IP Library Granted Patent US 6,662,126
Granted Patent Utility
US 6,662,126 · Confirmation No. 1921

MEASURING SKEW USING ON-CHIP SAMPLING

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Code Description Pages PDF
2003-09-29 IFEE Issue Fee Payment (PTO-85B) 2 View
2001-08-14 TRNA Transmittal of New Application 5 View
2001-08-14 SPEC Specification 18 View
2001-08-14 CLM Claims 4 View
2001-08-14 ABST Abstract 1 View
2001-08-14 DRW Drawings-only black and white line drawings 7 View
2001-08-14 OATH Oath or Declaration filed 4 View
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Quick Facts
Patent No.
US 6,662,126
App. No.
09/930,012
Filed
2001-08-14
Granted
2003-12-09
Pub. No.
US20030036862A1
Art Unit
2857
PTA
0 days