Patent Application
Utility
App. No. 10/033,293
· Confirmation No. 8223
Probe card for testing an LSI operating on two power source voltages
Abandoned -- Failure to Respond to an Office Action
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2005-03-02 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2001-10-25 | TRNA |
Transmittal of New Application | 5 | View | |
| 2001-10-25 | SPEC |
Specification | 11 | View | |
| 2001-10-25 | CLM |
Claims | 5 | View | |
| 2001-10-25 | ABST |
Abstract | 1 | View | |
| 2001-10-25 | DRW |
Drawings-only black and white line drawings | 3 | View | |
| 2001-10-25 | OATH |
Oath or Declaration filed | 3 | View |
Inventors
Kazunari Takasugi
Tokyo, JAPAN
Masahiro Toeda
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
324/754
G01R31/2886
Prosecution
- Examiner
- NGUYEN, TUNG X
- Art Unit
- 2829
- Customer No.
- 23389
- Docket No.
- 15021
- Confirmation No.
- 8223
Foreign Priority
2000-326477
·
2000-10-26
·
JAPAN
Publication
- Pub. No.
- US20020067179A1
- Pub. Date
- 2002-06-06
No related applications found.
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-02-19
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-10-25
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Quick Facts
- App. No.
- 10/033,293
- Filed
- 2001-10-25
- Pub. No.
- US20020067179A1
- Examiner
- NGUYEN, TUNG X
- Art Unit
- 2829
External Links