IP Library › Granted Patent US 6,577,970
Granted Patent Utility
US 6,577,970 · Confirmation No. 6471

METHOD OF DETERMINING A CRYSTALLOGRAPHIC QUALITY OF A MATERIAL LOCATED ON A SUBSTRATE

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 Code Description Pages PDF
2001-04-16 DRW Drawings-only black and white line drawings 8 View
2001-04-16 LET. Miscellaneous Incoming Letter 1 View
2001-03-08 TRNA Transmittal of New Application 2 View
2001-03-08 SPEC Specification 21 View
2001-03-08 CLM Claims 8 View
2001-03-08 ABST Abstract 1 View
2001-03-08 DRW Drawings-only black and white line drawings 8 View
2001-03-08 OATH Oath or Declaration filed 9 View
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Quick Facts
Patent No.
US 6,577,970
App. No.
09/801,455
Filed
2001-03-08
Granted
2003-06-10
Pub. No.
US20020128789A1
Art Unit
2863
PTA
-6 days