Patent Application
Utility
App. No. 09/897,090
· Confirmation No. 3764
SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR APPARATUS MANUFACTURING METHOD
Inventor:
Akio Nakamura
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-12-20 | C.AD |
Change of Address | 1 | View | |
| 2004-05-12 | IFEE |
Issue Fee Payment (PTO-85B) | 2 | View | |
| 2004-05-06 | XRUSH |
Internal Response to Printer Query from Technology Center(TC) | 2 | View | |
| 2004-02-25 | FWCLM |
Index of Claims | 1 | View | |
| 2004-02-25 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2004-02-17 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 6 | View | |
| 2004-02-17 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-02-17 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-01-20 | A.NE |
Response After Final Action | 2 | View | |
| 2004-01-20 | CLM |
Claims | 2 | View | |
| 2004-01-20 | REM |
Applicant Arguments/Remarks Made in an Amendment | 4 | View | |
| 2004-01-20 | XT/ |
Extension of Time | 2 | View | |
| 2003-11-17 | CTAV |
Advisory Action (PTOL-303) | 3 | View | |
| 2003-10-20 | A.NE |
Response After Final Action | 1 | View | |
| 2003-10-20 | REM |
Applicant Arguments/Remarks Made in an Amendment | 6 | View | |
| 2003-10-20 | TRNA |
Transmittal of New Application | 1 | View | |
| 2003-08-20 | CTFR |
Final Rejection | 11 | View | |
| 2003-08-20 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2003-08-11 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-07-14 | A.NE |
Response After Final Action | 1 | View | |
| 2003-07-14 | REM |
Applicant Arguments/Remarks Made in an Amendment | 12 | View | |
| 2003-07-14 | TRNA |
Transmittal of New Application | 1 | View | |
| 2003-04-14 | CTFR |
Final Rejection | 8 | View | |
| 2003-04-14 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-04-14 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2003-04-14 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2003-03-25 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2003-03-06 | SRNT |
Examiner's search strategy and results | 4 | View | |
| 2003-01-28 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 3 | View | |
| 2003-01-28 | CLM |
Claims | 7 | View | |
| 2003-01-28 | REM |
Applicant Arguments/Remarks Made in an Amendment | 6 | View | |
| 2003-01-28 | DRW |
Drawings-only black and white line drawings | 2 | View | |
| 2003-01-28 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2002-11-05 | CTNF |
Non-Final Rejection | 6 | View | |
| 2002-11-05 | 892 |
List of references cited by examiner | 1 | View | |
| 2002-11-05 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2002-10-01 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 13 | View | |
| 2002-10-01 | TRNA |
Transmittal of New Application | 1 | View | |
| 2002-10-01 | REM |
Applicant Arguments/Remarks Made in an Amendment | 4 | View | |
| 2002-10-01 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 6 | View | |
| 2002-10-01 | NDRW |
Transmittal Letter accompanying New/Additional Drawings | 4 | View | |
| 2002-09-20 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 5 | View | |
| 2002-09-20 | FOR |
Foreign Reference | 57 | View | |
| 2002-07-01 | CTNF |
Non-Final Rejection | 5 | View | |
| 2002-07-01 | 892 |
List of references cited by examiner | 1 | View | |
| 2002-07-01 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2001-07-03 | TRNA |
Transmittal of New Application | 5 | View | |
| 2001-07-03 | SPEC |
Specification | 11 | View | |
| 2001-07-03 | CLM |
Claims | 3 | View | |
| 2001-07-03 | ABST |
Abstract | 1 | View | |
| 2001-07-03 | DRW |
Drawings-only black and white line drawings | 6 | View | |
| 2001-07-03 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2001-07-03 | FWCLM |
Index of Claims | 1 | View | |
| 2001-07-03 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2001-07-03 | A.PE |
Preliminary Amendment | 4 | View | |
| 2001-07-03 | REM |
Applicant Arguments/Remarks Made in an Amendment | 7 | View | |
| 2001-07-03 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 2 | View | |
| 2001-07-03 | FWCLM |
Index of Claims | 1 | View | |
| 2001-07-03 | WFEE |
Fee Worksheet (SB06) | 2 | View | |
| 2001-07-03 | TRNA |
Transmittal of New Application | 4 | View | |
| 2001-07-03 | A.PE |
Preliminary Amendment | 4 | View | |
| 2001-07-03 | SPEC |
Specification | 18 | View | |
| 2001-07-03 | CLM |
Claims | 3 | View | |
| 2001-07-03 | ABST |
Abstract | 1 | View | |
| 2001-07-03 | DRW |
Drawings-only black and white line drawings | 6 | View | |
| 2001-07-03 | OATH |
Oath or Declaration filed | 3 | View |
Inventors
Akio Nakamura
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
438/460
H10W74/10
H10W74/141
H10D62/117
H10P54/00
H10W72/942
H10W74/134
H10W72/07251
H10W72/922
H10W72/01331
H10W72/90
H10W72/9445
H10W72/20
H10W72/242
H10W72/019
H10W72/9415
H10W70/60
H10W74/01
H10W72/252
Prosecution
- Examiner
- ZARNEKE, DAVID A
- Art Unit
- 2827
- Customer No.
- 20987
- Docket No.
- OKI.154D
- Confirmation No.
- 3764
Foreign Priority
065157/99
·
1999-03-11
·
JAPAN
Publication
- Pub. No.
- US20010039110A1
- Pub. Date
- 2001-11-08
Patent Term Adjustment
-181days
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Quick Facts
- App. No.
- 09/897,090
- Filed
- 2001-07-03
- Granted
- 2004-08-03
- Pub. No.
- US20010039110A1
- Examiner
- ZARNEKE, DAVID A
- Art Unit
- 2827
- PTA
- -181 days
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