Pattern-based defect description method
View Patent ↗The present invention provides a method of describing defects that requires less memory space than conventional methods. Entries of a first defect table are sorted according to the type of track layout, or zones. They are then grouped into clusters. Each cluster is characterized by a set of new parameters, including a starting sector, a scratch parameter, a span parameter, and an angle parameter. The new parameters are stored in a second table, replacing the corresponding entries in the first table. In this manner, a single entry in the second table replaces one or more entries in the first table with one entry in the first table.
1. In a disc drive comprising at least one disc having a plurality of addressable sectors arranged in a plurality of tracks on a surface of the disc, the sectors being categorised into zones such that data is capable of being written to and read from different zones at different rates, a method of storing information on defective sectors comprising steps of:
(a) sorting defective sectors by zone;
(b) defining a cluster comprising at least one defective sector;
(c) selecting one sector from the cluster to be a reference sector;
(d) defining parameters with reference to the reference sector, the parameters describing the shape and size of the cluster;
(e) storing the parameters with an address of the reference sector; and
(f) performing the steps (b) to (e) separately for each zone.
2. A method of claim 1 wherein the defining step (b) further comprises a step of including at least one non-defective sector in the cluster.
3. A method of claim 1 wherein the selecting step (c) includes selecting the sector with the smallest address to be the reference sector.
4. A method of claim 1 wherein the selecting step (c) includes selecting the sector with the largest address to be the reference sector.
5. A method of claim 1 wherein the defining step (d) further includes defining a scratch parameter characterizing the number of tracks covered by the cluster.
6. A method of claim 1 wherein the defining step (d) further includes defining a span parameter characterizing the number of sectors covered by the cluster along each track.
7. A method of claim 1 wherein the defining step (d) further includes defining an angle parameter characterizing the angular deviation of a side of the cluster from a reference line intersecting the reference sector.
8. A method of claim 7 further comprising defining a radial line to be the reference line.
9. A method comprising steps of:
(a) defining a cluster comprising at least one defective location;
(b) selecting one location from the cluster to be a reference location;
(c) defining parameters with reference to the reference location; and
(d) storing the parameters with an address of the reference location.
10. The method of claim 9 wherein the parameters are stored in a storage apparatus.
11. The method of claim 9 wherein the locations are sectors.
12. The method of claim 9 further comprising the steps of:
sorting a plurality of defective locations into zones; and
performing steps a-d for each zone.
13. A method comprising the steps of:
(a) defining a defect cluster that includes a reference location; and
(b) determining defect parameters relative to the reference location.
14. The method of claim 13 further comprising the step of storing the parameters with an address of the reference location.
15. The method of claim 14 wherein the parameters and address of the reference location are used to determine defect information.
16. The method of claim 14 wherein the defect information corresponds to defects of a storage device.