IP Library › Granted Patent US 6,538,937
Granted Patent Utility
US 6,538,937 · Confirmation No. 1846

NONVOLATILE SEMICONDUCTOR MEMORY TEST CIRCUIT AND METHOD, NONVOLATILE SEMICONDUCTOR MEMORY AND METHOD FOR FABRICATING NONVOLATILE SEMICONDUCTOR MEMORY

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2020-10-06 N570 Communication - Re: Power of Attorney (PTOL-308) 1 View
2020-10-06 N570 Communication - Re: Power of Attorney (PTOL-308) 1 View
2020-10-01 PA.. Power of Attorney 1 View
2020-10-01 R3.73 Assignee showing of ownership per 37 CFR 3.73 6 View
2020-10-01 N417 Electronic Filing System Acknowledgment Receipt 2 View
2001-08-17 TRNA Transmittal of New Application 2 View
2001-08-17 ADS Application Data Sheet 2 View
2001-08-17 SPEC Specification 29 View
2001-08-17 CLM Claims 6 View
2001-08-17 ABST Abstract 1 View
2001-08-17 DRW Drawings-only black and white line drawings 8 View
2001-08-17 OATH Oath or Declaration filed 3 View
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Quick Facts
Patent No.
US 6,538,937
App. No.
09/930,968
Filed
2001-08-17
Granted
2003-03-25
Pub. No.
US20020024862A1
Examiner
PHUNG, ANH K
Art Unit
2824
PTA
-4 days