Patent Assignment
Reel/Frame 013740/0570
Assignment of Assignor's Interest
Recorded: 2003-02-19
Received: 2003-02-21
Pages: 10
Assignor
NEC CORPORATION
Executed: 2002-11-01
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JPX, JAPAN
Covered Properties
(88)
Semiconductor integrated circuit design method
Application:
10/244,328 →
Semiconductor Device and Method of Fabricating the Same
Application:
10/224,959 →
Failure Propagation Path Estimate System
Application:
10/194,773 →
Bump transfer plate, manufacturing method thereof, semiconductor device, and manufacturing method thereof
Application:
10/191,124 →
Bump transfer plate, manufacturing method thereof, semiconductor device, and manufacturing method thereof
Application:
10/191,142 →
Bump transfer plate, manufacturing method thereof, semiconductor device, and manufacturing method thereof
Application:
10/191,141 →
Semiconductor Integrated Circuit Having Macro Cells and Designing Method of the Same
Application:
10/185,394 →
Semiconductor Device with Soi Structure and Method of Manufacturing the Same
Application:
10/178,429 →
Image Sensor
Application:
10/173,874 →
Voltage Comparing Circuit
Application:
10/166,316 →
Linear Transconductance Amplifier
Application:
10/164,742 →
Linear Transconductance Amplifier
Application:
10/164,745 →
Linear Transconductance Amplifier
Application:
10/164,746 →
Data Processing Apparatus with Circuit for Confirming Normality of Serial Transmission Data
Application:
10/159,500 →
Overlapped Field Detecting Apparatus Capable of Detecting Non-Overlapped Fields Mostly Overlapped
Application:
10/157,614 →
Clock Control Circuit
Application:
10/146,827 →
Semiconductor device which increases the capacity without deepening the contact hole
Application:
10/146,859 →
False Path Detecting Apparatus and a False Path Detecting Method in Which a Usage Amount of Memories Is Smaller and a Process Is Carried Out at a Higher Speed, and That Program
Application:
10/146,678 →
Process for Fabricating Capacitor Having Dielectric Layer with Pervskite Structure and Apparatus for Fabricating the Same
Application:
10/135,620 →
Semiconductor Integrated Circuit Device and Device for Testing Same
Application:
10/063,472 →
Single-Chip Microcomputer with Dynamic Burn-in Test Function and Dynamic Burn-in Testing Method Therefor
Application:
10/128,962 →
Phase Shifter with an Rc Polyphase Filter
Application:
10/125,826 →
Semiconductor Device Having Hydrogen Diffusion and Barrier Layers and a Method of Producing the Same
Application:
10/119,800 →
Circuit for Generating Three-Phase Pwm Signal
Application:
10/109,250 →
Split Transaction Bus System
Application:
10/103,337 →
Oversampling Clock Recovery Circuit Applicable Not Only to High Rate Data but Also to Low Rate Data
Application:
10/100,871 →
Device and Method for Nondestructive Inspection on Semiconductor Device
Application:
10/095,858 →
Device and Method for Nondestructive Inspection on Semiconductor Device
Application:
10/095,915 →
Moving-picture data reproducing system
Application:
10/091,913 →
Shot configuration measuring mark and transfer error detection method using the same
Application:
10/090,883 →
Wire Bonding Device
Application:
10/086,040 →
Method for Cleaning Semiconductor Wafer After Chemical Mechanical Polishing on Copper Wiring
Application:
10/075,566 →
Decoding System Available for Compressed Data Streams for Concurrently Reproducing Stable Pictures Method for Decoding Compressed Data Streams and Information Storage Medium for Storing Programmed Instructions Representative of the Method
Application:
10/067,564 →
Detection of Clock Signal Period Abnormalities
Application:
10/066,508 →
Method of driving a color liquid crystal display and driver circuit for driving the display as well as potable electronic device with the driver circuit
Application:
10/051,567 →
Oversampling Clock Recovery Having a High Follow-Up Character Using a Few Clock Signals
Application:
10/043,729 →
Watchdog Timer and Method for Detecting Abnormal Operation of Computer, and Computer Including the Timer
Application:
10/028,111 →
Cell Search Method to Subtract Autocorrelation Patterns from a Correlation Value Profile
Application:
10/014,095 →
Apparatus for Carrying Out Translucent-Processing to Still and Moving Pictures and Method of Doing the Same
Application:
10/010,836 →
Simulation Circuit for Mos Transistor, Simulation Testing Method, Netlist of Simulation Circuit and Storage Medium Storing Same
Application:
09/996,251 →
Mobile Phone Capable of Stopping Main Clock Signal
Application:
09/994,961 →
LSI device failure analysis apparatus and analysis method thereof
Application:
09/992,732 →
Gate Insulation Film Having a Slanted Nitrogen Concentration Profile
Application:
09/993,833 →
Distortion Correcting Circuit and Display Device
Application:
10/002,565 →
Apparatus for Detecting Edges of Input Signal to Execute Signal Processing on the Basis of Edge Timings
Application:
10/002,059 →
Probe card for testing an LSI operating on two power source voltages
Application:
10/033,293 →
Use of Neurotoxin Therapy for Treatment of Urologic and Related Disorders
Application:
09/978,982 →
Data Processing Apparatus Capable of Dealing with Illegal External Input in an Operative State and Preventing Useless Power Consumption in a Stopped State
Application:
09/970,528 →
Electronic Device and Its Power Control Method
Application:
09/970,529 →
Semiconductor Device with Soi Structure and Method of Manufacturing the Same
Application:
09/966,035 →
Semiconductor Apparatus for Providing Reliable Data Analysis of Signals
Application:
09/965,565 →
Semiconductor Device Incorporating Hemispherical Solid Immerision Lens, Apparatus and Method for Manufacturing Same
Application:
09/962,430 →
Cvd Method for Producing an Interconnection Film by Depositing a Lower Layer to Fill a Recess Performing a Cleaning Step to Remove Dissociated Reactant Gas, and Consequently Depositing an Upper Layer That Has a Smaller Impurity Concentration Than the Lower Layer
Application:
09/943,045 →
Paging Mode Control Method and Apparatus
Application:
09/927,745 →
Digital Phase Control Using First and Second Delay Lines
Application:
09/921,866 →
Card System, Ic Card and Card Reader/Writer Used for the Card System
Application:
09/916,944 →
Semiconductor Device Having Heat Spreader Attached Thereto and Method of Manufacturing the Same
Application:
09/905,141 →
Apparatus and Method for Image Compression Using a Specified Restart Interval
Application:
09/900,607 →
Communication system and communication method in accordance with extended protocol standard
Application:
09/896,202 →
Voltage-Controlled Oscillator
Application:
09/884,259 →
Mos Image Sensor with Extended Dynamic Range to Incident Light
Application:
09/879,615 →
Semiconductor device
Application:
09/876,396 →
Clock Signal Reproduction Device
Application:
09/876,586 →
Bus Performance Evaluation Method for Algorithm Description
Application:
09/872,091 →
Spectrum spread receiver device
Application:
09/865,218 →
Semiconductor Device and Method of Manufacturing the Same
Application:
09/863,737 →
Semiconductor memory and address controlling method thereof
Application:
09/855,243 →
Apparatus and method for producing a performance evaluation model
Application:
09/854,159 →
Method and Communication System for Data Communication via a Cable
Application:
09/854,123 →
Cpu System with High-Speed Peripheral Lsi Circuit
Application:
09/850,235 →
A Method of Forming a Wiring Layer Crossing Over a Trench-Isolating Structure
Application:
09/838,106 →
Segmented processing method for a transport stream for digital television and recording media for the same
Application:
09/838,086 →
Hyperbolic Type Channel Mosfet
Application:
09/838,087 →
Semiconductor Device and Method for Manufacturing Same
Application:
09/832,630 →
Id Recognition Apparatus and Id Recognition Sorter System for Semiconductor Wafer
Application:
09/828,003 →
Method of maintaining and selling software
Application:
09/826,243 →
Anonymous purchase and sale system for online shopping and delivery services via computer networks
Application:
09/826,244 →
Memory Lsi Failure Analysis Apparatus and Analysis Method Thereof
Application:
09/819,860 →
Program Development Compressed Trace Support Apparatus
Application:
09/819,351 →
Self-Sustained Pulsating Laser Diode
Application:
09/819,969 →
Novel Bicyclic Compounds and Their Use in Medicine; Process for Their Preparation and Pharmaceutical Compositions Containing Them
Application:
09/816,584 →
Semiconductor Device Washing Apparatus and a Method of Washing a Semiconductor Device
Application:
09/810,156 →
Circuit simulation method and system
Application:
09/810,124 →
Process for Manufacturing a Semiconductor Device
Application:
09/791,220 →
Alignment Mark Set and Method of Measuring Alignment Accuracy
Application:
09/788,759 →
Method for Forming Multi-Layered Interconnect Structure
Application:
09/784,267 →
System and method for verifying hardware description
Application:
09/777,543 →
Computer
Application:
09/753,112 →