IP Library Granted Patent US 6,392,423
Granted Patent Utility
US 6,392,423 · Confirmation No. 4181

METHOD FOR TESTING INTEGRATED CIRCUIT DEVICES

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Code Description Pages PDF
2001-03-21 TRNA Transmittal of New Application 2 View
2001-03-21 SPEC Specification 28 View
2001-03-21 CLM Claims 4 View
2001-03-21 ABST Abstract 1 View
2001-03-21 DRW Drawings-only black and white line drawings 10 View
2001-03-21 OATH Oath or Declaration filed 2 View
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Quick Facts
Patent No.
US 6,392,423
App. No.
09/814,497
Filed
2001-03-21
Granted
2002-05-21
Pub. No.
US20010019275A1
Examiner
DEB, ANJAN K
Art Unit
2858
PTA
-62 days