Patent Assignment
Reel/Frame 031911/0254
Change of Name
Recorded: 2014-01-02
Pages: 4
Assignor
TIMBRE TECHNOLOGIES, INC.
Executed: 2013-03-19
Assignee
TEL TIMBRE TECHNOLOGIES, INC.
3100 WEST WARREN AVE., FREMONT, CALIFORNIA, 94538
Covered Properties
(32)
System and Method for Real-Time Library Generation of Grating Profiles
Patent:
6,768,983 →
Application:
09/727,530 →
Clustering for Data Compression
Patent:
6,591,405 →
Application:
09/727,531 →
System and Method for Grating Profile Classification
Caching of Intra-Layer Calculations for Rapid Rigorous Coupled-Wave Analyses
Method and Apparatus for the Determination of Mask Rules Using Scatterometry
Grating Test Patterns and Methods for Overlay Metrology
Generation of a Library of Periodic Grating Diffraction Signals
Method and System of Dynamic Learning Through a Regression-Based Library Generation Process
System and Method for Efficient Simulation of Reflectometry Response from Two-Dimensional Grating Structures
Patent:
6,833,914 →
Application:
10/004,495 →
Optical Profilometry of Additional-Material Deviations in a Periodic Grating
Measurement of Metal Electroplating and Seed Layer Thickness and Profile
Balancing Planarization of Layers and the Effect of Underlying Structure on the Metrology Signal
Generating a Library of Simulated-Diffraction Signals and Hypothetical Profiles of Periodic Gratings
Overlay Measurements Using Periodic Gratings
Profile Refinement for Integrated Circuit Metrology
Patent:
6,609,086 →
Application:
10/075,904 →
Generation and Use of Integrated Circuit Profile-Based Simulation Information
Metrology Hardware Specification Using a Hardware Simulator
Metrology Diffraction Signal Adaptation for Tool-to-Tool Matching
Combined Optical Profilometry and Projection Microscopy of Integrated Circuit Structures
Overlay Measurements Using Zero-Order Cross Polarization Measurements
Selection of Wavelengths for Integrated Circuit Optical Metrology
Optical Metrology of Single Features
Single Pass Lithography Overlay Technique
Model and Parameter Selection for Optical Metrology
Metrology Hardware Adaptation with Universal Library
Integrated Circuit Profile Value Determination
Optimized Model and Parameter Selection for Optical Metrology
Generation and Use of Integrated Circuit Profile-Based Simulation Information
Selection of Wavelengths for Integrated Circuit Optical Metrology
Generation of a Library of Periodic Grating Diffraction Signals
Model and Parameter Selection for Optical Metrology
Optical Metrology of Single Features
Related Assignments
(4)
Other recorded transfers of the patents in this record — the chain of ownership.
Merger
Jan 2, 2014
From: TEL TIMBRE TECHNOLOGIES, INC.
To: TOKYO ELECTRON AMERICA, INC.
Reel/Frame 031874/0939 →
Grant of Security Interest in Patent Rights
Dec 1, 2021
From: TRU OPTIK DATA CORP.; NEUSTAR INFORMATION SERVICES, INC.; NEUSTAR DATA SERVICES, INC.; TRUSTID, INC.
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 058294/0010 →
Grant of Security Interest in United States Patents
Dec 1, 2021
From: EBUREAU, LLC; IOVATION, INC.; SIGNAL DIGITAL, INC.; TRANS UNION LLC
To: JPMORGAN CHASE BANK, N.A
Reel/Frame 058294/0161 →
Corrective Assignment to Correct the Application No. 16/990,698 Previously Recorded on Reel 058294 Frame 0010. Assignor(S) Hereby Confirms the Assignment.
Apr 21, 2022
From: TRU OPTIK DATA CORP.; NEUSTAR INFORMATION SERVICES, INC.; NEUSTAR DATA SERVICES, INC.; TRUSTID, INC.
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 059846/0157 →