Method for fabricating semiconductor device
View Patent ↗After distributing a nonmetal element in a region in the vicinity of a surface portion of a semiconductor layer, a metal film is deposited on the semiconductor layer. Next, a semiconductor-metal compound layer is epitaxially grown in the surface portion of the semiconductor layer by causing a reaction between an element included in the semiconductor layer and a metal included in the metal film through annealing carried out on the metal film.
1. A method for fabricating a semiconductor device comprising the steps of:
(a) forming a compound layer including a semiconductor element and a nonmetal element on a semiconductor layer;
(b) distributing said nonmetal element included in said compound layer in the region in the vicinity of the surface portion of said semiconductor layer through recoil by irradiating said compound layer with a particle energy beam;
(c) after the step (b), removing said compound layer;
(d) after the step (c), depositing a metal film on said semiconductor layer; and
(e) after the step (d), epitaxially growing a semiconductor-metal compound layer in the surface portion of said semiconductor layer by causing a reaction between an element included in said semiconductor layer and a metal included in said metal film through annealing carried out on said metal film,
wherein said region in the vicinity of the surface portion of said semiconductor layer is within a depth of 0.5 nm to 5 nm from the surface of the semiconductor layer, and
a dosage of said nonmetal element per unit area is between 4×10 14 cm −2 and 4×10 15 cm −2 .
2. A method for fabricating a semiconductor device comprising the steps of:
(a) forming a compound layer including a semiconductor element and a nonmetal element on a semiconductor layer;
(b) distributing said nonmetal element included in said compound layer in the region in the vicinity of the surface portion of said semiconductor layer through recoil and removing said compound layer by irradiating said compound layer with a particle energy beam;
(c) after the step (b), depositing a metal film on said semiconductor layer; and
(d) after the step (c), epitaxially growing a semiconductor-metal compound layer in the surface portion of said semiconductor layer by causing a reaction between an element included in said semiconductor layer and a metal included in said metal film through annealing carried out on said metal film,
wherein said region in the vicinity of the surface portion of said semiconductor layer is within a depth of 0.5 nm to 5 nm from the surface of the semiconductor layer, and
a dosage of said nonmetal element per unit area is between 4×10 14 cm −2 and 4×10 15 cm −2.
3. A method for fabricating a semiconductor device comprising the steps of:
distributing an oxygen element in a region in the vicinity of a surface portion of a semiconductor layer;
depositing a metal film on said semiconductor layer; and
epitaxially growing a semiconductor-metal compound layer in the surface portion of said semiconductor layer by causing a reaction between an element included in said semiconductor layer and a metal included in said metal film through annealing carried out on said metal film;
wherein said region in the vicinity of the surface portion of said semiconductor layer is within a depth of 0.5 nm to 5 nm from the surface of the semiconductor layer; and
a dosage of said nonmetal element per unit area is between 4×10 14 cm −2 and 4×10 15 cm −2 .
4. A method for fabricating a semiconductor device comprising the steps of:
distributing an oxygen element in a region in the vicinity of a surface portion of a semiconductor layer;
depositing a metal film on said semiconductor layer; and
epitaxially growing a semiconductor-metal compound layer in the surface portion of said semiconductor layer by causing a reaction between an element included in said semiconductor layer and a metal included in said metal film through annealing carried out on said metal film;
wherein said region in the vicinity of the surface portion of said semiconductor layer is within a depth of 0.5 nm to 5 nm from the surface of the semiconductor layer, and
a distribution of said nonmetal element per unit area is between 4×10 14 cm −2 and 4×10 15 cm −2.
5. A method for fabricating a semiconductor device comprising the steps of:
distributing an oxygen element in a region in the vicinity of a surface portion of a semiconductor layer;
depositing a metal film on said semiconductor layer; and
epitaxially growing a semiconductor-metal compound layer in the surface portion of said semiconductor layer by causing a reaction between an element included in said semiconductor layer and a metal included in said metal film through annealing carried out on said metal film;
wherein said region in the vicinity of the surface portion of said semiconductor layer is within a depth of 0.5 nm to 5 nm from the surface of the semiconductor layer, and
a concentration of said nonmetal element per unit area is between 4×10 14 cm −2 and 4×10 15 cm −2 .
6. The method for fabricating a semiconductor device of claim 3 , 4 or 5 ,
wherein said semiconductor layer is a silicon layer,
said metal film is a cobalt film, and
said semiconductor-metal compound layer is a cobalt silicide layer.
7. A method for fabricating a semiconductor device comprising the steps of:
(a) forming a compound layer including a semiconductor element and a nonmetal element on a semiconductor layer;
(b) distributing said nonmetal element included in said compound layer in the region in the vicinity of the surface portion of said semiconductor layer through recoil by irradiating said compound layer with a particle energy beam;
(c) after the step (b), removing said compound layer;
(d) after the step (c), depositing a metal film on said semiconductor layer; and
(e) after the step (d), epitaxially growing a semiconductor-metal compound layer in the surface portion of said semiconductor layer by causing a reaction between an element included in said semiconductor layer and a metal included in said metal film through annealing carried out on said metal film,
wherein said region in the vicinity of the surface portion of said semiconductor layer is within a depth of 0.5 nm to 5 nm from the surface of the semiconductor layer, and
a distribution of said nonmetal element per unit area is between 4×10 14 cm −2 and 4×10 15 cm −2.
8. A method for fabricating a semiconductor device comprising the steps of:
(a) forming a compound layer including a semiconductor element and a nonmetal element on a semiconductor layer;
(b) distributing said nonmetal element included in said compound layer in the region in the vicinity of the surface portion of said semiconductor layer through recoil by irradiating said compound layer with a particle energy beam;
(c) after the step (b), removing said compound layer;
(d) after the step (c), depositing a metal film on said semiconductor layer; and
(e) after the step (d), epitaxially growing a semiconductor-metal compound layer in the surface portion of said semiconductor layer by causing a reaction between an element included in said semiconductor layer and a metal included in said metal film through annealing carried out on said metal film,
wherein said region in the vicinity of the surface portion of said semiconductor layer is within a depth of 0.5 nm to 5 nm from the surface of the semiconductor layer, and
a concentration of said nonmetal element per unit area is between 4×10 14 cm −2 and 4×10 15 cm −2 .
9. A method for fabricating a semiconductor device comprising the steps of:
(a) forming a compound layer including a semiconductor element and a nonmetal element on a semiconductor layer;
(b) distributing said nonmetal element included in said compound layer in the region in the vicinity of the surface portion of said semiconductor layer through recoil and removing said compound layer by irradiating said compound layer with a particle energy beam;
(c) after the step (b), depositing a metal film on said semiconductor layer; and
(d) after the step (c), epitaxially growing a semiconductor-metal compound layer in the surface portion of said semiconductor layer by causing a reaction between an element included in said semiconductor layer and a metal included in said metal film through annealing carried out on said metal film,
wherein said region in the vicinity of the surface portion of said semiconductor layer is within a depth of 0.5 nm to 5 nm from the surface of the semiconductor layer, and
a distribution of said nonmetal element per unit area is between 4×10 14 cm −2 and 4×10 15 cm −2.
10. A method for fabricating a semiconductor device comprising the steps of:
(a) forming a compound layer including a semiconductor element and a nonmetal element on a semiconductor layer;
(b) distributing said nonmetal element included in said compound layer in the region in the vicinity of the surface portion of said semiconductor layer through recoil and removing said compound layer by irradiating said compound layer with a particle energy beam;
(c) after the step (b), depositing a metal film on said semiconductor layer; and
(d) after the step (c), epitaxially growing a semiconductor-metal compound layer in the surface portion of said semiconductor layer by causing a reaction between an element included in said semiconductor layer and a metal included in said metal film through annealing carried out on said metal film,
wherein said region in the vicinity of the surface portion of said semiconductor layer is within a depth of 0.5 nm to 5 nm from the surface of the semiconductor layer, and
a concentration of said nonmetal element per unit area is between 4×10 14 cm −2 and 4×10 15 cm −2 .
11. The method for fabricating a semiconductor device of claim 1 , 2 , 7 , 8 , 9 or 10 ,
wherein said semiconductor layer has a face-centered cubic crystal structure,
said semiconductor-metal compound layer has a face-centered cubic crystal structure, and
said compound layer is amorphous.
12. The method for fabricating a semiconductor device of claim 1 , 2 , 7 , 8 , 9 or 10 ,
wherein said particle energy beam includes a nonmetal element.
13. The method for fabricating a semiconductor device of claim 1 , 2 , 7 , 8 , 9 or 10 ,
wherein said semiconductor layer has a face-centered cubic crystal structure, and
said semiconductor-metal compound layer has a face-centered cubic crystal structure.
14. The method for fabricating a semiconductor device of claim 1 , 2 , 7 , 8 , 9 or 10 ,
wherein said semiconductor layer has a diamond or zinc blende crystal structure, and
said semiconductor-metal compound layer has a calcium fluoride crystal structure.
15. The method for fabricating a semiconductor device of claim 1 , 2 , 7 , 8 , 9 or 10 ,
wherein said semiconductor layer is a silicon layer,
said nonmetal element is oxygen,
said metal film is a cobalt film, and
said semiconductor-metal compound layer is a cobalt silicide layer.
16. The method for fabricating a semiconductor device of claim 1 , 2 , 7 , 8 , 9 or 10 ,
wherein said nonmetal element is an oxygen element, a nitrogen element or a fluorine element.