IP Library › Granted Patent US 6,550,911
Granted Patent Utility
US 6,550,911 · Confirmation No. 1919

TESTING DIES ON A SEMICONDUCTOR WAFER IN A SEQUENTIAL AND OVERLAPPING MANNER

Inventor: Eungjoon Park
Patented Case View Patent ↗ View Publication ↗
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 Code Description Pages PDF
2012-01-06 N570 Communication - Re: Power of Attorney (PTOL-308) 1 View
2012-01-06 N570 Communication - Re: Power of Attorney (PTOL-308) 1 View
2011-12-20 PA.. Power of Attorney 2 View
2011-12-20 N417 Electronic Filing System Acknowledgment Receipt 2 View
2011-12-20 R3.73 Assignee showing of ownership per 37 CFR 3.73 1 View
2008-01-22 N570 Communication - Re: Power of Attorney (PTOL-308) 1 View
2008-01-22 N570 Communication - Re: Power of Attorney (PTOL-308) 1 View
2008-01-10 LET. Miscellaneous Incoming Letter 1 View
2008-01-10 PA.. Power of Attorney 1 View
2008-01-10 R3.73 Assignee showing of ownership per 37 CFR 3.73 6 View
2008-01-10 N417 Electronic Filing System Acknowledgment Receipt 2 View
2001-08-14 TRNA Transmittal of New Application 2 View
2001-08-14 ADS Application Data Sheet 2 View
2001-08-14 A.PE Preliminary Amendment 3 View
2001-08-14 SPEC Specification 9 View
2001-08-14 CLM Claims 3 View
2001-08-14 ABST Abstract 1 View
2001-08-14 DRW Drawings-only black and white line drawings 1 View
2001-08-14 OATH Oath or Declaration filed 2 View
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Quick Facts
Patent No.
US 6,550,911
App. No.
09/930,011
Filed
2001-08-14
Granted
2003-04-22
Pub. No.
US20020001863A1
Art Unit
2812
PTA
-2 days