IP Library Assignment 012201/0489
Patent Assignment
Reel/Frame 012201/0489

Assignment of Assignor's Interest

Recorded: 2001-09-24 Pages: 3
Assignor
ISHII, JUNYA
Executed: 2001-03-13
Assignee
NEC CORPORATION
7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Semiconductor Device and Test Method for Manufacturing Same
Patent: 6,653,729 →
Application: 09/960,380 →
Publication: US 2002/0039801
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 27, 2003
From: NEC CORPORATION
To: NEC ELECTRONICS CORPORATION
Reel/Frame 013795/0722 →
Change of Name Dec 13, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025486/0592 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →