Assignment of Assignor's Interest

Recorded: 2001-11-14 Pages: 3

Assignor

GOTO, JUNICHI

Executed: 2001-09-12

Assignee

NEC CORPORATION

7-1, SHIBA 5-CHOME MINATO-KU, TOKYO, JAPAN

Covered Property (1)

LSI device failure analysis apparatus and analysis method thereof

Application: 09/992,732 →

Publication: US 2002/0062465

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.