Granted Patent
Utility
US 6,662,126
· Confirmation No. 1921
MEASURING SKEW USING ON-CHIP SAMPLING
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2003-09-29 | IFEE |
Issue Fee Payment (PTO-85B) | 2 | View | |
| 2001-08-14 | TRNA |
Transmittal of New Application | 5 | View | |
| 2001-08-14 | SPEC |
Specification | 18 | View | |
| 2001-08-14 | CLM |
Claims | 4 | View | |
| 2001-08-14 | ABST |
Abstract | 1 | View | |
| 2001-08-14 | DRW |
Drawings-only black and white line drawings | 7 | View | |
| 2001-08-14 | OATH |
Oath or Declaration filed | 4 | View |
Inventors
Dean Liu
Sunnyvale, CA
Gin S. Yee
Sunnyvale, CA
Tyler J. Thorp
Sunnyvale, CA
Pradeep R. Trivedi
Sunnyvale, CA
Attorneys & Agents of Record
Classification
USPC
702/69
G01R31/3016
G01R31/31725
Prosecution
- Examiner
- BARBEE, MANUEL L
- Art Unit
- 2857
- Customer No.
- 32615
- Docket No.
- 03226.059001;P5299
- Confirmation No.
- 1921
Publication
- Pub. No.
- US20030036862A1
- Pub. Date
- 2003-02-20
Patent Term Adjustment
0days
No related applications found.
MERGER AND CHANGE OF NAME
Recorded 2015-12-12
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-08-14
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Quick Facts
- Patent No.
- US 6,662,126
- App. No.
- 09/930,012
- Filed
- 2001-08-14
- Granted
- 2003-12-09
- Pub. No.
- US20030036862A1
- Examiner
- BARBEE, MANUEL L
- Art Unit
- 2857
- PTA
- 0 days
External Links