Patent Application
Utility
App. No. 09/992,732
· Confirmation No. 8926
LSI device failure analysis apparatus and analysis method thereof
Inventor:
Junichi Goto
Abandoned -- Failure to Respond to an Office Action
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2001-11-14 | TRNA |
Transmittal of New Application | 6 | View | |
| 2001-11-14 | SPEC |
Specification | 17 | View | |
| 2001-11-14 | CLM |
Claims | 3 | View | |
| 2001-11-14 | ABST |
Abstract | 1 | View | |
| 2001-11-14 | DRW |
Drawings-only black and white line drawings | 2 | View | |
| 2001-11-14 | OATH |
Oath or Declaration filed | 3 | View |
Inventors
Junichi Goto
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
716/4
Prosecution
- Examiner
- LIN, SUN J
- Art Unit
- 2825
- Customer No.
- 23389
- Docket No.
- 15081
- Confirmation No.
- 8926
Foreign Priority
2000-351663
·
2000-11-17
·
JAPAN
Publication
- Pub. No.
- US20020062465A1
- Pub. Date
- 2002-05-23
No related applications found.
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-02-19
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Quick Facts
- App. No.
- 09/992,732
- Filed
- 2001-11-14
- Pub. No.
- US20020062465A1
- Examiner
- LIN, SUN J
- Art Unit
- 2825
External Links