IP Library › Granted Patent US 6,631,505
Granted Patent Utility
US 6,631,505 · Confirmation No. 2977

SIMULATION CIRCUIT FOR MOS TRANSISTOR, SIMULATION TESTING METHOD, NETLIST OF SIMULATION CIRCUIT AND STORAGE MEDIUM STORING SAME

Inventor: Takao Arai
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 Code Description Pages PDF
2003-07-18 LET. Miscellaneous Incoming Letter 2 View
2003-07-18 IDS Information Disclosure Statement (IDS) Form (SB08) 1 View
2003-07-18 LET. Miscellaneous Incoming Letter 6 View
2003-07-18 FOR Foreign Reference 16 View
2003-07-18 FOR Foreign Reference 26 View
2003-07-07 IFEE Issue Fee Payment (PTO-85B) 1 View
2001-11-28 TRNA Transmittal of New Application 5 View
2001-11-28 SPEC Specification 31 View
2001-11-28 CLM Claims 19 View
2001-11-28 ABST Abstract 1 View
2001-11-28 DRW Drawings-only black and white line drawings 14 View
2001-11-28 OATH Oath or Declaration filed 3 View
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Quick Facts
Patent No.
US 6,631,505
App. No.
09/996,251
Filed
2001-11-28
Granted
2003-10-07
Pub. No.
US20020063252A1
Examiner
DO, THUAN V
Art Unit
2825
PTA
0 days