Granted Patent
Utility
US 6,400,623
· Confirmation No. 7536
SEMICONDUCTOR MEMORY HAVING PARALLEL TEST MODE
Inventor:
Kazuki Ohno
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2009-01-07 | EBCC.AD |
Notice of Change of Address Place in File Wrapper Due to Electronic Business Center(EBC) Customer Number Update | 1 | View | |
| 2008-11-24 | EBCC.AD |
Notice of Change of Address Place in File Wrapper Due to Electronic Business Center(EBC) Customer Number Update | 1 | View | |
| 2001-02-08 | TRNA |
Transmittal of New Application | 1 | View | |
| 2001-02-08 | SPEC |
Specification | 23 | View | |
| 2001-02-08 | CLM |
Claims | 6 | View | |
| 2001-02-08 | ABST |
Abstract | 1 | View | |
| 2001-02-08 | DRW |
Drawings-only black and white line drawings | 3 | View | |
| 2001-02-08 | OATH |
Oath or Declaration filed | 3 | View |
Inventors
Kazuki Ohno
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
365/201
Prosecution
- Examiner
- MAI, SON LUU
- Art Unit
- 2818
- Customer No.
- 79037
- Docket No.
- N02991300
- Confirmation No.
- 7536
Foreign Priority
029913/2000
·
2000-02-08
·
JAPAN
Publication
- Pub. No.
- US20010017803A1
- Pub. Date
- 2001-08-30
Patent Term Adjustment
-61days
No related applications found.
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-02-06
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Quick Facts
- Patent No.
- US 6,400,623
- App. No.
- 09/781,054
- Filed
- 2001-02-08
- Granted
- 2002-06-04
- Pub. No.
- US20010017803A1
- Examiner
- MAI, SON LUU
- Art Unit
- 2818
- PTA
- -61 days
External Links