IP Library › Granted Patent US 6,826,720
Granted Patent Utility
US 6,826,720 · Confirmation No. 7725

TESTING BOARD FOR SEMICONDUCTOR MEMORY, METHOD OF TESTING SEMICONDUCTOR MEMORY AND METHOD OF MANUFACTURING SEMICONDUCTOR MEMORY

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2004-09-27 IFEE Issue Fee Payment (PTO-85B) 1 View
2004-07-09 IDS Information Disclosure Statement (IDS) Form (SB08) 2 View
2004-07-09 C.AD Change of Address 1 View
2004-07-09 FRPR Certified Copy of Foreign Priority Application 48 View
2001-11-28 TRNA Transmittal of New Application 2 View
2001-11-28 SPEC Specification 39 View
2001-11-28 CLM Claims 6 View
2001-11-28 ABST Abstract 1 View
2001-11-28 DRW Drawings-only black and white line drawings 10 View
2001-11-28 OATH Oath or Declaration filed 4 View
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Quick Facts
Patent No.
US 6,826,720
App. No.
09/994,638
Filed
2001-11-28
Granted
2004-11-30
Pub. No.
US20020066056A1
Examiner
TON, DAVID
Art Unit
2133
PTA
-67 days