IP Library › Assignment 025486/0592
Patent Assignment
Reel/Frame 025486/0592

Change of Name

Recorded: 2010-12-13 Received: 2010-12-13 Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, JPX, 211-8668, JAPAN
Covered Properties (92)
Method for Fabricating a Semiconductor Device
Application: 10/053,598 →
Conductive Hardening Resin for a Semiconductor Device and Semiconductor Device Using the Same
Application: 10/052,633 →
Semiconductor Level Shifter Circuit
Application: 10/054,085 →
Method of driving a color liquid crystal display and driver circuit for driving the display as well as potable electronic device with the driver circuit
Application: 10/051,567 →
Semiconductor device and manufacturing method the same
Application: 10/052,143 →
Method and Circuit for Driving Liquid Crystal Display, and Portable Electronic Device
Application: 10/046,155 →
Semiconductor Memory Device and Manufacturing Method Thereof
Application: 10/046,792 →
Solid-State Image Sensor Provided with Divided Photoelectric Conversion Part
Application: 10/047,155 →
Oversampling Clock Recovery Having a High Follow-Up Character Using a Few Clock Signals
Application: 10/043,729 →
Method and Apparatus for Depositing a Thin Film, and Semiconductor Device Having a Semiconductor-Insulator Junction
Application: 10/041,609 →
Process for Producing a Semiconductor Device
Application: 10/035,325 →
Semiconductor Device with Reduced Leakage of Current
Application: 10/033,628 →
Split Gate Flash Memory with Virtual Ground Array Structure and Method of Fabricating the Same
Application: 10/029,275 →
Scan Flip-Flop Circuit Capable of Guaranteeing Normal Operation
Application: 10/033,438 →
Test Circuit for Logical Integrated Circuit and Method for Testing Same
Application: 10/026,532 →
Method of Forming Fine Patterns
Application: 10/023,847 →
Semiconductor Memory Device with Redundancy and/or Defect Test Capability
Application: 10/027,461 →
Flip Chip Semiconductor Device Having Signal Pads Arranged Outside of Power Supply Pads
Application: 10/024,154 →
Manufacturing Method of Semiconductor Device and Designing Method of Semiconductor Device
Application: 10/024,157 →
Semiconductor Memory Device with a Silicide Layer Formed on Regions Other Than Source Regions
Application: 10/024,122 →
Semiconductor Device Having Bonding Pad Electrode of Multi-Layer Structure
Application: 10/024,103 →
Clock and Data Recovery Circuit and Clock Control Method
Application: 10/022,551 →
Method and Circuit for Calculating Multiple of Unit Value and Generating a Periodic Function
Application: 10/014,575 →
Mos-Type Image Sensor Configured to Reduce Coupling Noise
Application: 10/012,405 →
Wavelength Stabilizing Unit and Wavelength Stabilized Laser Module
Application: 10/021,537 →
Cell Search Method to Subtract Autocorrelation Patterns from a Correlation Value Profile
Application: 10/014,095 →
Copper Interconnection
Application: 10/009,869 →
Video Signal Processing Circuit That Can Correspond to a Plurality of Television Signal Methods
Application: 10/013,821 →
Manufacturing Method of a Semiconductor Device
Application: 10/004,859 →
Apparatus for Carrying Out Translucent-Processing to Still and Moving Pictures and Method of Doing the Same
Application: 10/010,836 →
Electric Terminal for an Electronic Device
Application: 10/002,198 →
Optical Proximity Effect Correcting Method and Mask Data Forming Method in Semiconductor Manufacturing Process, Which Can Sufficiently Correct Optical Proximity Effect, Even Under Various Situations with Regard to Size and Shape of Design Pattern, and Space Width A
Application: 10/011,421 →
Reticle Having Accessory Pattern Divided into Sub-Patterns
Application: 09/996,558 →
Solid-State Imaging Device
Application: 09/996,703 →
Micro-Wave Power Amplifier
Application: 09/998,686 →
Reference Voltage Generator Circuit for Nonvolatile Memory
Application: 09/997,192 →
Semiconductor Apparatus Including Cmos Circuits and Method for Fabricating the Same
Application: 09/995,513 →
Clock Control Circuit and Method
Application: 09/995,517 →
Simulation Circuit for Mos Transistor, Simulation Testing Method, Netlist of Simulation Circuit and Storage Medium Storing Same
Application: 09/996,251 →
Method of Performing Timing-Driven Layout
Application: 09/995,518 →
Mobile Phone Capable of Stopping Main Clock Signal
Application: 09/994,961 →
Chemical Mechanical Polishing Slurry
Application: 09/990,224 →
Slurry for Chemical Mechanical Polishing
Application: 09/989,016 →
Chemical Mechanical Polishing Slurry
Application: 09/989,021 →
Slurry for Chemical Mechanical Polishing
Application: 09/989,218 →
Auto Power Control Circuit for Laser Diode
Application: 09/988,322 →
Fixed-Length Delay Generation Circuit
Application: 10/015,211 →
Semiconductor Circuit Designing Apparatus and a Semiconductor Circuit Designing Method in Which the Number of Steps in a Circuit Design and a Layout Design Is Reduced
Application: 10/015,209 →
Clock Controlling Method and Clock Control Circuit
Application: 09/990,781 →
Method of Manufacturing Semiconductor Device
Application: 09/987,029 →
Circuit and Method for Generating Fixed Point Data with Reduced Circuit Scale
Application: 09/986,748 →
Parllel in Serial Out Circuit Having Flip-Flop Latching at Mutiple Clock Rates
Application: 10/010,073 →
Gate Insulation Film Having a Slanted Nitrogen Concentration Profile
Application: 09/993,833 →
Bandgap Reference Circuit with Reduced Output Error
Application: 09/985,808 →
Operational Amplifier
Application: 10/007,466 →
Asynchronous Bus Interface Circuit, Method of Controlling the Circuit, Microcomputer, and Device Controlling Method
Application: 09/984,811 →
Semiconductor Device
Application: 09/984,442 →
Voice Decoder, Voice Decoding Method and Program for Decoding Voice Signals
Application: 09/984,420 →
Apparatus for Detecting Edges of Input Signal to Execute Signal Processing on the Basis of Edge Timings
Application: 10/002,059 →
Method of Forming Solder Bumps
Application: 10/047,172 →
Probe Pin for a Probe Card
Application: 09/983,171 →
Semiconductor Storage Device
Application: 09/983,036 →
Semiconductor Device and Its Manufacturing Method
Application: 10/032,764 →
Semiconductor Device
Application: 09/978,722 →
General-Purpose Logic Module and Cell Using the Same
Application: 09/978,721 →
Mask for Beam Exposure Having Membrane Structure and Stencil Structure and Method for Manufacturing the Same
Application: 09/982,051 →
Liquid Crystal Panel Driving Circuit and Method of Driving a Liquid Crystal Panel
Application: 09/977,293 →
Method of Fabricating a Semiconductor Device by Filling Gaps Between Gate Electrodes with Hsq
Application: 09/977,386 →
Ohmic Contact Plug Having an Improved Crack Free Tin Barrier Metal in a Contact Hole and Method of Forming the Same
Application: 09/974,808 →
Liquid Crystal Display and Computer
Application: 09/974,881 →
Method of Manufacturing a Plural Unit High Frequency Transistor
Application: 09/973,717 →
Receiver Circuit for a Complementary Signal
Application: 09/975,440 →
Logic Circuit with Single Charge Pulling Out Transistor and Semiconductor Integrated Circuit Using the Same
Application: 09/977,902 →
Brushless Motor Drive Circuit Having Low Noise and High Efficiency
Application: 09/971,924 →
A Particle-Removing Method for a Semiconductor Device Manufacturing Apparatus
Application: 09/971,463 →
Data Processing Apparatus Capable of Dealing with Illegal External Input in an Operative State and Preventing Useless Power Consumption in a Stopped State
Application: 09/970,528 →
Electronic Device and Its Power Control Method
Application: 09/970,529 →
Semiconductor Integrated Circuit
Application: 09/971,227 →
Semiconductor Device Having a Reduced Leakage Current
Application: 09/971,158 →
Biasing Circuit for Quickly Outputting Stable Bias Output and Semiconductor Memory Device
Application: 09/968,003 →
Schottky Barrier Field Effect Transistor Large in Withstanding Voltage and Small in Distortion and Return-Loss
Application: 09/966,934 →
Shadow Ram Cell Using a Ferroelectric Capacitor
Application: 09/964,418 →
Method of Fabricating a Semiconductor Device of High-Voltage Cmos Structre
Application: 09/964,393 →
Semiconductor Memory Device and Method for Replacing Redundancy Circuit
Application: 09/965,199 →
Semiconductor Device with Soi Structure and Method of Manufacturing the Same
Application: 09/966,035 →
Synchronous Signal Generation Circuit and Synchronous Signal Generation Method
Application: 09/965,203 →
Cmos Image Sensor and Manufacturing Method for the Same
Application: 09/962,115 →
Semiconductor Device and Method for Manufacturing Same
Application: 09/961,317 →
Semiconductor Device Incorporating Hemispherical Solid Immerision Lens, Apparatus and Method for Manufacturing Same
Application: 09/962,430 →
Capacitor-Array D/a Converter Including a Thermometer Decoder and a Capacitor Array
Application: 09/963,063 →
Semiconductor Device and Test Method for Manufacturing Same
Application: 09/960,380 →
Delay Locked Loop Circuit for Synchronizing Internal Supply Clock with Reference Clock
Application: 09/962,546 →