Granted Patent
Utility
US 6,653,729
· Confirmation No. 7522
SEMICONDUCTOR DEVICE AND TEST METHOD FOR MANUFACTURING SAME
Inventor:
Junya Ishii
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2003-09-17 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2001-09-24 | TRNA |
Transmittal of New Application | 4 | View | |
| 2001-09-24 | SPEC |
Specification | 14 | View | |
| 2001-09-24 | CLM |
Claims | 3 | View | |
| 2001-09-24 | ABST |
Abstract | 1 | View | |
| 2001-09-24 | DRW |
Drawings-only black and white line drawings | 4 | View | |
| 2001-09-24 | OATH |
Oath or Declaration filed | 2 | View |
Inventors
Junya Ishii
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
257/700
H10P74/00
H10W72/019
H10W72/983
H10W72/9232
H10W72/951
H10W72/075
H10W72/934
Prosecution
- Examiner
- LEE, CALVIN
- Art Unit
- 2825
- Customer No.
- 21254
- Docket No.
- NEC2320-US
- Confirmation No.
- 7522
Foreign Priority
2000-300281
·
2000-09-29
·
JAPAN
Publication
- Pub. No.
- US20020039801A1
- Pub. Date
- 2002-04-04
Patent Term Adjustment
0days
CHANGE OF ADDRESS
Recorded 2017-11-29
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-02-27
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Quick Facts
- Patent No.
- US 6,653,729
- App. No.
- 09/960,380
- Filed
- 2001-09-24
- Granted
- 2003-11-25
- Pub. No.
- US20020039801A1
- Examiner
- LEE, CALVIN
- Art Unit
- 2825
- PTA
- 0 days
External Links