPEC Specification 20 View
2001-01-29 CLM Claims 3 View
2001-01-29 ABST Abstract 1 View
2001-01-29 DRW Drawings-only black and white line drawings 11 View
2001-01-29 OATH Oath or Declaration filed 7 View
2001-01-29 TRNA Transmittal of New Application 4 View
2001-01-29 SPEC Specification 20 View
2001-01-29 CLM Claims 3 View
2001-01-29 ABST Abstract 1 View
2001-01-29 DRW Drawings-only black and white line drawings 11 View
2001-01-29 OATH Oath or Declaration filed 7 View
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this application's details
Quick Facts
Patent No.
US 6,433,878
App. No.
09/772,148
Filed
2001-01-29
Granted
2002-08-13
Pub. No.
US20020131055A1
Art Unit
2877
PTA
0 days