IP Library Granted Patent US 6,448,805
Granted Patent Utility
US 6,448,805 · Confirmation No. 9724

METHOD AND APPARATUS FOR WAFER-LEVEL TESTING OF SEMICONDUCTOR LASERS

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Code Description Pages PDF
2008-02-14 PA.. Power of Attorney 1 View
2008-02-14 N417 Electronic Filing System Acknowledgment Receipt 2 View
2001-02-12 TRNA Transmittal of New Application 2 View
2001-02-12 SPEC Specification 10 View
2001-02-12 CLM Claims 4 View
2001-02-12 ABST Abstract 1 View
2001-02-12 DRW Drawings-only black and white line drawings 9 View
2001-02-12 OATH Oath or Declaration filed 2 View
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Quick Facts
Patent No.
US 6,448,805
App. No.
09/782,092
Filed
2001-02-12
Granted
2002-09-10
Pub. No.
US20020109520A1
Art Unit
2829
PTA
0 days