IP Library › Assignment 016686/0173
Patent Assignment
Reel/Frame 016686/0173

Grant of Patent Security Interest

Recorded: 2005-10-26 Received: 2005-10-26 Pages: 5
Assignor
NOVALUX, INC.
Executed: 2005-10-13
Assignee
DYNAFUND II, L.P., AS COLLATERAL AGENT
21515 HAWTHORNE BLVD., SUITE 1200, TORRANCE, CA, 905035610, UNITED STATES
Covered Properties (15)
Apparatus, System, and Method for Junction Isolation of Arrays of Surface Emitting Lasers
Application: 11/194,077 →
Projection Display Apparatus, System, and Method
Apparatus, system, and method for wavelength conversion of mode-locked extended cavity surface emitting semiconductor lasers
Application: 11/194,141 →
Apparatus, System, and Method for Junction Isolation of Arrays of Surface Emitting Lasers
Apparatus, System, and Method for Wavelength Conversion of Mode-Locked Extended Cavity Surface Emitting Semiconductor Lasers
Cavity and packaging designs for arrays of vertical cavity surface emitting lasers with or without extended cavities
Application: 60/689,582 →
Coupled cavity high power semiconductor laser
Application: 11/136,071 →
Methods for driving laser sources for display applications
Application: 60/666,826 →
Frequency-stabilized, vertical extended-cavity surface-emitting lasers and laser arrays with nonlinear frequency conversion
Application: 60/667,202 →
Highly manufacturable, compact, frequency-doubled, vertical extended-cavity surface-emitting laser arrays
Application: 60/667,201 →
Development of compact blue-green lasers for projection display based on Novalux extended-cavity surface emitting laser technology
Application: 60/646,072 →
Coupled Cavity High Power Semiconductor Laser
Application: 10/899,779 →
Method and Apparatus for Wafer-Level Testing of Semiconductor Laser
Application: 10/033,975 →
Method and Apparatus for Controlling Thermal Variations in an Optical Device
Application: 09/866,062 →
Method and Apparatus for Wafer-Level Testing of Semiconductor Lasers
Application: 09/782,092 →