Granted Patent
Utility
US 6,549,480
· Confirmation No. 3386
SEMICONDUCTOR INTEGRATED CIRCUIT ALLOWING INTERNAL VOLTAGE TO BE MEASURED AND CONTROLLED EXTERNALLY
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2001-02-01 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-02-01 | SPEC |
Specification | 47 | View | |
| 2001-02-01 | CLM |
Claims | 6 | View | |
| 2001-02-01 | ABST |
Abstract | 1 | View | |
| 2001-02-01 | DRW |
Drawings-only black and white line drawings | 18 | View | |
| 2001-02-01 | OATH |
Oath or Declaration filed | 4 | View | |
| 2001-02-01 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-02-01 | SPEC |
Specification | 47 | View | |
| 2001-02-01 | CLM |
Claims | 6 | View | |
| 2001-02-01 | ABST |
Abstract | 1 | View | |
| 2001-02-01 | DRW |
Drawings-only black and white line drawings | 18 | View | |
| 2001-02-01 | OATH |
Oath or Declaration filed | 4 | View |
Inventors
Akira Hosogane
Hyogo, JAPAN
Yoshitsugu Dohi
Hyogo, JAPAN
Hiroaki Nakai
Hyogo, JAPAN
Tatsuya Saeki
Hyogo, JAPAN
Attorneys & Agents of Record
Classification
USPC
365/226
G06F1/22
G05F1/465
G06F1/26
Prosecution
- Examiner
- HUR, JUNG H
- Art Unit
- 2824
- Docket No.
- 49657-979
- Confirmation No.
- 3386
Foreign Priority
2000-255545(P)
·
2000-08-25
·
JAPAN
Publication
- Pub. No.
- US20020024330A1
- Pub. Date
- 2002-02-28
Patent Term Adjustment
0days
No related applications found.
CHANGE OF ADDRESS
Recorded 2017-11-29
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2011-03-18
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-02-01
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Quick Facts
- Patent No.
- US 6,549,480
- App. No.
- 09/774,719
- Filed
- 2001-02-01
- Granted
- 2003-04-15
- Pub. No.
- US20020024330A1
- Examiner
- HUR, JUNG H
- Art Unit
- 2824
- PTA
- 0 days
External Links